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101
book article
Java technology based training system for teaching digital design and test
Devadze, Sergei
;
Jutman, Artur
;
Sudnitsõn, Aleksander
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia
2002
/
p. 283-286 : ill
book article
102
book
Kiiruse mõõtmise mobiilne süsteem : aastal 2009 avaldatud tööde koopiate kogumik. 13
Laaneots, Rein
2009
https://www.ester.ee/record=b2641827*est
book
103
newspaper article
Kvaliteetsema digiõppe poole
Puust, Raido
Postimees
2021
/
Lk. 14
https://dea.digar.ee/article/postimees/2021/05/13/12.10
newspaper article
104
book
Logic and system design of digital systems
Baranov, Samary
;
Keevallik, Andres
2008
https://www.ester.ee/record=b2358322*est
book
105
newspaper article
Mehaanika ja tööstustehnika instituudis valmivad elumuutvad lahendused [Võrguväljaanne]
Alver, Anne-Mari
Eesti Päevaleht
2022
/
Lk. 10
Mehaanika ja tööstustehnika instituudis valmivad elumuutvad lahendused
newspaper article
106
dissertation
Methods for improving the accuracy and efficiency of fault simulation in digital systems = Meetodid digitaalsüsteemide rikete simuleerimise täpsuse ja efektiivsuse tõstmiseks
Kõusaar, Jaak
2019
https://digi.lib.ttu.ee/i/?11667
dissertation
107
newspaper article
Millest tekkisid parvlaeva Estonia augud? Laevaehituse insener : teeme esimesi katsearvutusi
Riik, Marvel
ohtuleht.ee
2023
/
Lk. 2
Millest tekkisid parvlaeva Estonia augud? Laevaehituse insener: teeme esimesi katsearvutusi
newspaper article
108
book article
Mixed-level defect simulation in data-paths of digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
2002
/
p. 617-620 : ill
https://ieeexplore.ieee.org/document/1003333
book article
109
journal article
Mixed-level test generator for digital systems
Brik, Marina
;
Jervan, Gert
;
Markus, Antti
;
Paomets, Priidu
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the Estonian Academy of Sciences. Engineering
1997
/
4, p. 271-282 : ill
journal article
110
dissertation
Model synthesis from VHDL for the functional test generation system
Krupnova, Helena
1993
https://www.ester.ee/record=b2090509*est
dissertation
111
newspaper article
MS Estonia ferry investigation continues, no additional funds yet allocated [Online resources]
Linnart, Mart
news.err.ee
2022
MS Estonia ferry investigation continues, no additional funds yet allocated
newspaper article
112
book article
Multi-level fault simulation of digital systems on decision diagrams
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
The First IEEE International Workshop on Electronic Design, Test and Applications : DELTA 2002, 29-31 January 2002, Christchurch, New Zealand : proceedings
2002
/
p. 86-91 : ill
book article
113
book
Multi-level test generation and fault diagnosis in digital systems
Ubar, Raimund-Johannes
1992
book
114
book article
Multi-level test generation for digital systems at system, circuit and defect levels
Ubar, Raimund-Johannes
Proceedings of the 7th International Scientific Conference "Theory and Technique of Information Transmission, Reception and Processing" : Tuapse, October 1-4, 2001
2001
/
p. 286-288
book article
115
book article
Multiple fault testing in systems-on-chip with high-level decision diagrams
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
;
Schölzel, Mario
;
Vierhaus, Heinrich Theodor
Proceedings of 2015 10th International Design & Test Symposium (IDT) : Dead Sea, Jordan, 14-16 December 2015
2015
/
p. 66-71 : ill
http://dx.doi.org/10.1109/IDT.2015.7396738
book article
116
book article
Multivalued simulation on AG-model of digital devices
Ubar, Raimund-Johannes
;
Voolaine, Andrus
Proceedings of the 12th Conference on Fault-Tolerant Systems and Diagnostics, Prague, Czechoslovakia, September, 1989
1989
/
p. 101-104
book article
117
book article
Mutation analysis for systemC designs at TLM
Guarnieri, Valerio
;
Bombieri, Nicola
;
Pravadelli, Graziano
;
Fummi, Franco
;
Hantson, Hanno
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
12th IEEE Latin American Test Workshop (LATW) : Porto de Galinhas, Brasil, 27-30 March 2011
2011
/
[6] p
https://ieeexplore.ieee.org/document/5985925
book article
118
dissertation
Mutation-based verification and error correction in high-level designs = Mutatsioonidel põhinev verifitseerimine ja vigade parandamine kõrgtaseme skeemides
Hantson, Hanno
2015
https://www.ester.ee/record=b4518212*est
dissertation
119
newspaper article
Mõtteid koostöö võimalikkusest Ida-Lääne piiril
Ubar, Raimund-Johannes
;
Kruus, Margus
Mente et Manu
2003
/
20. okt., lk. 2 : portr
https://artiklid.elnet.ee/record=b1415646*est
newspaper article
120
book article
New method of testability calculation to guide RT-level test generation
Raik, Jaan
;
Nõmmeots, Tanel
;
Ubar, Raimund-Johannes
4th IEEE Latin-American Test Workshop : LATW2003 : Natal, Brazil, February 16-19, 2003
2003
/
p. 46-51 : ill
https://link.springer.com/article/10.1007/s10836-005-5288-5
book article
121
book article
On multiple fault detection in combinational logic circuits
Birger, Alexander
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 225-228
book article
122
journal article EST
/
journal article ENG
Optimization of boundary scan tests using FPGA-based efficient scan architectures
Aleksejev, Igor
;
Devadze, Sergei
;
Jutman, Artur
;
Shibin, Konstantin
Journal of electronic testing : theory and applications (JETTA)
2016
/
p. 245-255 : ill
https://doi.org/10.1007/s10836-016-5588-y
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
123
book article
Optimization of memory-constrained hybrid BIST for testing core-based systems
Jervan, Gert
;
Kruus, Helena
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum
2007
/
lk. 133-136 : ill
book article
124
book article
Optimization of memory-constrained hybrid BIST for testing core-based systems
Jervan, Gert
;
Kruus, Helena
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
Proceedings of the IEEE 2nd International Symposium on Industrial Embedded Systems : SIES'2007 : Lisbon, Portugal, 4-6 July 2007
2007
/
p. 71-77
https://ieeexplore.ieee.org/document/4297319
book article
125
journal article
Overview about low-level and high-level decision diagrams for diagnostic modeling of digital systems
Ubar, Raimund-Johannes
Facta Universitatis [Niš]. Series electronics and energetics
2011
/
p. 303-324 : ill
http://dx.doi.org/10.2298/FUEE1103303U
journal article
Number of records 221, displaying
101 - 125
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