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76
book article
Functional test program generation for digital systems
Ubar, Raimund-Johannes
;
Dušina, Julia
;
Krupnova, Helena
;
Storožev, Sergei
;
Zaugarov, Viktor
Testmethoden und Zuverlässigkeit von Schaltungen und Systemen : proceedings of the 6th workshop, Vaals (Niederlande), March 6-8, 1994
1994
/
p. 14-18: ill
book article
77
book article
GA-based test generation for sequential circuits
Brik, Marina
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Ivask, Eero
Proceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 2004
2004
/
p. 30-34
book article
78
book article
A general approach to synthesis of the finite-state machine logical structure in the sum-of-products form
Chapenko, V.
;
Fritsnovich, G.
;
Kalnberzin, A.
;
Lange, E.
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 2
1994
/
p. 385-390
https://www.ester.ee/record=b2150914*est
book article
79
book article
Genetic algorithm approach to the problem of finite state machine construction
Spitšakova, Margarita
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
p. 69-72 : ill
book article
80
book
Guide to the digital switchover
Nyman-Metcalf, Katrin Merike
;
Richter, Andrei
2010
https://www.osce.org/files/f/documents/8/c/73720.pdf
book
81
book article
Hierarchical fault diagnosis in embedded digital systems with multi-level decision diagrams [Electronic resource]
Ubar, Raimund-Johannes
;
Evartson, Teet
;
Lensen, Harri
;
Aarna, Margit
5th International Conference on Industrial Automation = Cinquieme Conference Internationale sur l'Automatisation Industrielle : June 11-13, 2007, Montreal, Canada
2007
/
[6] p. [CD-ROM]
book article
82
book article
Hierarchical fault simulation in digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
International Symposium on Signals, Circuits and Systems : SCS 2001 : July 10-11, 2001, Iasi, Romania : proceedings
2001
/
p. 181-184 : ill
book article
83
book article
Hierarchical test generation for complex digital systems with control and data processing parts
Ubar, Raimund-Johannes
;
Raik, Jaan
"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 1999
1999
/
p. 43-52
book article
84
book article
Hierarchical test generation. SEMI show slides
Ubar, Raimund-Johannes
;
Raik, Jaan
"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 1999
1999
/
p. 53-64
book article
85
book article
Hierarchical test synthesis for digital systems using alternative graph model
Ubar, Raimund-Johannes
Quantitative aspects of designing and validating dependable computing systems
1995
book article
86
book article
High level fault modeling in digital systems
Ubar, Raimund-Johannes
;
Aarna, Margit
;
Brik, Marina
;
Raik, Jaan
Synergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 2
2004
/
p. 486-491
book article
87
journal article
High quality test generation for digital systems
Ubar, Raimund-Johannes
;
Aarna, Margit
;
Kruus, Helena
;
Raik, Jaan
Romanian journal of information science and technology
2005
/
1, p. 73-84 : ill
journal article
88
book article
High-Level Decision Diagram manipulations for code coverage analysis
Minakova, Karina
;
Reinsalu, Uljana
;
Tšepurov, Anton
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 207-210 : ill
book article
89
book article
High-level synthesis and test in the MOSCITO-based virtual laboratory
Schneider, Andre
;
Diener, Karl-Heinz
;
Jervan, Gert
;
Peng, Z.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Hollstein, Thomas
;
Glesner, M.
BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia
2002
/
p. 287-290 : ill
book article
90
book article
How to generate high quality tests for digital systems
Ubar, Raimund-Johannes
;
Aarna, Margit
;
Kruus, Helena
;
Raik, Jaan
2004 International Semiconductor Conference : 27th edition, October 4-6, 2004, Sinaia, Romania : CAS 2004 proceedings. Volume 2
2004
/
p. 459-462 : ill
http://dx.doi.org/10.1109/SMICND.2004.1403048
book article
91
book article
Hybrid BIST optimization for core-based systems with test pattern broadcasting
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Jervan, Gert
;
Peng, Zebo
DELTA 2004 : second IEEE International Workshop on Electronic Design, Test and Applications : 28-30 January 2004, Perth, Australia : proceedings
2004
/
p. 3-8 : ill
https://ieeexplore.ieee.org/document/1409808
book article
92
book article
Hybrid functional BIST for digital systems
Mazurova, Natalja
;
Smahtina, Julia
;
Ubar, Raimund-Johannes
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
/
p. 205-208 : ill
book article
93
journal article EST
/
journal article ENG
Implementation of Digital Twins for electrical energy conversion systems in selected case studies
Rassõlkin, Anton
;
Orosz, Tamas
;
Demidova, Galina
;
Kuts, Vladimir
;
Rjabtšikov, Viktor
;
Vaimann, Toomas
;
Kallaste, Ants
Proceedings of the Estonian Academy of Sciences
2021
/
p. 19-39 : ill
https://doi.org/10.3176/proc.2021.1.03
https://doi.org/wp-content/plugins/kirj/pub/proc-1-2021-19-39_20210201183802.pdf
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
94
book article
An improved estimation methodology for hybrid BIST cost calculation
Jervan, Gert
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Korelina, Olga
Proceedings [of] 22nd NORCHIP Conference : Oslo, Norway, 8-9 November 2004
2004
/
p. 297-300 : ill
https://ieeexplore.ieee.org/document/1423882
book article
95
book article
Improved VHDL input for high-level synthesis tool xTractor
Ellervee, Peeter
;
Ivask, Eero
;
Kruus, Margus
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 87-90 : ill
book article
96
journal article
Insener projekteerib usaldust : [ka TTÜ arvutitehnika instituudi töödest]
Ubar, Raimund-Johannes
Arvutimaailm
2011
/
7/8, lk. 8-9 : ill
https://artiklid.elnet.ee/record=b2423013*est
journal article
97
book article
Integration of high-level synthesis to the courses on reconfigurable digital systems
Sklyarov, Valery
;
Skliarova, Iouliia
;
Sudnitsõn, Aleksander
;
Kruus, Margus
2015 38th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO) : May 25-29, 2015, Opatija, Croatia : proceedings
2015
/
p. 166-171 : ill
http://dx.doi.org/10.1109/MIPRO.2015.7160258
book article
98
book article
Internet-based collaborative test generation with MOSCITO [Electronic resource]
Schneider, Andre
;
Ivask, Eero
;
Miklos, P.
;
Raik, Jaan
;
Diener, Karl-Heinz
;
Ubar, Raimund-Johannes
;
Cibakova, Tatiana
;
Gramatova, Elena
SIGDA publications on CD-ROM : DATE'02 : Design, Automation and Test in Europe, Paris, France, March 4-8, 2002
2002
/
[6] p. [CD-ROM]
https://www.cecs.uci.edu/~papers/date07/PAPERS/2002/DATE02/PDFFILES/02E_2.PDF
book article
99
book article
Internet-based software for teaching test of digital circuits
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Wuttke, Heinz-Dietrich
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
2002
/
p. 659-662 : ill
https://ieeexplore.ieee.org/document/1003344
book article
100
book article
Internet-based software for teaching test of digital circuits
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Orasson, Elmet
;
Raik, Jaan
;
Evartson, Teet
;
Wuttke, Heinz-Dietrich
Microelectronics education : proceedings of the 4th European Workshop on Microelectronics Education : EWME 2002, Spain, May 23-24, 2002
2002
/
p. 317-320 : ill
https://ieeexplore.ieee.org/document/1003344
book article
Number of records 218, displaying
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