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26
journal article
Construction of the tests of combinational circuit failures by analyzing the orthogonal disjunctive normal forms represented by the alternative graphs
Matrosova, A.Yu.
;
Pleshkov, A.G.
;
Ubar, Raimund-Johannes
Automation and remote control
2005
/
p. 313-327 : ill
http://dx.doi.org/10.1007/s10513-005-0054-9
journal article
27
journal article
Decision diagrams - from a mathematical notion to engineering applications
Stankovic, Radomir S.
;
Ubar, Raimund-Johannes
;
Astola, Jaakko
Facta Universitatis [Niš]. Series electronics and energetics
2011
/
p. 281-301 : ill
http://dx.doi.org/10.2298/FUEE1103281S
journal article
28
book article
DefSim - the defective IC
Pleskacz, Witold A.
;
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Devadze, Sergei
DATE 2007 : Design Automation and Test in Europe : Nice, France, April 16-20, 2007
2007
/
p. s96 (2 p.)
book article
29
book article
DefSim: CMOS defects on chip for research and education
Pleskacz, Witold A.
;
Borejko, Tomasz
;
Walkanis, A.
;
Stopjakova, Viera
;
Jutman, Artur
;
Ubar, Raimund-Johannes
7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings
2006
/
p. 74-79 : ill
book article
30
book article
DefSim: measurement environment for CMOS defects
Borejko, Tomasz
;
Jutman, Artur
;
Pleskacz, Witold A.
;
Ubar, Raimund-Johannes
2006 25th International Conference on Microelectronics : Belgrade, Serbia and Montenegro, 14-17 May 2006 : proceedings. Volume 2
2006
/
p. 679-682
https://ieeexplore.ieee.org/document/1651048
book article
31
book
Design and test technology for dependable systems-on-chip
2011
https://www.ester.ee/record=b4467408*est
book
32
book article
Design of a generalized fractional-order PID controller using operational amplifiers
Gonzalez, Emmanuel A.
;
Alimisis, Vassilis
;
Psychalinos, Costas
;
Tepljakov, Aleksei
2018 25th IEEE International Conference on Electronics Circuits and Systems (ICECS), Bordeaux, France, December 9–12, 2018
2018
/
p. 253-256 : ill
http://dx.doi.org/10.1109/ICECS.2018.8617954
book article
33
book article
Design space exploration and optimisation for NoC-based timing sensitive systems
Tagel, Mihkel
;
Ellervee, Peeter
;
Jervan, Gert
BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia
2010
/
p. 177-180 : ill
book article
34
book article
Design space exploration and optimisation for NoC-based timing sensitive systems
Tagel, Mihkel
;
Ellervee, Peeter
;
Jervan, Gert
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis
2010
/
lk. 117-120 : ill
book article
35
journal article
Design-for-destability-based external test and diagnosis of mesh-like network- on-a-chips
Raik, Jaan
;
Govind, Vineeth
;
Ubar, Raimund-Johannes
IET computers and digital techniques
2009
/
5, p. 476-486 : ill
http://dx.doi.org/10.1049/iet-cdt.2008.0096
journal article
36
book article
Determined-safe faults identification : a step towards ISO26262 hardware compliant designs
Augusto da Silva, Felipe
;
Bagbaba, Ahmet Cagri
;
Sartoni, Sandro
;
Cantoro, Riccardo
;
Sonza Reorda, Matteo
;
Hamdioui, Said
;
Sauer, Christian
2020 25th IEEE European Test Symposium (ETS)
2020
/
6 p. : ill
https://doi.org/10.1109/ETS48528.2020.9131568
book article
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
37
book article
Diagnostic modeling of digital systems with low- and high-level decision diagrams
Ubar, Raimund-Johannes
LATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]
2013
/
[1] p
book article
38
journal article
Digitaalkiipide projekteerimine ja test : teadus, tehnoloogia või kunst
Raik, Jaan
A & A
2005
/
lk. 5-9
journal article
39
book article
Discrete gravitational search algorithm for solving finite state machine inference problem
Spitšakova, Margarita
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve
2011
/
p. 63-66 : ill
book article
40
newspaper article
Droonide lihtsus ja odavus võimaldab neid sõjas massiliselt kasutada [Võrguväljaanne]
Klementi, Joakim
err.ee
2022
Droonide lihtsus ja odavus võimaldab neid sõjas massiliselt kasutada
newspaper article
41
newspaper article
Eesti teadlased loodavad panna putukrobotile pähe tehisaru
Raik, Jaan
novaator.err.ee
2024
Eesti teadlased loodavad panna putukrobotile pähe tehisaru
Эстонские ученые создают робота-насекомого с искусственным интеллектом
newspaper article
42
book article
Eesti teaduse nähtamatud hiiglased
Raik, Jaan
Teadusmõte Eestis (X). Tehnikateadused. 3 : [artiklikogumik]
2019
/
lk. 161-168 : ill., fot
https://www.ester.ee/record=b5208765*est
book article
43
journal article EST
/
journal article ENG
Elliptic-curve crypto processor for RFID applications
Rashid, Muhammad
;
Jamal, Sajjad Shaukat
;
Khan, Sikandar Zulqarnain
;
Alharbi, Adel R.
;
Aljaedi, Amer
;
Imran, Malik
Applied Sciences (Switzerland)
2021
/
art. 7079
https://doi.org/10.3390/app11157079
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
44
book article
Equivalent transformations of structurally synthesized BDDs and applications
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
;
Viies, Vladimir
2019 8th Mediterranean Conference on Embedded Computing (MECO)
2019
/
6 p. : ill
https://doi.org/10.1109/MECO.2019.8760283
book article
45
journal article
Error sources in analog ASICs and ways for their minimization
Mihhailov, Juri
International journal of engineering and applied sciences (EAAS)
2013
/
p. 32-41 : ill
journal article
46
journal article
Esimene üldkasutatav mikrokontrollerkiip TMS 1000
Toomsalu, Arvo
A & A
2008
/
2, lk. 9-16 : ill
journal article
47
book
European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedings
Cantarella, JD
2005
https://www.ester.ee/record=b2300865*est
book
48
journal article EST
/
journal article ENG
Evaluating architectural, redundancy, and implementation strategies for radiation hardening of FinFET integrated circuits
Pagliarini, Samuel Nascimento
;
Benites, Luis
;
Martins, Mayler
;
Rech, Paolo
;
Kastensmidt, Fernanda
IEEE transactions on nuclear science
2021
/
p. 1045-1053
https://doi.org/10.1109/TNS.2021.3070643
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
49
book article
Fast test cost calculation for hybrid BIST in digital systems
Orasson, Elmet
;
Raidma, Rein
;
Ubar, Raimund-Johannes
;
Jervan, Gert
;
Peng, Zebo
Euromicro Symposium on Digital Systems Design : [Architectures, Methods and Tools : DSD 2001] : September 4-6, 2001, Warsaw, Poland : proceedings
2001
/
p. 318-325 : ill
https://www.semanticscholar.org/paper/Fast-test-cost-calculation-for-hybrid-BIST-in-Orasson-Raidma/5aafcda5a18c2aabf0ad20cac10af10727f3c58f
book article
50
book article
Fault collapsing with linear complexity in digital circuits
Ubar, Raimund-Johannes
;
Mironov, Dmitri
;
Raik, Jaan
;
Jutman, Artur
Proceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010, Paris, France
2010
/
p. 653-656 : ill
https://ieeexplore.ieee.org/document/5537504
book article
Number of records 180, displaying
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