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151
journal article EST
/
journal article ENG
A survey on split manufacturing : attacks, defenses, and challenges
Perez, Tiago Diadami
;
Pagliarini, Samuel Nascimento
IEEE Access
2020
/
p. 184013-184035
https://doi.org/10.1109/ACCESS.2020.3029339
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Seotud publikatsioonid
1
Security-aware physical synthesis of integrated circuits = Integraallülituste turvateadlik füüsiline süntees
152
book
Süvatehnoloogiate alternatiivsed arengutrajektoorid ja nende tähendus Eestile : lõpparuanne
Koppel, Kaupo
;
Kuusik, Alar
;
Arrak, Kadri
;
Raik, Jaan
;
Niidu, Allan
;
Kõks, Kerttu-Liis
;
Lahtvee, Petri-Jaan
2023
https://media.voog.com/0000/0037/5345/files
book
153
journal article EST
/
journal article ENG
Symmetry in the narrow sense: on the linearity and time-invariance of DQ0 models
Segev, Elior
;
Ofir, Ron
;
Belikov, Juri
;
Levron, Yoash
IEEE Transactions on Power Systems
2023
/
p. 1751-1754
https://doi.org/10.1109/TPWRS.2022.3229873
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
154
book article
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
book article
155
book article
Synthesis of sequential circuits with dynamic power management
Lensen, Harri
;
Kruus, Margus
;
Sudnitsõn, Aleksander
Proc. of 42nd International Scientific Conference of Riga Technical University : RTUCET'01
2001
/
p. 81-86
book article
156
journal article
Synthesis of sequential circuits with dynamic power management
Lensen, Harri
;
Kruus, Margus
;
Sudnitsõn, Aleksander
Scientific proceedings of Riga Technical University. 7.serija, Telecommunications and electronics
2001
/
p. 81-86
journal article
157
journal article
System-level data format exploration for dynamically allocated data structures
Ellervee, Peeter
;
Miranda, Miguel
;
Catthoor, Francky
;
Hemani, Ahmed
IEEE transactions on computer-aided design of integrated circuits and systems
2001
/
12, p. 1469-1472 : ill
https://ieeexplore.ieee.org/abstract/document/969440
journal article
158
dissertation
System-level design of timing-sensitive network-on-chip based dependable systems = Kiipvõrkudel põhinevate ajakriitiliste ja töökindlate süsteemide kõrgtaseme disain
Tagel, Mihkel
2012
https://www.ester.ee/record=b2778263*est
dissertation
159
journal article
Z-RAM-mälu
Toomsalu, Arvo
A & A
2008
/
3, lk. 10-19
https://artiklid.elnet.ee/record=b1022321*est
journal article
160
newspaper article
TalTechi arvutisüsteemide professori uudne tehnoloogia raskendab spionaaži [Võrguväljaanne]
Kald, Indrek
ituudised.ee
2021
"TalTechi arvutisüsteemide professori uudne tehnoloogia raskendab spionaaži
newspaper article
161
book article
Teaching advanced test issues in digital electronics
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic
2005
/
p. S2B-1 - S2B-6 : ill
http://dx.doi.org/10.1109/ITHET.2005.1560318
book article
162
book article
Teaching digital test with BIST analyzer
Jutman, Artur
;
Tšertov, Anton
;
Tšepurov, Anton
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings
2008
/
p. 123-128 : ill
http://dx.doi.org/10.1109/EAEEIE.2008.4610171
book article
163
newspaper article
Tehisintellekti kiire areng tõotab kiibitööstust põhjalikult raputada
Port, Kristjan
delfi.ee
2023
Tehisintellekti kiire areng tõotab kiibitööstust põhjalikult raputada
newspaper article
164
newspaper article
Tehnikaülikooli teadlased loovad uue põlvkonna veakindlaid kiipe
Nõges, Krõõt
Mente et Manu
2010
/
lk. 2
https://www.ester.ee/record=b1242496*est
newspaper article
165
newspaper article
Tehnikaülikooli teadlaste juhtimisel luuakse uue põlvkonna veakindlaid kiipe
Studioosus
2010
/
veebr., lk. 8
https://www.ester.ee/record=b1558644*est
newspaper article
166
journal article
10th IEEE European Test Symposium
Ubar, Raimund-Johannes
;
Prinetto, Paolo
;
Raik, Jaan
IEEE journal of design & test of computers
2005
/
p. 480-481 : phot
http://dx.doi.org/10.1109/MDT.2005.106
journal article
167
book article
Test configurations for diagnosing faulty links in NoC switches
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Govind, Vineeth
12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings
2007
/
p. 29-34 : ill
http://dx.doi.org/10.1109/ETS.2007.41
book article
168
book article
Test cost minimization for hybrid BIST
Jervan, Gert
;
Peng, Zebo
;
Ubar, Raimund-Johannes
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 25-27 October 2000, Yamanashi, Japan : proceedings
2000
/
p. 283-298 : ill
https://ieeexplore.ieee.org/abstract/document/887168
book article
169
book article
Test time minimization for hybrid BIST of core-based systems
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
12th Asian Test Symposium (ATS 2003) : 17-19 November 2003, Xian, China
2003
/
p. 318-325 : ill
https://link.springer.com/article/10.1007/s11390-006-0907-x
book article
170
book article
Test time minimization for hybrid BIST with test pattern broadcasting
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Jervan, Gert
;
Peng, Zebo
IEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings
2003
/
p. 112-116 : ill
https://www.ida.liu.se/labs/eslab/publications/pap/db/norchip03.pdf
book article
171
book article
The dildis-project-using applets for more demonstrative lectures in digital systems design and test
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
FIE 2001 : 31st Annual Frontiers in Educations Conference : Impact on Engineering and Science Education : Reno, Nevada, October 10-13, 2001 : conference program
2001
/
p. 83
https://ieeexplore.ieee.org/document/963996
book article
172
book article
The dildis-project-using applets for more demonstrative lectures in digital systems design and test
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
Proceedings of the 31st ASEE/IEEE Frontiers in Educations Conference : FIE'2001 : Reno, Nevada
2001
/
p. SIE-2-7
https://ieeexplore.ieee.org/document/963996
book article
173
newspaper article
Töökindla arvutusriistvara keskuse juht Maksim Jenihhin
Jenihhin, Maksim
forte.delfi.ee
2024
Töökindla arvutusriistvara keskuse juht Maksim Jenihhin
newspaper article
174
book article
Ultra fast parallel fault analysis on structurally synthesized BDDs
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Raik, Jaan
;
Jutman, Artur
12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings
2007
/
p. 131-136 : ill
http://dx.doi.org/10.1109/ETS.2007.43
book article
175
book article
Untestable fault identification in sequential circuits using model-checking
Raik, Jaan
;
Fujiwara, Hideo
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
Proceedings of the 17th Asian Test Symposium ATS 2008 : November 24-27, 2008, Sapporo, Japan
2008
/
p. 21-26 : ill
http://dx.doi.org/10.1109/ATS.2008.22
book article
Number of records 193, displaying
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