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Overview of e-learning environment for web-based study of testing and diagnostics of digital systemsJutman, Artur; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich5th European Workshop on Microelectronics Education - EWME 2004, Lausanne, 20042004 / p. 173-176 https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41

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327

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Parallel critical path tracing fault simulationUbar, Raimund-Johannes39. Internationales Wissenschaftliches Kolloquium : 27.-30.09.1994. Bd. 1, Vortragsreihen1994 / S. 399-404

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328

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Parallel critical path tracing fault simulation in sequential circuitsKõusaar, Jaak; Ubar, Raimund-Johannes; Kostin, Sergei; Devadze, Sergei; Raik, JaanProceedings of 25th International Conference MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS : MIXDES 2018 : Gdynia, Poland, June 21–23, 20182018 / p. 305-310 : ill https://doi.org/10.23919/MIXDES.2018.8436880

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329

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Parallel exact critical path tracing fault simulation with reduced memory requirementsDevadze, Sergei; Ubar, Raimund-Johannes; Raik, Jaan; Jutman, Artur4th International Conference on Design and Technology of Integrated Systems in Nanoscal Era : DTIS'09 : Cairo, Egypt, April 6-9, 20092009 / p. 155-160 : ill https://ieeexplore.ieee.org/document/4938046

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330

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Parallel fault analysis on structurally synthesized BDDsDevadze, Sergei; Ubar, Raimund-JohannesInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 47-50 : ill

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331

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Parallel fault backtracing for calculation of fault coverageUbar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, Artur43rd International Conference on Microelectronics, Devices and Materials and the Workshop on Electronic Testing : September 12. - September 14.2007, Bled, Slovenia : MIDEM conference 2007 proceedings2007 / p. 165-170 : ill https://www.researchgate.net/publication/221153650_Parallel_fault_backtracing_for_calculation_of_fault_coverage

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332

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Parallel fault backtracing for calculation of fault coverageUbar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, ArturProceedings of the ASP-DAC 2008 : [13th] Asia and South Pacific Design Automation Conference 2008 : January 21-24, 2008, COEX, Seoul, Korea2008 / p. 667-672 : ill https://www.researchgate.net/publication/221153650_Parallel_fault_backtracing_for_calculation_of_fault_coverage

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333

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Parallel fault simulation in digital circuitsAarna, Margit; Raik, Jaan; Ubar, Raimund-JohannesProc. of 42nd International Scientific Conference of Riga Technical University2001 / p. 91-94

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334

journal article

Parallel fault simulation in digital circuitsAarna, Margit; Raik, Jaan; Ubar, Raimund-JohannesScientific proceedings of Riga Technical University. 7. serija, Telecommunications and electronics2001 / p. 91-94 : ill

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335

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Parallel X-fault simulation with critical path tracing technique [Electronic resource]Ubar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, ArturDATE 10 : Design, Automation & Test in Europe : Dresden, Germany, 8-12 March, 20102010 / p. 879-884 [CD-ROM] https://www.researchgate.net/publication/221341788_Parallel_X-fault_simulation_with_critical_path_tracing_technique

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336

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Performance evaluation of additive manufacturing based test samples for studies of defects in electrical insulationShafiq, Muhammad; Taklaja, Paul; Kiitam, Ivar; Tiismus, Hans; Palu, Ivo; Kütt, Lauri2021 International Conference on Electrical, Computer and Energy Technologies (ICECET)2021 / 6 l https://doi.org/10.1109/ICECET52533.2021.9698476

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337

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Platform independent event correlation tool for network managementVaarandi, RistoNOMS 2002 : 2002 IEEE/IFIP Network Operations and Management Symposium "Management Solutions for the New Communications World" : proceedings2002 / p. 907-909 https://ieeexplore.ieee.org/document/1015640

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338

journal article EST / journal article ENG

PMU placement for fault line location using neural additive models—A global XAI techniquePerl, Michael; Sun, Zhenglong; Machlev, Ram; Belikov, Juri; Levy, Kfir Yehuda; Levron, YoashInternational journal of electrical power and energy systems2024 / art. 109573, 10 p. : ill https://doi.org/10.1016/j.ijepes.2023.109573 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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339

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Power quality issues in dispersed generation and smart gridsVaimann, Toomas; Niitsoo, Jaan; Kivipõld, Tanel; Lehtla, TõnuElektronika ir elektrotechnika = Electronics and electrical engineering2012 / p. 23-26 : ill https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=573c03a0753bcfce3929ba739ff032b16882acf5

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340

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Power-constrained hybrid BIST test scheduling in an abort-on-first-fail test environmentHe, Zhiyuan; Jervan, Gert; Peng, Zebo; Eles, PetruProceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 83-86 : ill https://ieeexplore.ieee.org/document/1559782

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341

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Preliminary analysis of bearing current faults for predictive maintenance : [conference paper]Kudelina, Karolina22nd International Symposium “Topical Problems in the Field of Electrical and Power Engineering”. Doctoral School of Energy and Geotechnology III : Pärnu, Estonia, August 23-26, 20232023 / p. 35-36 : ill https://www.ester.ee/record=b5570906*est

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342

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Preliminary analysis of global parameters of induction machine for fault prediction in rotor barsKudelina, Karolina; Raja, Hadi Ashraf; Autsou, Siarhei; Asad, Bilal; Vaimann, Toomas; Rassõlkin, Anton; Kallaste, Ants2022 IEEE 20th International Power Electronics and Motion Control Conference (PEMC) : Brasov, Romania, 25-28 Sept. 2022 : proceedings2022 / p. 243-248 : ill https://doi.org/10.1109/PEMC51159.2022.9962922

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343

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Preliminary analysis of mechanical bearing faults for predictive maintenance of electrical machinesKudelina, Karolina; Raja, Hadi Ashraf; Autsou, Siarhei; Naseer, Muhammad Usman; Vaimann, Toomas; Kallaste, Ants; Pomamacki, Raimondas; Hyunh, Van Khang2023 IEEE 14th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED)2023 / p. 430-435 : ill https://doi.org/10.1109/SDEMPED54949.2023.10271451

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Artificial intelligence driven approaches for fault prognostics of electrical machines using vibration spectrum analysis = Tehisintellektil põhinevad lähenemisviisid elektrimasinate rikete prognoosimiseks vibratsioonispektri analüüsi abil

344

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ProAct: Progressive Training for Hybrid Clipped Activation Function to Enhance Resilience of DNNsMousavi, Seyedhamidreza; Ahmadilivani, Mohammad Hasan; Raik, Jaan; Jenihhin, Maksim; Daneshtalab, MasoudarXiv.org2024 / 12 p. : ill https://doi.org/10.48550/arXiv.2406.06313

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345

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Protection and common mode voltage of The Push-Pull Partial Power ConverterAbdelrahim Abdelghafour, Omar Mohamed; Vinnikov, Dmitri; Chub, Andrii; Blinov, AndreiIEEE Conference on Power Electronics and Renewable Energy : Luxor, Egypt, February, 19-21, 20232023 https://doi.org/10.1109/CPERE56564.2023.10119636

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346

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Protection of bidirectional Step-Up/Down partial power converter against short circuit and open circuit faults and mode transition issuesHassanpour, Naser; Chub, Andrii; Blinov, Andrei; Yadav, Neelesh; Hasan, Sayeed; Vinnikov, Dmitri2024 IEEE 18th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG)2024 / 6 p https://doi.org/10.1109/CPE-POWERENG60842.2024.10604315 Article at Scopus Article at WOS

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347

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A public dataset for synchronous motor electrical faults diagnosis with CNN and LSTM reference classifiersSun, Zhenglong; Machlev, Ram; Wang, Qianchao; Belikov, Juri; Levron, Yoash; Baimel, DmitryEnergy and AI2023 / art. 100274, 17 p https://doi.org/10.1016/j.egyai.2023.100274 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

348

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Register-transfer level deductive fault simulation using decision diagramsReinsalu, Uljana; Raik, Jaan; Ubar, Raimund-JohannesBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 193-196 : ill

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349

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Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPGPalermo, N.; Tihhomirov, Valentin; Copetti, Thiago; Jenihhin, Maksim; Raik, Jaan; Kostin, Sergei2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102405

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350

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Reliable health monitoring and fault management infrastructure based on embedded instrumentation and IEEE 1687Jutman, Artur; Shibin, Konstantin; Devadze, SergeiIEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings2016 / p. 240-249 : ill https://doi.org/10.1109/AUTEST.2016.7589605

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