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326
book article
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
book article
327
dissertation
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
Balakrishnan, Aneesh
2022
https://doi.org/10.23658/taltech.11/2022
https://digikogu.taltech.ee/et/Item/a594d3ec-0e6b-4a78-819a-fe1f47992612
dissertation
Seotud publikatsioonid
9
Modeling gate-level abstraction hierarchy using graph convolutional neural networks to predict functional de-rating factors
On the estimation of complex circuits functional failure rate by machine learning techniques
Challenges of reliability assessment and enhancement in autonomous systems
The validation of graph model-based, gate level low-dimensional feature data for machine learning applications
Enabling cross-layer reliability and functional safety assessment through ML-based compact models
Understanding multidimensional verification : where functional meets non-functional
Composing graph theory and deep neural networks to evaluate SEU type soft error effects
Gate-level graph representation learning : a step towards the improved stuck-at faults analysis
Modeling soft-error reliability under variability
328
book article
System modelling and measurement under the view of design of testability and fault diagnosis of analog circuits
Liu, Ji-Gou
;
Frühauf, Uwe
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 295-298: ill
book article
329
book article
Teaching diagnostic modeling of digital systems with decision diagrams [Electronic resource]
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Mironov, Dmitri
;
Evartson, Teet
;
Orasson, Elmet
;
Aarna, Margit
;
Wuttke, Heinz-Dietrich
Proceedings of 12th IASTED International Conference on Computers and Advanced Technology in Education - CATE 2009 : St.Thomas, US, November 22-24, 2009
2009
/
p. 1-6. [CD-ROM]
book article
330
book article
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
book article
331
dissertation
Techniques for robust routing, communication and computation in multiprocessor systems = Robustse marsruutimise, side ja arvutuse tehnikad mitmeprotsessorilistes süsteemides
Janson, Karl
2021
https://www.ester.ee/record=b5396084*est
https://digikogu.taltech.ee/et/Item/c9091d5c-dcd8-4b21-95a7-84ead85241e6
https://doi.org/10.23658/taltech.3/2021
dissertation
332
newspaper article
Tehisintellekt pandi metalliettevõttes rikkeid otsima, et vähendada tootmiskulusid [Võrguväljaanne]
am.ee
2022
Tehisintellekt pandi metalliettevõttes rikkeid otsima, et vähendada tootmiskulusid
newspaper article
333
book article
Test configurations for diagnosing faulty links in NoC switches
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Govind, Vineeth
12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings
2007
/
p. 29-34 : ill
http://dx.doi.org/10.1109/ETS.2007.41
book article
334
book article
Test configurations for diagnosing faulty links in NoC switches
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Govind, Vineeth
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum
2007
/
lk. 33-37 : ill
book article
335
book article
Test generation for control faults in digital systems
Dušina, Julia
;
Brik, Marina
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 325-330: ill
book article
336
book article
Test generation for finite state machines
Ubar, Raimund-Johannes
;
Brik, Marina
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 233-236: ill
book article
337
book article
Test pattern generation at the behavioral level from VHDL circuit description containing several processes
Gramatova, Elena
;
Bezakova, Jana
;
Cibakova, Tatiana
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 145-148
book article
338
book article
The analysis of integrating sigma-delta ADC noise
Gutnikov, V.S.
;
Krivchenko, T.I.
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 201-206: ill
book article
339
book article
The FEM based modeling and corresponding test rig preparation for broken rotor bars analysis
Asad, Bilal
;
Eensalu, Lauri
;
Vaimann, Toomas
;
Kallaste, Ants
;
Rassõlkin, Anton
;
Belahcen, Anouar
2019 IEEE 60th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), 7-9 October 2019 : conference proceedings
2019
/
9 p. : ill
https://doi.org/10.1109/RTUCON48111.2019.8982350
book article
340
journal article
The investigation of the Therac-25 accidents
Zdanov, Vassili
A & A
2007
/
6, lk. 20-32 : ill
https://artiklid.elnet.ee/record=b1021179*est
journal article
341
book article
The study about indefinite fault causes in Estonian 110 kV power grid
Taklaja, Paul
;
Oidram, Rein
PQ2010 : 7th International Conference "2010 Electric Power Quality and Supply Reliability" : June 16-18, 2010, Kuressaare, Estonia
2010
/
p. 177-182 : ill
book article
342
book article
3D parallel fault simulation
Gorev, Maksim
;
Ubar, Raimund-Johannes
Proceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere
2014
/
p. 39-42 : ill
book article
343
journal article
3D permeance model of induction machines taking into account saturation effects and its connection with stator current and shaft speed spectra
Martinez, Javier
;
Belahcen, Anouar
;
Arkkio, Antero
IET electric power applications
2015
/
p. 20-29 : ill
http://dx.doi.org/10.1049/iet-epa.2014.0013
journal article
344
book article
A tool for random test generation targeting high diagnostic resolution
Osimiry, Emmanuel Ovie
;
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia
2016
/
p. 79-82 : ill
http://www.ester.ee/record=b2150914*est
book article
345
book article
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
book article
346
book article
Towards artificial intelligence based automatic adaptive response analyzer for high frequency analog BIST
Petlenkov, Eduard
;
Jutman, Artur
;
Nõmm, Sven
;
Ubar, Raimund-Johannes
CIMSA 2008 : IEEE International Conference on Computational Intelligence for Measurement Systems and Applications : Istanbul, Turky, July 14-16, 2008
2008
/
p. 99-104 : ill
https://ieeexplore.ieee.org/document/4595841
book article
347
journal article EST
/
journal article ENG
Transient modeling and recovery of non-stationary fault signature for condition monitoring of induction motors
Asad, Bilal
;
Vaimann, Toomas
;
Belahcen, Anouar
;
Kallaste, Ants
;
Rassõlkin, Anton
;
Ghahfarokhi, Payam Shams
;
Kudelina, Karolina
Applied sciences
2021
/
17 p. : ill
https://doi.org/10.3390/app11062806
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
348
book article
Transient modeling and recovery of non-stationary fault signature for condition monitoring of induction motors
Asad, Bilal
;
Vaimann, Toomas
;
Belahcen, Anouar
;
Kallaste, Ants
;
Rassõlkin, Anton
;
Ghahfarokhi, Payam Shams
Advances in machine fault diagnosis
2022
/
p. 43-59
https://doi.org/10.3390/app11062806
book article
349
journal article
Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebra
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Raik, Jaan
Microprocessors and microsystems
2015
/
p. 1130-1138 : ill
http://dx.doi.org/10.1016/j.micpro.2015.05.003
journal article
350
book article
Troubleshooting and debugging functions
Ruban, Olga
;
Laugis, Juhan
5th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology : Kuressaare, January 14-19, 2008
2008
/
p. 216-221 : ill
book article
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