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Mixed-level defect simulation in data-paths of digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, Marina23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 22002 / p. 617-620 : ill https://ieeexplore.ieee.org/document/1003333

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227

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Model verification for analysis of wind power impact to transient stability in isolated power system using combined relay protection and dynamics modelling approachMaripuu, Rain; Tsernobrovkin, Oleg; Palu, Ivo; Kilter, JakoPQ2012 : 8th International Conference : 2012 Electric Power Quality and Supply Reliability : June 11-13, 2012, Tartu, Estonia : conference proceedings2012 / p. 169-174 : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6256222

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228

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Modeling microprocessor faults on high-level decision diagrams [Electronic resource]Ubar, Raimund-Johannes; Raik, Jaan; Jutman, Artur; Jenihhin, Maksim; Istenberg, Martin; Wuttke, Heinz-DietrichDSN 2008 : supplemental : 2008 IEEE International Conference on Dependable Systems & Networks With FTCS & DCC (DSN) : June 24-27, 2008, Anchorage, Alaska2008 / p. C17-C22 : ill. [CD-ROM] https://webhost.laas.fr/TSF/WDSN08/2ndWDSN08(LAAS)_files/Slides/WDSN08S-04-Ubar.pdf

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229

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Modeling sequential circuits with shared structurally synthesized BDDsUbar, Raimund-Johannes; Marenkov, Mihhail; Mironov, Dmitri; Viies, VladimirProceedings of 2014 9th International Design & Test Symposium (IDT) : Sheraton Club des Pins Hotel, Algiers, Algeria, December 16-18, 20142014 / p. 130-135 : ill

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230

journal article EST / journal article ENG

Modified winding function-based model of squirrel cage induction motor for fault diagnosticsAsad, Bilal; Vaimann, Toomas; Belahcen, Anouar; Kallaste, Ants; Rassõlkin, Anton; Iqbal, Muhammad NaveedIET electric power applications2020 / p. 1722-1734 https://doi.org/10.1049/iet-epa.2019.1002 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

231

newspaper article

Mootoririkkega uurimislaev Salme ootab tormivarjus ilma paranemist [Võrguväljaanne]postimees.ee2021 "Mootoririkkega uurimislaev Salme ootab tormivarjus ilma paranemist"

newspaper article

232

book article

Multi-level fault simulation of digital systems on decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaThe First IEEE International Workshop on Electronic Design, Test and Applications : DELTA 2002, 29-31 January 2002, Christchurch, New Zealand : proceedings2002 / p. 86-91 : ill

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233

book

Multi-level test generation and fault diagnosis in digital systemsUbar, Raimund-Johannes1992

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234

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Multi-level test generation for digital systems at system, circuit and defect levelsUbar, Raimund-JohannesProceedings of the 7th International Scientific Conference "Theory and Technique of Information Transmission, Reception and Processing" : Tuapse, October 1-4, 20012001 / p. 286-288

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235

book article

Multi-loop model reference adaptive control of fractional-order PID control systemsAlagoz, Baris Baykant; Tepljakov, Aleksei; Petlenkov, Eduard; Yeroglu, Celaleddin2017 40th International Conference on Telecommunications and Signal Processing TSP : July 5-7, 2017, Barcelona, Spain2017 / p. 702-705 : ill https://doi.org/10.1109/TSP.2017.8076078

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236

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Multiple control fault testing in digital systems with high-level decision diagramsUbar, Raimund-Johannes; Oyeniran, Adeboye Stephen2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings2016 / [6] p. : ill http://dx.doi.org/10.1109/AQTR.2016.7501287

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237

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Multiple fault testing in systems-on-chip with high-level decision diagramsUbar, Raimund-Johannes; Oyeniran, Adeboye Stephen; Schölzel, Mario; Vierhaus, Heinrich TheodorProceedings of 2015 10th International Design & Test Symposium (IDT) : Dead Sea, Jordan, 14-16 December 20152015 / p. 66-71 : ill http://dx.doi.org/10.1109/IDT.2015.7396738

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238

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Multiple stuck-at-fault detection theoremUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia2012 / p. 236-241 : ill

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239

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Multiple-objective backtrace for solving test generation constraintsMekler, A.; Raik, JaanInternational Symposium on System-on-Chip : November 19-21, 2003, Tampere, Finland : proceedings2003 / p. 123-126 : ill https://ieeexplore.ieee.org/document/1267732

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240

newspaper article

Naine, kes muudab maailma: noor teadlane loob süsteemi, mis ennetab elektrimasinate rikkeid [Võrguväljaanne]Keba, Triinudelfi.ee2022 Naine, kes muudab maailma: noor teadlane loob süsteemi, mis ennetab elektrimasinate rikkeid

newspaper article

241

book article

Necessity for implementation of inverse problem theory in electric machine fault diagnosisVaimann, Toomas; Belahcen, Anouar; Kallaste, AntsSDEMPED 2015 : 10th IEEE International Symposium on Diagnostics for Electric Machines, Power Electronics and Drives : Guarda, Portugal, September 1-4, 2015 : proceedings2015 / p. 380-385 : ill http://dx.doi.org/10.1109/DEMPED.2015.7303718

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242

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New built-in self-test scheme for SoC interconnectJutman, Artur; Ubar, Raimund-Johannes; Raik, JaanThe 9th World Multi-Conference on Systemics, Cybernetics and Informatics : WMSCI 2005 : July 10-13, 2005, Orlando, Florida, USA. Vol. IV2005 / p. 19-24 : ill https://www.researchgate.net/publication/237375234_New_Built-In_Self-Test_Scheme_for_SoC_Interconnect

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243

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New categories of Safe Faults in a processor-based Embedded SystemGürsoy, Cemil Cem; Jenihhin, Maksim; Oyeniran, Adeboye Stephen; Piumatti, Davide; Raik, Jaan; Sonza Reorda, Matteo; Ubar, Raimund-Johannes2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings2019 / 4 p. : ill https://doi.org/10.1109/DDECS.2019.8724642

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244

journal article EST / journal article ENG

A new resonant fault current limiter for improved wind turbine transient stabilityDemin, Slava; Sitbon, Moshe; Aharon, Ilan; Barbi, Eli; Machlev, Ram; Belikov, Juri; Levron, Yoash; Baimel, DmitryElectric Power Systems Research2023 / art. 109600 https://doi.org/10.1016/j.epsr.2023.109600 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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245

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New technique for hierarchical identification of untestable faults in sequential circuitsKrivenko, Anna; Ubar, Raimund-Johannes; Raik, Jaan; Kruus, MargusInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja2008 / lk. 155-158 : ill

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246

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NoCDepend : a flexible and scalable dependability technique for 3D networks-on-chipHollstein, Thomas; Azad, Siavoosh Payandeh; Kogge, Thilo; Ying, Haoyuan; Hofmann, Klaus2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 75-78 : ill http://dx.doi.org/10.1109/DDECS.2015.30

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247

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Non-intrusive defects identification for the high voltage instrument transformersAsefi, Sajjad; Kilter, Jako; Landsberg, Mart2023 IEEE 17th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG)2023 / 5 p https://doi.org/10.1109/CPE-POWERENG58103.2023.10227493

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248

journal article EST / journal article ENG

Novel approaches to electrical machine fault diagnosisVaimann, Toomas; Antonino-Daviu, Jose Alfonso; Rassõlkin, AntonEnergies2023 / art. 5641 https://doi.org/10.3390/en16155641 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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249

book article

A novel artificial neural networks based automatic adaptive fault detection technique for analog circuitsPetlenkov, Eduard; Jutman, Artur; Nõmm, Sven; Ubar, Raimund-JohannesBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 167-170 : ill

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250

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A novel random approach to diagnostic test generationOsimiry, Emmanuel Ovie; Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark2016 / [4] p. : ill https://doi.org/10.1109/NORCHIP.2016.7792915

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