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251
book article
Numerical study on the structural behavior of intact and damaged box beams under four-point bending load
Putranto, Teguh
;
Kõrgesaar, Mihkel
Developments in the Collision and Grounding of Ships and Offshore Structures : Proceedings of the 8th International Conference on Collision and Grounding of Ships and Offshore Structures (ICCGS 2019), 21-23 October, 2019, Lisbon, Portugal
2019
/
p. 139−143
https://www.taylorfrancis.com/books/e/9781003002420/chapters/10.1201/9781003002420-17
book article
252
journal article EST
/
journal article ENG
Observer-based residual generation for nonlinear discrete-time systems
Kaldmäe, Arvo
;
Kotta, Ülle
Proceedings of the Estonian Academy of Sciences
2018
/
p. 325-336
http://www.kirj.ee/public/proceedings_pdf/2018/issue_4/proc-2018-4-325-336.pdf
https://doi.org/10.3176/proc.2018.4.01
https://artiklid.elnet.ee/record=b2868167*est
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
253
book article
Off-line testing of crosstalk induced glitch faults in NoC Interconnects
Bengtsson, Tomas
;
Kumar, Shashi
;
Jutman, Artur
;
Ubar, Raimund-Johannes
Proceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 2006
2006
/
p. 221-225 : ill
http://dx.doi.org/10.1109/NORCHP.2006.329215
book article
254
book article
On coverage of timing related faults at board level
Jutman, Artur
;
Aleksejev, Igor
;
Devadze, Sergei
2016 21st IEEE European Test Symposium (ETS) : May 23rd-26th 2016, Amsterdam, The Netherlands : proceedings
2016
/
[2] p. : ill
https://doi.org/10.1109/ETS.2016.7519295
book article
255
book article
On efficient logic-level simulation of digital circuits represented by the SSBDD model
Jutman, Artur
;
Raik, Jaan
;
Ubar, Raimund-Johannes
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
2002
/
p. 621-624 : ill
https://ieeexplore.ieee.org/document/1003334
book article
256
book article
On NBTI-induced aging analysis in IEEE 1687 reconfigurable scan networks
Damljanovic, Aleksa
;
Squillero, Giovanni
;
Gürsoy, Cemil Cem
;
Jenihhin, Maksim
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 335-340 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920313
book article
257
book article
On the estimation of complex circuits functional failure rate by machine learning techniques
Lange, Thomas
;
Balakrishnan, Aneesh
;
Glorieux, Maximilien
;
Alexandrescu, Dan
;
Sterpone, Luca
49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - DSN 2019 : Supplemental Volume : proceedings
2019
/
p. 35-41 : ill
https://doi.org/10.1109/DSN-S.2019.00021
book article
Seotud publikatsioonid
1
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
258
book article
On-chip sensors data collection and analysis for SoC health management
Shibin, Konstantin
;
Jenihhin, Maksim
;
Jutman, Artur
;
Devadze, Sergei
;
Tsertov, Anton
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
2023
/
6 p
https://doi.org/10.1109/DFT59622.2023.10313562
book article
259
book article
On-line fault classification and handling in IEEE1687 based fault management system for complex SoCs
Shibin, Konstantin
;
Devadze, Sergei
;
Jutman, Artur
LATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 2016
2016
/
p. 69-74 : ill
https://doi.org/10.1109/LATW.2016.7483342
book article
260
book article
Operation of Single-Chip MOSFET and IGBT Devices after failure due to repetitive avalanche [Electronic resource]
Blinov, Andrei
;
Norrga, Staffan
;
Tibola, Gabriel
EPE'15 ECCE Europe : 8-10 September 2015, Geneva, Switzerland : 17th European Conference on Power Electronics and Applications
2015
/
p. 1-9 : ill. [USB]
http://dx.doi.org/10.1109/EPE.2015.7309190
book article
261
book article
Optimization of memory-constrained hybrid BIST for testing core-based systems
Jervan, Gert
;
Kruus, Helena
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
Proceedings of the IEEE 2nd International Symposium on Industrial Embedded Systems : SIES'2007 : Lisbon, Portugal, 4-6 July 2007
2007
/
p. 71-77
https://ieeexplore.ieee.org/document/4297319
book article
262
book article
Overview of e-learning environment for web-based study of testing and diagnostics of digital systems
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
Microelectronics education : proceedings of the 5th European Workshop on Microelectronics Education, held in Lausanne, Switzerland, April 15-16, 2004
2004
/
p. 253-258 : ill
https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41
book article
263
book article
Overview of e-learning environment for web-based study of testing and diagnostics of digital systems
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
5th European Workshop on Microelectronics Education - EWME 2004, Lausanne, 2004
2004
/
p. 173-176
https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41
book article
264
book article
Parallel critical path tracing fault simulation in sequential circuits
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Devadze, Sergei
;
Raik, Jaan
Proceedings of 25th International Conference MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS : MIXDES 2018 : Gdynia, Poland, June 21–23, 2018
2018
/
p. 305-310 : ill
https://doi.org/10.23919/MIXDES.2018.8436880
book article
265
book article
Parallel exact critical path tracing fault simulation with reduced memory requirements
Devadze, Sergei
;
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Jutman, Artur
4th International Conference on Design and Technology of Integrated Systems in Nanoscal Era : DTIS'09 : Cairo, Egypt, April 6-9, 2009
2009
/
p. 155-160 : ill
https://ieeexplore.ieee.org/document/4938046
book article
266
book article
Parallel fault analysis on structurally synthesized BDDs
Devadze, Sergei
;
Ubar, Raimund-Johannes
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum
2007
/
lk. 47-50 : ill
book article
267
book article
Parallel fault backtracing for calculation of fault coverage
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Raik, Jaan
;
Jutman, Artur
Proceedings of the ASP-DAC 2008 : [13th] Asia and South Pacific Design Automation Conference 2008 : January 21-24, 2008, COEX, Seoul, Korea
2008
/
p. 667-672 : ill
https://www.researchgate.net/publication/221153650_Parallel_fault_backtracing_for_calculation_of_fault_coverage
book article
268
book article
Parallel fault simulation in digital circuits
Aarna, Margit
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proc. of 42nd International Scientific Conference of Riga Technical University
2001
/
p. 91-94
book article
269
journal article
Parallel fault simulation in digital circuits
Aarna, Margit
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Scientific proceedings of Riga Technical University. 7. serija, Telecommunications and electronics
2001
/
p. 91-94 : ill
journal article
270
book article
Parallel X-fault simulation with critical path tracing technique [Electronic resource]
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Raik, Jaan
;
Jutman, Artur
DATE 10 : Design, Automation & Test in Europe : Dresden, Germany, 8-12 March, 2010
2010
/
p. 879-884 [CD-ROM]
https://www.researchgate.net/publication/221341788_Parallel_X-fault_simulation_with_critical_path_tracing_technique
book article
271
book article
Performance evaluation of additive manufacturing based test samples for studies of defects in electrical insulation
Shafiq, Muhammad
;
Taklaja, Paul
;
Kiitam, Ivar
;
Tiismus, Hans
;
Palu, Ivo
;
Kütt, Lauri
2021 International Conference on Electrical, Computer and Energy Technologies (ICECET)
2021
/
6 l
https://doi.org/10.1109/ICECET52533.2021.9698476
book article
272
book article
Platform independent event correlation tool for network management
Vaarandi, Risto
NOMS 2002 : 2002 IEEE/IFIP Network Operations and Management Symposium "Management Solutions for the New Communications World" : proceedings
2002
/
p. 907-909
https://ieeexplore.ieee.org/document/1015640
book article
273
journal article
Power quality issues in dispersed generation and smart grids
Vaimann, Toomas
;
Niitsoo, Jaan
;
Kivipõld, Tanel
;
Lehtla, Tõnu
Elektronika ir elektrotechnika = Electronics and electrical engineering
2012
/
p. 23-26 : ill
https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=573c03a0753bcfce3929ba739ff032b16882acf5
journal article
274
book article
Preliminary analysis of bearing current faults for predictive maintenance : [conference paper]
Kudelina, Karolina
22nd International Symposium “Topical Problems in the Field of Electrical and Power Engineering”. Doctoral School of Energy and Geotechnology III : Pärnu, Estonia, August 23-26, 2023
2023
/
p. 35-36 : ill
https://www.ester.ee/record=b5570906*est
book article
275
book article
Preliminary analysis of global parameters of induction machine for fault prediction in rotor bars
Kudelina, Karolina
;
Raja, Hadi Ashraf
;
Autsou, Siarhei
;
Asad, Bilal
;
Vaimann, Toomas
;
Rassõlkin, Anton
;
Kallaste, Ants
2022 IEEE 20th International Power Electronics and Motion Control Conference (PEMC) : Brasov, Romania, 25-28 Sept. 2022 : proceedings
2022
/
p. 243-248 : ill
https://doi.org/10.1109/PEMC51159.2022.9962922
book article
Number of records 361, displaying
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