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251
book article
New built-in self-test scheme for SoC interconnect
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Raik, Jaan
The 9th World Multi-Conference on Systemics, Cybernetics and Informatics : WMSCI 2005 : July 10-13, 2005, Orlando, Florida, USA. Vol. IV
2005
/
p. 19-24 : ill
https://www.researchgate.net/publication/237375234_New_Built-In_Self-Test_Scheme_for_SoC_Interconnect
book article
252
book article
New categories of Safe Faults in a processor-based Embedded System
Gürsoy, Cemil Cem
;
Jenihhin, Maksim
;
Oyeniran, Adeboye Stephen
;
Piumatti, Davide
;
Raik, Jaan
;
Sonza Reorda, Matteo
;
Ubar, Raimund-Johannes
2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings
2019
/
4 p. : ill
https://doi.org/10.1109/DDECS.2019.8724642
book article
253
journal article EST
/
journal article ENG
A new resonant fault current limiter for improved wind turbine transient stability
Demin, Slava
;
Sitbon, Moshe
;
Aharon, Ilan
;
Barbi, Eli
;
Machlev, Ram
;
Belikov, Juri
;
Levron, Yoash
;
Baimel, Dmitry
Electric Power Systems Research
2023
/
art. 109600, 8 p
https://doi.org/10.1016/j.epsr.2023.109600
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
254
book article
New technique for hierarchical identification of untestable faults in sequential circuits
Krivenko, Anna
;
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Kruus, Margus
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
lk. 155-158 : ill
book article
255
book article
NoCDepend : a flexible and scalable dependability technique for 3D networks-on-chip
Hollstein, Thomas
;
Azad, Siavoosh Payandeh
;
Kogge, Thilo
;
Ying, Haoyuan
;
Hofmann, Klaus
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 75-78 : ill
http://dx.doi.org/10.1109/DDECS.2015.30
book article
256
book article
Non-intrusive defects identification for the high voltage instrument transformers
Asefi, Sajjad
;
Kilter, Jako
;
Landsberg, Mart
2023 IEEE 17th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG)
2023
/
5 p
https://doi.org/10.1109/CPE-POWERENG58103.2023.10227493
book article
257
journal article EST
/
journal article ENG
Novel approaches to electrical machine fault diagnosis
Vaimann, Toomas
;
Antonino-Daviu, Jose Alfonso
;
Rassõlkin, Anton
Energies
2023
/
art. 5641
https://doi.org/10.3390/en16155641
Journal metrics at Scopus
Article at Scopus
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Article at WOS
journal article EST
/
journal article ENG
258
book article
A novel artificial neural networks based automatic adaptive fault detection technique for analog circuits
Petlenkov, Eduard
;
Jutman, Artur
;
Nõmm, Sven
;
Ubar, Raimund-Johannes
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 167-170 : ill
book article
259
book article
A novel random approach to diagnostic test generation
Osimiry, Emmanuel Ovie
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark
2016
/
[4] p. : ill
https://doi.org/10.1109/NORCHIP.2016.7792915
book article
260
book article
Numerical study on the structural behavior of intact and damaged box beams under four-point bending load
Putranto, Teguh
;
Kõrgesaar, Mihkel
Developments in the Collision and Grounding of Ships and Offshore Structures : Proceedings of the 8th International Conference on Collision and Grounding of Ships and Offshore Structures (ICCGS 2019), 21-23 October, 2019, Lisbon, Portugal
2019
/
p. 139−143
https://www.taylorfrancis.com/books/e/9781003002420/chapters/10.1201/9781003002420-17
book article
261
journal article EST
/
journal article ENG
Observer-based residual generation for nonlinear discrete-time systems
Kaldmäe, Arvo
;
Kotta, Ülle
Proceedings of the Estonian Academy of Sciences
2018
/
p. 325-336
http://www.kirj.ee/public/proceedings_pdf/2018/issue_4/proc-2018-4-325-336.pdf
https://doi.org/10.3176/proc.2018.4.01
https://artiklid.elnet.ee/record=b2868167*est
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
262
book article
Off-line testing of crosstalk induced glitch faults in NoC Interconnects
Bengtsson, Tomas
;
Kumar, Shashi
;
Jutman, Artur
;
Ubar, Raimund-Johannes
Proceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 2006
2006
/
p. 221-225 : ill
http://dx.doi.org/10.1109/NORCHP.2006.329215
book article
263
book article
On coverage of timing related faults at board level
Jutman, Artur
;
Aleksejev, Igor
;
Devadze, Sergei
2016 21st IEEE European Test Symposium (ETS) : May 23rd-26th 2016, Amsterdam, The Netherlands : proceedings
2016
/
[2] p. : ill
https://doi.org/10.1109/ETS.2016.7519295
book article
264
book article
On efficient logic-level simulation of digital circuits represented by the SSBDD model
Jutman, Artur
;
Raik, Jaan
;
Ubar, Raimund-Johannes
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
2002
/
p. 621-624 : ill
https://ieeexplore.ieee.org/document/1003334
book article
265
book article
On multiple fault detection in combinational logic circuits
Birger, Alexander
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 225-228
book article
266
book article
On NBTI-induced aging analysis in IEEE 1687 reconfigurable scan networks
Damljanovic, Aleksa
;
Squillero, Giovanni
;
Gürsoy, Cemil Cem
;
Jenihhin, Maksim
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 335-340 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920313
book article
267
book article
On the estimation of complex circuits functional failure rate by machine learning techniques
Lange, Thomas
;
Balakrishnan, Aneesh
;
Glorieux, Maximilien
;
Alexandrescu, Dan
;
Sterpone, Luca
49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - DSN 2019 : Supplemental Volume : proceedings
2019
/
p. 35-41 : ill
https://doi.org/10.1109/DSN-S.2019.00021
book article
Seotud publikatsioonid
1
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
268
book article
On-chip sensors data collection and analysis for SoC health management
Shibin, Konstantin
;
Jenihhin, Maksim
;
Jutman, Artur
;
Devadze, Sergei
;
Tsertov, Anton
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
2023
/
6 p
https://doi.org/10.1109/DFT59622.2023.10313562
book article
269
book article
On-line fault classification and handling in IEEE1687 based fault management system for complex SoCs
Shibin, Konstantin
;
Devadze, Sergei
;
Jutman, Artur
LATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 2016
2016
/
p. 69-74 : ill
https://doi.org/10.1109/LATW.2016.7483342
book article
270
book article
Operation of Single-Chip MOSFET and IGBT Devices after failure due to repetitive avalanche [Electronic resource]
Blinov, Andrei
;
Norrga, Staffan
;
Tibola, Gabriel
EPE'15 ECCE Europe : 8-10 September 2015, Geneva, Switzerland : 17th European Conference on Power Electronics and Applications
2015
/
p. 1-9 : ill. [USB]
http://dx.doi.org/10.1109/EPE.2015.7309190
book article
271
book article
Optimization of memory-constrained hybrid BIST for testing core-based systems
Jervan, Gert
;
Kruus, Helena
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
Proceedings of the IEEE 2nd International Symposium on Industrial Embedded Systems : SIES'2007 : Lisbon, Portugal, 4-6 July 2007
2007
/
p. 71-77
https://ieeexplore.ieee.org/document/4297319
book article
272
book article
Overview of e-learning environment for web-based study of testing and diagnostics of digital systems
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
Microelectronics education : proceedings of the 5th European Workshop on Microelectronics Education, held in Lausanne, Switzerland, April 15-16, 2004
2004
/
p. 253-258 : ill
https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41
book article
273
book article
Overview of e-learning environment for web-based study of testing and diagnostics of digital systems
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
5th European Workshop on Microelectronics Education - EWME 2004, Lausanne, 2004
2004
/
p. 173-176
https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41
book article
274
book article
Parallel critical path tracing fault simulation
Ubar, Raimund-Johannes
39. Internationales Wissenschaftliches Kolloquium : 27.-30.09.1994. Bd. 1, Vortragsreihen
1994
/
S. 399-404
book article
275
book article
Parallel critical path tracing fault simulation in sequential circuits
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Devadze, Sergei
;
Raik, Jaan
Proceedings of 25th International Conference MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS : MIXDES 2018 : Gdynia, Poland, June 21–23, 2018
2018
/
p. 305-310 : ill
https://doi.org/10.23919/MIXDES.2018.8436880
book article
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