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Ubar, Raimund-Johannes (TalTech author)
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251
book article
Fast extended test access via JTAG and FPGAs
Devadze, Sergei
;
Jutman, Artur
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
International Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings
2009
/
p. 1-7 : ill
http://dx.doi.org/10.1109/TEST.2009.5355668
book article
252
book article
Fast fault emulation for synchronous sequential circuits
Raik, Jaan
;
Ellervee, Peeter
;
Tihhomirov, Valentin
;
Ubar, Raimund-Johannes
Proceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 2004
2004
/
p. 35-40
https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=a6eb712498a5f23db3f95ad66bada257c21e96f0
book article
253
book article
Fast fault simulation for extended class of faults in scan-path circuits
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Raik, Jaan
;
Jutman, Artur
Proceedings : Fifth IEEE International Symposium on Electronic Design, Test and Applications : DELTA 2010 : 13-15 January 2010, Ho Chi Minh City, Vietnam
2010
/
p. 14-19
https://ieeexplore.ieee.org/document/5438717
book article
254
journal article EST
/
journal article ENG
Fast identification of true critical paths in sequential circuits
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
;
Jürimägi, Lembit
Microelectronics reliability
2018
/
p. 252-261 : ill
https://doi.org/10.1016/j.microrel.2017.11.027
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
255
book article
Fast RTL fault simulation using decision diagrams and bitwise set operations
Reinsalu, Uljana
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 3-5 October 2011, Vancouver, Canada
2011
/
p. 164-170
https://ieeexplore.ieee.org/document/6104440
book article
256
book article
Fast static compaction of test sequences using implications and greedy search
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
ETW 2001 : IEEE European Test Workshop : Stockholm, May 29 June 1, 2001 : informal digest
2001
/
p. 207-209 : ill
https://www.semanticscholar.org/paper/Fast-Static-Compaction-of-Test-Sequences-using-and-Raik-Jutman/3a7a8ddda6e63d3e2fde0c8650d4518851746221
book article
257
book article
Fast static compaction of tests composed of independent sequences : basic properties and comparison of methods
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
The 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume II
2002
/
p. 445-448 : ill
http://dx.doi.org/10.1109/ICECS.2002.1046190
https://ieeexplore.ieee.org/document/1046190
book article
258
book article
Fast test cost calculation for hybrid BIST in digital systems
Orasson, Elmet
;
Raidma, Rein
;
Ubar, Raimund-Johannes
;
Jervan, Gert
;
Peng, Zebo
Euromicro Symposium on Digital Systems Design : [Architectures, Methods and Tools : DSD 2001] : September 4-6, 2001, Warsaw, Poland : proceedings
2001
/
p. 318-325 : ill
https://www.semanticscholar.org/paper/Fast-test-cost-calculation-for-hybrid-BIST-in-Orasson-Raidma/5aafcda5a18c2aabf0ad20cac10af10727f3c58f
book article
259
journal article
Fast test pattern generation for sequential circuits using decision diagram representations
Raik, Jaan
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications (JETTA)
2000
/
3, p. 213-226 : ill
https://link.springer.com/article/10.1023/A:1008335130158
journal article
260
book article EST
/
book article ENG
Fault collapsing in digital circuits using fast fault dominance and equivalence analysis with SSBDDs
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Orasson, Elmet
;
Raik, Jaan
VLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 Daejeon, Korea, October 5-7, 2015 : revised selected papers
2016
/
p. 23-45 : ill
https://doi.org/10.1007/978-3-319-46097-0_2
Conference Proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
261
book article
Fault collapsing with linear complexity in digital circuits
Ubar, Raimund-Johannes
;
Mironov, Dmitri
;
Raik, Jaan
;
Jutman, Artur
Proceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010, Paris, France
2010
/
p. 653-656 : ill
https://ieeexplore.ieee.org/document/5537504
book article
262
book article
Fault diagnosis in integrated circuits with BIST
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
;
Evartson, Teet
;
Lensen, Harri
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
2007
/
p. 604-610 : ill
http://dx.doi.org/10.1109/DSD.2007.4341530
book article
263
book article
Fault diagnosis in the BIST environment based on bisection of detected faults
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
LATW2007 : 8th IEEE Latin-American Test Workshop : March 11-14, 2007, Cuzco, Peru
2007
/
[6] p. : ill
book article
264
journal article
Fault diagnosis in VLSI devices
Ubar, Raimund-Johannes
Proceedings of the Estonian Academy of Sciences. Engineering
1995
/
1, p. 51-67
journal article
265
book article
Fault diagnosis of VLSI devices using alternative graph representation
Ubar, Raimund-Johannes
Proceedings of the 8th Symposium on Microcomputer and Microprocessor Applications, Budapest, October 12-14, 1994. Vol. 1
1994
/
p. 34-44
book article
266
journal article
Fault effect reasoning in digital systems by topological view on low- and high-level decision diagrams
Ubar, Raimund-Johannes
Вестник Томского государственного университета. Управление, вычислительная техника и информатика
2014
/
p. 99-113 : ill
http://journals.tsu.ru/informatics/&journal_page=archive&id=923&article_id=12107
journal article
267
book article
Fault model and test synthesis for RISC-processors
Ubar, Raimund-Johannes
;
Markus, Antti
;
Jervan, Gert
;
Raik, Jaan
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 229-232: ill
book article
268
book article
Fault modeling and diagnosis in digital systems
Ubar, Raimund-Johannes
CREDES Summer School : Dependable Systems Design : handouts
2011
/
p. 91-106 : ill
book article
269
book article
Fault modeling and test generation with low- and high-level decision diagrams
Ubar, Raimund-Johannes
24. GI/GMM/ITG-Workshop : Testmethoden und Zuverlässigkeit von Schaltungen und Systemen
2012
/
p. 1-12
book article
270
book article
Fault oriented test pattern generation for sequential circuits using genetic algorithms
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE European Test Workshop
2000
/
p. 319-320
book article
271
book article
Fault oriented test pattern generation for sequential circuits using Genetic Algorithms
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
2000
/
p. 129-132 : ill
book article
272
dissertation
Fault simulation of digital systems = Digitaalsüsteemide rikete simuleerimine
Devadze, Sergei
2009
https://digi.lib.ttu.ee/i/?445
https://www.ester.ee/record=b2508727*est
dissertation
273
book article
Fault simulation with parallel critical path tracing for combinational circuits using structurally synthesized BDDs
Devadze, Sergei
;
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings
2006
/
p. 97-102 : ill
book article
274
book article
Fault simulation with parallel exact critical path tracing in multiple core environment
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Devadze, Sergei
2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings
2015
/
p. 1180-1185 : ill
book article
275
book article
Faults and fault models for integrated circuits and systems [Electronic resource] : [slides]
Ubar, Raimund-Johannes
Design and Test Technology for Dependable Hardware/Software Systems : DEDIS/DAAD Summer Academy : BTU Cottbus, Sept. 1st-12th, 2008
2008
/
[64] p. : ill. [CD-ROM]
book article
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CV
66
1.
Ubar, Raimund-Johannes
2.
Palm, Raimund
3.
Räämet, Raimund 1918-2004
4.
Aare, Johannes 1915-2000
5.
Aavik, Eduard-Johannes
6.
Ahrenschild, Johannes (-1936)
7.
Alaots, Johannes
8.
Aljak, Arnold Johannes
9.
Allik, Erich-Johannes
10.
Avik, Eduard Johannes 1891-1942
11.
Drechsler, Wolfgang Johannes Max
12.
Ehala, Johannes
13.
Hint, Johannes 1914-1985
14.
Johannes, Ille
15.
Johannson, Johannes
16.
Johanson, Johannes
17.
Juhans, Johannes 1874-1956
18.
Kajander, Aleksi Oskar Johannes
19.
Kiiwet, Johannes
20.
Kiivet, Johannes 1879-1967
21.
Kivit, Johannes
22.
Kollist, Johannes 1884-1937
23.
Kollist, Johannes Theodor
24.
Korv, August Johannes 1911-1981
25.
Krimmer, Robert Johannes
26.
Käpp, Martin Johannes
27.
Langel, Johannes 1900-1985
28.
Langell, Johannes
29.
Livländer, Robert Johannes
30.
Lutsar, Richard-Johannes
31.
Madise, Johannes 1920-?
32.
Maltenek, Evald Leonhard Johannes
33.
Matsulevitš, Johannes
34.
Meitre, Johannes 1906-1978
35.
Messer, Johannes
36.
Muru, Johannes
37.
Mäll, Johannes 1911-1981
38.
Mühlman, Johannes
39.
Mühlmann, Johannes 1888-1936
40.
Notermans, Antonius Johannes Hubertus
41.
Nuudi, Johannes 1895-1975
42.
Palo, Johannes 1925-1960
43.
Pals, Johannes 1903-1941
44.
Pello, Johannes
45.
Pervik, Johannes 1892-1958
46.
Pervik, Johannes-Eduard
47.
Presmann, Johannes 1942-2013
48.
Putk, Aksel-Johannes 1928-1999
49.
Püümann, Mait Johannes
50.
Renter, Olav-Johannes
51.
Roes, Johannes
52.
Russwurm, Johannes
53.
Russvurm, Johannes 1855-1939
54.
Russvurm, Johannes Carl Gysbert Immanuel
55.
Sakeus, Johannes 1880-1934
56.
Soosaar, Arvid Johannes
57.
Taimsalu, Johannes 1891-1942
58.
Teiman, Johannes
59.
Teimann, Johannes Rudolf (kuni 22.05.1935)
60.
Tomson, Johannes
61.
Tuulre, Feliks Johannes 1908-1987
62.
Veerus, Johannes
63.
Veerus, Johannes Voldemar 1897-1972
64.
Weisberg, Karl-Johannes
65.
Verus, Johannes Voldemar
66.
Vuhk (Vuht), Oskar Johannes
author
62
1.
Ubar, Raimund-Johannes
2.
Hagelberg, Raimund
3.
Räämet, Raimund
4.
Aare, Johannes
5.
Allas, Johannes-Emmanuel
6.
Avik, Eduard Johannes
7.
Bauer, Johannes
8.
Bender, Naatan Johannes
9.
Buchmann, Johannes
10.
Deelstra, Johannes
11.
Edvardsson, Johannes
12.
Ehala, Johannes
13.
Einolander, Johannes
14.
Engelmayer, Johannes
15.
Gotzmann, Johannes
16.
Helander, Johannes
17.
Hint, Johannes
18.
Hüsse, Johannes
19.
Johannes, Anu
20.
Johannes, Ellen
21.
Johannes, Ille
22.
Johannes, Kaljo-Mihkel
23.
Järv, Johannes
24.
Kadak, Johannes
25.
Kajander, Aleksi Oskar Johannes
26.
Karstensen, Johannes
27.
Kerkhoven, Eduard Johannes
28.
Kiivet, Johannes
29.
Krimmer, Robert Johannes
30.
Kukebal, Johannes
31.
Matsulevitš, Johannes
32.
Meitre, Johannes
33.
Miller, Johannes
34.
Muru, Johannes
35.
Mühlman, Johannes
36.
Norberg, Johannes
37.
Notermans, Antonius Johannes Hubertus
38.
Ortlepp, Johannes
39.
Parikas, Johannes
40.
Pello, Johannes
41.
Pervik, Johannes-Eduard
42.
Piiper, Johannes
43.
Presmann, Johannes
44.
Putk, Aksel-Johannes
45.
Pätsch, Johannes
46.
Pötschke, Johannes
47.
Saar, Johannes
48.
Sautter, Johannes
49.
Sinisalo, Touko Johannes
50.
Steinbrunn, Johannes
51.
Sutt, Johannes
52.
Zeiringer, Johannes Paul
53.
Taimsalu, Johannes
54.
Talu, Martin Johannes
55.
Tammekänd, Johannes
56.
Tilk, Johannes
57.
Tralla, Johannes
58.
Veerus, Johannes
59.
Vibur, Johannes Ferdinand
60.
Vind, Johannes
61.
Voll, Johannes
62.
Voltri, Johannes
name of the person
29
1.
Ubar, Raimund-Johannes, 1941-
2.
Hagelberg, Raimund, 1927-2012
3.
Räämet, Raimund, 1918-2004
4.
Aare, Johannes, 1915-2000
5.
Aavik, Johannes, 1880-1973
6.
Avik, Eduard Johannes, 1891-1942
7.
Bender, Naatan Johannes
8.
Erm, Johannes, 1998-
9.
Granö, Johannes Gabriel
10.
Hint, Johannes, 1914-1985
11.
Johannes Paulus II, paavst, 1920-2005
12.
Kert, Johannes
13.
Kiivet, Johannes, 1879-1967
14.
Kollist, Johannes
15.
Käbin, Johannes (Ivan), 1905-1999
16.
Käis, Johannes
17.
Lang, Johannes
18.
Maide, Johannes Voldemar
19.
Mossov, Johannes
20.
Pals, Johannes, 1903-1941
21.
Pello, Johannes
22.
Putk, Aksel-Johannes
23.
Rammul, Aleksander Johannes, 1875-1949
24.
Steinbrunn, Johannes
25.
Taimsalu, Johannes, 1891-1942
26.
Talu, Martin Johannes
27.
Veerus, Johannes Voldemar, 1897-1972
28.
Veski, Johannes Voldemar, 1873-1968
29.
Voll, Johannes
subject term
1
1.
Johannes Mittus, vasevalamise tööstus
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