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Automatic GUI model generation : state of the artKull, AndresISSREW 2012 : 23rd IEEE International Symposium on Software Reliability Engineering Supplemental Proceedings : 27-30 November 2012, Dallas, Texas, USA2012 / p. 207-212 https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6405443

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52

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Automatic SoC level test path synthesis based on partial functional modelsTšertov, Anton; Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei2011 Asian Test Symposium (ATS) : New Delhi, India2011 / p. 532-538 https://ieeexplore.ieee.org/document/6114730

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53

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Automatic synthesis of asynchronous circuits from synchronous RTL descriptionsÖberg, Johnny; Plosila, Juha; Ellervee, PeeterProceedings 23rd NORCHIP Conference : Oulu, Finland, 21-22 November 20052005 / p. 200-205 : ill https://ieeexplore.ieee.org/document/1597024/keywords#keywords

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54

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Automatic system for testing of dynamic quality of PC plug-in A/D boardsPokorny, Martin; Roztocil, Jaroslav; Haasz, VladimirBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 61-62: ill

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55

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Automatic test generation system for VLSIJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 19971997 / p. 255-258

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56

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Automation of testing beyond the SoCsTšertov, Anton; Jutman, Artur; Devadze, SergeiInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis2010 / lk. 29-32 : ill

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57

journal article

Automation of the 3-phase induction motor type test place for industrial useKuusk, Leho; Laugis, JuhanBaltic electrical engineering review1998 / 1, p. 10-12

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58

book article EST / book article ENG

Bbuzz : a Bit-aware fuzzing framework for network protocol systematic reverse engineering and analysisBlumbergs, Bernhards; Vaarandi, RistoMILCOM 2017 - 2017 IEEE Military Communications Conference : Baltimore, Maryland, USA, 23-25 October 20172017 / p. 707-712 https://doi.org/10.1109/MILCOM.2017.8170785 Conference proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG

59

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Behavior of carbonate-rich fuels in AFBC and PFBC conditionsOts, Arvo; Arro, Hendrik; Pihu, Tõnu; Prikk, ArviProceedings of the 15th International Conference on Fluidized Bed Combustion : May 16-19, 1999, Savannah, Georgia [CD-ROM]1999 / 20 p https://www.osti.gov/biblio/20006717

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60

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Behavioral level modeling of digital systems for testing purposesUbar, Raimund-Johannes42nd International Conference, Ilmenau, Germany, September 22-25, 1997. Part 11997 / p. 510-515

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61

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A benchmark suite for evaluating the efficiency of test toolsKruus, Helena; Ubar, Raimund-Johannes; Ellervee, Peeter; Gorev, Maksim; Pesonen, Vadim; Devadze, Sergei; Orasson, Elmet; Brik, Marina; Min, Mart; Annus, Paul; Kruus, Margus; Meigas, KaljuBEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia2012 / p. 85-88 : ill

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62

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BIST analyzer : a training platform for SoC testing [Electronic resource]Jutman, Artur; Tšertov, Anton; Tšepurov, Anton; Aleksejev, Igor; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich37th Annual Frontiers in Education Conference : Global Engineering : Knowledge Without Borders, Opportunities Without Passports : Milwaukee, Wisconsin, October 10-13, 20072007 / p. S3H-8-S3H-13 : ill. [CD-ROM] http://dx.doi.org/10.1109/FIE.2007.4418125

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63

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A BIST scheme for testing mixed analogue and digital circuitsRobson, Malcolm; Russel, GordonBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 183-186: ill

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64

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Built-in self diagnosis with multiple signature analyzers in digital systemsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico2008 / p. 29-34 : ill

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65

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A CAD system for teaching digital testUbar, Raimund-Johannes; Ivask, Eero; Paomets, Priidu; Raik, JaanBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 369-372: ill

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66

journal article EST / journal article ENG

Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDsJürimägi, Lembit; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanMicroprocessors and microsystems2020 / art. 103117, 12 p https://doi.org/10.1016/j.micpro.2020.103117 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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67

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Calculation of testability measures on structurally synthesized binary decision diagramsUbar, Raimund-Johannes; Heinlaid, J.; Raik, Jaan; Raun, L.BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 179-182: ill

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68

journal article

Case study in testing digital systemsUbar, Raimund-JohannesBaltic electronics1995 / 1, p. 24-27

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69

book article

Case study-based performance evaluation of reactive planning testerKull, Andres; Raiend, Kullo; Vain, Jüri; Kääramees, MarkoModel-based Testing in Practice : 2nd Workshop on Model-based Testing in Practice(MoTiP 2009) : Enschede, The Netherlands, June 23, 2009 : proceedings2009 / p. 87-96 : ill https://www.etis.ee/Portal/Publications/Display/c507fc75-771f-419a-bf67-571af65fdb66

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70

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Circular production, designing, and mechanical testing of polypropylene-based reinforced composite materials : statistical analysis for potential automotive and nuclear applicationsHussain, Abrar; Podgurski, Vitali; Goljandin, Dmitri; Antonov, Maksim; Sergejev, Fjodor; Krasnou, IlliaPolymers2023 / art. 3410, 30 p. : ill https://doi.org/10.3390/polym15163410 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Related publications 1

Development of sustainable polypropylene based composites = Polüpropeeni baasil jätkusuutlike komposiitide arendus

71

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The class of test signals for dynamic testing of AD convertersLand, RaulThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 127-128 : ill

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A classification of epileptic spikes in the EEGLossmann, EerikTallinna Tehnikaülikooli Toimetised1994 / lk. 52-61: ill

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73

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Code coverage analysis for concurrent programming languages using high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Reinsalu, Uljana; Ubar, Raimund-JohannesProceedings of the 12th European Workshop on Dependable Computing : EWDC 2009 : Toulouse, France, May 14-15, 20092009 / [4] p. : ill https://hal.archives-ouvertes.fr/hal-00381559

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74

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Cognitive disorders in patients with chronic kidney disease : specificities of clinical assessmentPepin, Marion; Ferreira, Ana Carina; Arici, Mustafa; Bachmann, Maie; Barbieri, Michelangela; Bumblyte, Inga AruneNephrology Dialysis Transplantation2022 / p. ii23-ii32 https://doi.org/10.1093/ndt/gfab262 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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75

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Combined pseudo-exhaustive and deterministic testing of array multipliersOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 21st edition, 24th-26th May, Cluj-Napoca, Romania : proceedings2018 / 6 p. : ill https://doi.org/10.1109/AQTR.2018.8402708

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