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32926

book article

Hierarchical fault simulation for finite state machinesBrik, Marina; Raik, Jaan; Ubar, Raimund-JohannesThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 145-148 : ill

book article
32927

book article

Hierarchical fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaInternational Symposium on Signals, Circuits and Systems : SCS 2001 : July 10-11, 2001, Iasi, Romania : proceedings2001 / p. 181-184 : ill

book article
32928

book article

Hierarchical identification of NBTI-critical gates in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, MaksimLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article
32929

book article

Hierarchical identification of untestable faults in sequential circuitsRaik, Jaan; Ubar, Raimund-Johannes; Krivenko, Anna; Kruus, Margus10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 668-671 : ill http://dx.doi.org/10.1109/DSD.2007.4341539

book article
32930

book article

Hierarchical language for development of distributed algorithmsKaldma, TarmoThe 3rd Baltic Summer School on Information Technology and Systems Engineering, 1-5 August, 1995, Klaipeda : theses1995 / p. 25-28

book article
32931

book article

Hierarchical language for development of distributed algorithmsKaldma, TarmoProceedings of the Fourth Symposium on Programming Languages and Software Tools, Visegrad, Hungary, June 9-10, 19951995 / p. 195-208

book article
32932

journal article EST / journal article ENG

Hierarchical microstructures and strengthening mechanisms of nano-TiC reinforced CoCrFeMnNi high-entropy alloy composites prepared by laser powder bed fusionChen, Hongyu; Kosiba, Konrad; Lu, Twen; Yao, Ning; Liu, Yang; Wang, Yonggang; Prashanth, Konda Gokuldoss; Suryanarayana, ChallapalliJournal of Materials Science & Technology2023 / p. 245-259 : ill https://doi.org/10.1016/j.jmst.2022.06.053 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
32933

journal article EST / journal article ENG

Hierarchical nanostructures of ZnO obtained by spray pyrolysisDedova, Tatjana; Krunks, Malle; Oja Acik, Ilona; Klauson, Deniss; Volobujeva, Olga; Mere, ArvoMaterials chemistry and physics2013 / p. 69-75 : ill https://doi.org/10.1016/j.matchemphys.2013.04.026 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
32934

journal article EST / journal article ENG

Hierarchical optimization configuration strategy of synchronous condenser in high penetration wind power sending systemsSun, Zhenglong; Qiao, Jianhua; Meng, Xin; Pan, Chao; Li, Zewei; Belikov, Juri; Levron, YoashElectronics (Switzerland)2024 / art. 4359 https://doi.org/10.3390/electronics13224359 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
32935

journal article

Hierarchical physical defect reasoning in digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, Jaan; Brik, MarinaEstonian journal of engineering2011 / 3, p. 185-200

journal article
32936

book article

Hierarchical regions of interestJärv, Priit; Tammet, Tanel; Tall, Marten2018 IEEE 19th International Conference on Mobile Data Management : MDM 2018, 26–28 June 2018, Aalborg University, Denmark : proceedings2018 / p. 86-95 https://doi.org/10.1109/MDM.2018.00025

book article
32937

book article

Hierarchical temporal memory implementation on FPGA using LFSR based spatial poolerKerner, Madis; Tammemäe, KalleProceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany2017 / p. 92-95 https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553

book article
32938

book article

Hierarchical test generation based on alternative graph modelUbar, Raimund-JohannesProceedings of the Second Workshop on Hierarchical Test Generation : Microelectronics Technology Park, Duisburg, Germany, September 25-26, 19951995 / p. 18

book article
32939

journal article

Hierarchical test generation for combinational circuits with real defects coverageCibakova, Tatiana; Fischerova, Maria; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesMicroelectronics reliability2002 / p. 1141-1149 : ill https://www.sciencedirect.com/science/article/pii/S002627140200080X

journal article
32940

book article

Hierarchical test generation for complex digital systems with control and data processing partsUbar, Raimund-Johannes; Raik, Jaan"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 19991999 / p. 43-52

book article
32941

dissertation

Hierarchical test generation for digital circuits represented by Decision Diagrams : thesis on informatics and system engineeringRaik, Jaan2001 https://www.ester.ee/record=b1578107*est

dissertation
32942

book article

Hierarchical test generation for digital systemsBrik, Marina; Jervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesMixed design of integrated circuits and systems1998 / p. 131-136: ill https://link.springer.com/chapter/10.1007/978-1-4615-5651-0_20

book article
32943

book article

Hierarchical test generation for digital systems based on combining bottom-up and top-down approachesRaik, Jaan; Ubar, Raimund-JohannesWorld Multiconference on Systemics, Cybernetics and Informatics, July 12-16, 1998, Orlando, Florida : proceedings. Vol. 11998 / p. 374-381: ill

book article
32944

book article

Hierarchical test generation for finite state machinesBrik, Marina; Ubar, Raimund-JohannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 319-324: ill

book article
32945

book article

Hierarchical test generation with multi-level decision diagram modelsJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 7th IEEE North Atlantic Test Workshop, West Greenwich RI, USA, May 28-29, 19981998 / p. 26-33 https://www.academia.edu/67811738/Hierarchical_Test_Generation_with_Multi_Level_Decision_Diagram_Models?hb-g-sw=7883185

book article
32946

book article

Hierarchical test generation. SEMI show slidesUbar, Raimund-Johannes; Raik, Jaan"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 19991999 / p. 53-64

book article
32947

dissertation

Hierarchical test pattern generation and untestability identification techniques for synchronous sequential circuits = Hierarhilised testintegreerimise ja mittetestitavuse identifitseerimise meetodid sünkroonsetele järjestikskeemideleRannaste, Anna2010 https://www.ester.ee/record=b2637391*est

dissertation
32948

book article

Hierarchical test synthesis for digital systems using alternative graph modelUbar, Raimund-JohannesQuantitative aspects of designing and validating dependable computing systems1995

book article
32949

book article

Hierarchical timing-critical paths analysis in sequential circuitsJürimägi, Lembit; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan; Devadze, Sergei; Kostin, Sergei2018 IEEE 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS 2018) : 2 – 4 July 2018, Spain2018 / 6 p. : ill https://doi.org/10.1109/PATMOS.2018.8464176

book article
32950

dissertation

Hierarchically structured functional ceramic composites with graphene augmented nanofibers = Hierarhiliselt struktureeritud funktsionaalsed keraamilised komposiidid grafeenlisandiga nanokiududegaSaffarshamshirgar, Ali2021 https://www.ester.ee/record=b5453046*est https://digikogu.taltech.ee/et/Item/13881820-10e9-4116-bf2c-440a4c2f7b9b https://doi.org/10.23658/taltech.42/2021

dissertation

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