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Active redundancy in isolated DC-DC converters: A modular solution for fault toleranceShirodkar, Aditya; Banavath, Satish Naik; Yadav, Neelesh; Chub, Andrii; Mandrioli, Riccardo2025 IEEE 19th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG)2025 / 5 p https://doi.org/10.1109/CPE-POWERENG63314.2025.11027280

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Akende vale paigaldus võib rikkuda uutesse akendesse tehtud investeeringuMartin, Anni; Talvik, Martindelfi.ee2025 Akende vale paigaldus võib rikkuda uutesse akendesse tehtud investeeringu https://kliimaministeerium.ee/buildest/tehnilised-lahendused

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Analysis of broken rotor bar diagnostic techniques for inverter fed induction motor faultsSardar, Muhammad Usman22nd International Symposium “Topical Problems in the Field of Electrical and Power Engineering”. Doctoral School of Energy and Geotechnology III : Pärnu, Estonia, August 23-26, 20232023 / p. 39-40 : ill https://www.ester.ee/record=b5570906*est

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Analysis of common mode and rapidly varying voltage profile on stator current harmonics of an inverter-fed induction motorSardar, Muhammad Usman; Vaimann, Toomas; Kütt, Lauri; Kallaste, Ants; Asad, Bilal; Kudelina, Karolina; Akbar, Siddique2023 IEEE 64th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), Riga, Latvia, October 9-10, 2023 : conference proceedings2023 / 6 p. : ill https://doi.org/10.1109/RTUCON60080.2023.10413067

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Artificial intelligence in monitoring and diagnostics of electrical energy conversion systemsVaimann, Toomas; Rassõlkin, Anton; Kallaste, Ants; Pomarnacki, Raimondas; Belahcen, Anouar; Van Khang, Hyunh2020 27th International Workshop on Electric Drives: MPEI Department of Electric Drives 90th Anniversary (IWED), Moscow, Russia, January 27-30, 20202020 / 4 p https://doi.org/10.1109/IWED48848.2020.9069566

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Assessment of along-normal uncertainties for application to terrestrial laser scanning surveys of engineering structuresMill, Tarvo; Ellmann, ArtuSurvey review2019 / p. 1-16 : ill https://doi.org/10.1080/00396265.2017.1361565 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Automated design error debug using high-level decision diagrams and mutation operatorsRaik, Jaan; Repinski, Urmas; Tšepurov, Anton; Hantson, Hanno; Ubar, Raimund-Johannes; Jenihhin, MaksimMicroprocessors and microsystems2013 / p. 505-513 : ill https://doi.org/10.1016/j.micpro.2012.11.004 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Automated design error localization in RTL designsJenihhin, Maksim; Tšepurov, Anton; Tihhomirov, Valentin; Raik, Jaan; Hantson, Hanno; Ubar, Raimund-Johannes; Bartsch, Günter; Meza Escobar, Jorge Hernan; Wuttke, Heinz-DietrichIEEE design & test of computers2014 / p. 83-92 : ill https://doi.org/10.1109/MDAT.2013.2271420 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Automated fault diagnosis for an autonomous underwater vehicleDearden, Richard; Ernits, Juhan-PeepIEEE journal of oceanic engineering2013 / p. 484-499 : ill https://doi.org/10.1109/JOE.2012.2227540 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Automatic diagnosis of simple design errorsUbar, Raimund-Johannes; Borrione, DominiqueTIMA annual report 19981999 / p. 97-98

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Automatic diagnosis of simple design errorsUbar, Raimund-Johannes; Borrione, DominiqueTechniques of Informatics and Microelectronics for Computer Architecture1999 / p. 91

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Bearing fault analysis of BLDC motor for electric scooter applicationKudelina, Karolina; Asad, Bilal; Vaimann, Toomas; Belahcen, Anouar; Rassõlkin, Anton; Kallaste, Ants; Lukichev, DmitryDesigns2020 / art. 42, 18 p. : ill https://doi.org/10.3390/designs4040042 Journal metrics at Scopus Article at Scopus

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Biasing error correction in averaging current-mode rectifiersMännama, Vello; Wilson, BrettProceedings of the Estonian Academy of Sciences. Engineering2000 / 2, p. 135-143 : ill

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Block-level fault model-free debug and diagnosis in digital systemsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings of the 12th EUROMICRO Conference on Digital System Design, Architectures, Methods and Tools : Patras, Greece, August 27-29, 20092009 / p. 229-232 https://ieeexplore.ieee.org/document/5350128

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Boolean fault dignosis with structurally synthesized BDDsUbar, Raimund-JohannesRecent progress in the Boolean domain2014 / p. 303-331 : ill

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Broken rotor bar fault detection using machine learning: Optimal frequency resolutionKoveshnikov, Semen; Bouharrouti, Nada El; Kudelina, Karolina; Naseer, Muhammad Usman; Vaimann, Toomas; Belahcen, Anouar2024 International Conference on Electrical Machines (ICEM)2024 / 6 p https://doi.org/10.1109/ICEM60801.2024.10700228

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Capacitor coupled voltage transformer inaccuracy effect on circuit breaker operationAsefi, Sajjad; Andreesen, Guido; Kilter, Jako; Landsberg, Mart2023 23rd International Scientific Conference on Electric Power Engineering (EPE)2023 / 5 p https://doi.org/10.1109/EPE58302.2023.10149279

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Challenges of reliability assessment and enhancement in autonomous systemsJenihhin, Maksim; Sonza Reorda, Matteo; Balakrishnan, Aneesh; Alexandrescu, Dan2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2019)2019 / 6 p https://doi.org/10.1109/DFT.2019.8875379

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Seotud publikatsioonid 1

A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks

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Combining dynamic slicing and mutation operators for ESL correctionRepinski, Urmas; Hantson, Hanno; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-JohannesProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th-June 1st, 2012, Annecy, France2012 / [6] p. : ill https://ieeexplore.ieee.org/document/6233020

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Comparative analysis of reliability for string and central inverter PV systems in accordance with the FMECADumnic, Boris; Liivik, Elizaveta; Popadic, Bane; Blaabjerg, Frede; Milicevic, Dragan; Katic, Vladimir2020 IEEE 11th International Symposium on Power Electronics for Distributed Generation Systems (PEDG), 28 Sept.-1 Oct. 2020, Dubrovnik, Croatia2020 / p. 591-596 https://doi.org/10.1109/PEDG48541.2020.9244404

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Composing graph theory and deep neural networks to evaluate SEU type soft error effectsBalakrishnan, Aneesh; Lange, Thomas; Glorieux, Maximilien; Alexandrescu, Dan; Jenihhin, Maksim9th Mediterranean Conference on Embedded Computing (MECO'2020), Budva, Montenegro, 8-11 June 20202020 https://doi.org/10.1109/MECO49872.2020.9134279

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Seotud publikatsioonid 1

A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks

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Comprehensive computations of the response of faulty cage induction machinesBelahcen, Anouar; Martinez, Javier; Vaimann, ToomasProceedings of the 2014 International Conference on Electrical Machines (ICEM)2014 / p. 1504-1509 : ill

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Condition monitoring of a Cartesian robot with a mechanically damaged gear to create a fuzzy logic control and diagnosis algorithmAutsou, Siarhei; Kudelina, Karolina; Vaimann, Toomas; Rassõlkin, Anton; Kallaste, AntsApplied sciences2024 / art. 4241 https://doi.org/10.3390/app14104241 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Seotud publikatsioonid 1

Fault tolerant control and diagnosis strategies for cartesian industrial robot motion control planning system = Tõrketaluvusega juhtimis- ja diagnostikastrateegiad tööstusliku karteesianroboti liikumise planeerimise juhtimissüsteemi jaoks

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Defects, faults and fault modelsGramatova, Elena; Fisherova, Maria; Ubar, Raimund-Johannes; Pleskacz, Witold A.Handbook of testing electronic systems2005 / p. 26-96 : ill

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DefSim: a remote laboratory for studying physical defects in CMOS digital circuitsPleskacz, Witold A.; Stopjakova, Viera; Borejko, Tomasz; Jutman, Artur; Walkanis, AndrzejIEEE transactions on industrial electronics2008 / 6, p. 2405-2415 : ill https://www.researchgate.net/publication/3219964_DefSim_A_Remote_Laboratory_for_Studying_Physical_Defects_in_CMOS_Digital_Circuits

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