Otsing - TalTech teadusportaal

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reasta

651

artikkel kogumikus

"Tervis ruudus", ehk, Tippkeskuse CEBE luguUbar, Raimund-JohannesTeadusmõte Eestis (X). Tehnikateadused. 3 : [artiklikogumik]2019 / lk. 200-215 : ill., fot https://www.ester.ee/record=b5208765*est

artikkel kogumikus

652

artikkel kogumikus

Test configurations for diagnosing faulty links in NoC switchesRaik, Jaan; Ubar, Raimund-Johannes; Govind, Vineeth12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings2007 / p. 29-34 : ill http://dx.doi.org/10.1109/ETS.2007.41

artikkel kogumikus

653

artikkel kogumikus

Test configurations for diagnosing faulty links in NoC switchesRaik, Jaan; Ubar, Raimund-Johannes; Govind, VineethInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 33-37 : ill

artikkel kogumikus

654

artikkel kogumikus

Test cost minimization for hybrid BISTJervan, Gert; Peng, Zebo; Ubar, Raimund-JohannesIEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 25-27 October 2000, Yamanashi, Japan : proceedings2000 / p. 283-298 : ill https://ieeexplore.ieee.org/abstract/document/887168

artikkel kogumikus

655

artikkel ajakirjas

Test cover calculation in digital systems with word-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaВестник Томского государственного университета2002 / с. 315-319 : ил

artikkel ajakirjas

656

artikkel kogumikus

Test generation : a hierarchical approachJervan, Gert; Ubar, Raimund-Johannes; Peng, Z.; Eles, PetruSystem-level test and validation of hardware/software systems2005 / p. 67-81 : ill

artikkel kogumikus

657

artikkel kogumikus

Test generation for digital systemsUbar, Raimund-JohannesDigest of papers - FTCS 13th Annual International Symposium on Fault-Tolerant Computing, June 28 - 30, 1983, Milano, Italy1983 / p. 374-377

artikkel kogumikus

658

artikkel kogumikus

Test generation for digital systems at functional levelUbar, Raimund-Johannes; Kuchcinski, Ktzysztof; Peng, Z.Research report LiTH-IDA-R-90-06, Linköping University, Sweden1990 / p. 1-21

artikkel kogumikus

659

artikkel kogumikus

Test generation for digital systems based on alternative graphsUbar, Raimund-JohannesDependable Computing - EDCC-1 : First European Dependable Computing Conference, Berlin, Germany, October 1994 : proceedings1994 / p. 151-164: ill

artikkel kogumikus

660

artikkel kogumikus

Test generation for finite state machinesUbar, Raimund-Johannes; Brik, MarinaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 233-236: ill

artikkel kogumikus

661

artikkel kogumikus

Test generation for microprocessor control mechanismsLohuaru, Tõnu; Ubar, Raimund-JohannesFTSD-10 : Deseta Mezdunarodnaja Konferencija "Nadezdnost i Diagnostika na ECM. Mikrokompjutri i Sistemi", Varna, Bulgaria, 1987 = 10th International Conference on Fault-Tolerant Systems and Diagnostics (1987)1987 / p. 305-311

artikkel kogumikus

662

artikkel kogumikus

Test generation for microprocessors on alternative graphsAlango, Villem; Kont, Toomas; Ubar, Raimund-Johannes33. Internationales Wissenschaftliches Kolloquium : 24.-28.10.1988. H.3 Vortragsreihe B, technische und angewandte Informatik/Computertechnik1988 / p. 11-14

artikkel kogumikus

663

artikkel kogumikus

Test generation techniques and algorithmsUbar, Raimund-Johannes; Gramatova, Elena; Fisherova, MariaHandbook of testing electronic systems2005 / p. 99-173 : ill

artikkel kogumikus

664

artikkel kogumikus

Test generation with structurally synthesized BDD modelsRaik, Jaan; Ubar, Raimund-JohannesProceedings of the 5th Electronic Devices and Systems Conference, Brno, June 11-12, 19981998 / p. 66-68

artikkel kogumikus

665

artikkel ajakirjas

Test methods for crosstalk-induced delay and glitch faults in network-on-chip interconnects implementing asynchronous communication protocolsBengtsson, Tomas; Kumar, Shashi; Ubar, Raimund-Johannes; Jutman, Artur; Peng, ZeboIET computers and digital techniques2008 / 6, p. 445-460

artikkel ajakirjas

666

artikkel kogumikus

Test pattern generation for microprocessor systems on the alternative graph modelUbar, Raimund-JohannesProceedings of the 3rd Symposium of the IMEKO Technical Committee on Technical Diagnostics (TC10), held in Moscow, October 3 - 5, 19831985 / p. 403-410

artikkel kogumikus

667

artikkel kogumikus

Test set minimization using bipartite graphsMarkus, Antti; Raik, Jaan; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 175-178: ill

artikkel kogumikus

668

artikkel ajakirjas

Test synthesis with alternative graphsUbar, Raimund-JohannesIEEE design & test of computers1996 / Spring, p. 48-57: ill

artikkel ajakirjas

669

artikkel ajakirjas

Test system for fault detection and diagnosis in microprocessor control devicesUbar, Raimund-Johannes; Lohuaru, Tõnu; Männisalu, Mati; Pukk, P.; Vanamölder, E.Tallinna Tehnikaülikooli Toimetised1990 / lk. 63-77: ill

artikkel ajakirjas

670

artikkel ajakirjas

Test time minimization for hybrid BIST of core-based systemsJervan, Gert; Eles, Petru; Peng, Zebo; Ubar, Raimund-Johannes; Jenihhin, MaksimJournal of computer science and technology2006 / 6, p. 907-912 : ill https://link.springer.com/article/10.1007/s11390-006-0907-x

artikkel ajakirjas

671

artikkel kogumikus

Test time minimization for hybrid BIST of core-based systemsJervan, Gert; Eles, Petru; Peng, Zebo; Ubar, Raimund-Johannes; Jenihhin, Maksim12th Asian Test Symposium (ATS 2003) : 17-19 November 2003, Xian, China2003 / p. 318-325 : ill https://link.springer.com/article/10.1007/s11390-006-0907-x

artikkel kogumikus

672

artikkel kogumikus

Test time minimization for hybrid BIST with test pattern broadcastingUbar, Raimund-Johannes; Jenihhin, Maksim; Jervan, Gert; Peng, ZeboIEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings2003 / p. 112-116 : ill https://www.ida.liu.se/labs/eslab/publications/pap/db/norchip03.pdf

artikkel kogumikus

673

artikkel kogumikus

Testability analysis for efficient register-transfer level test generation [Electronic resource]Nõmmeots, Tanel; Raik, Jaan; Ubar, Raimund-Johannes9th International Conference MIXDES 2002 : Mixed Design of Integrated Circuits and Systems, Wroclaw, Poland, 20-22 June 20022002 / [4] p. [CD-ROM]

artikkel kogumikus

674

artikkel kogumikus

Testability calculation for digital circuits with decision diagramsUbar, Raimund-Johannes3rd IEEE Latin American Test Workshop : LATW'02, Montevideu, Uruguay, February 10-13, 2002 : digest of papers2002 / p. 137-143 : ill

artikkel kogumikus

675

artikkel kogumikus

Testability guided hierarchical test generation with decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Nõmmeots, Tanel20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 20022002 / p. 265-271

artikkel kogumikus

Ubar, Raimund-Johannes (TTÜ autor)

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tema kohta 28

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