Otsing - TalTech teadusportaal

kuva

reasta

251

artikkel kogumikus

Hybrid BIST time minimization for core-based systems with STUMPS architectureJervan, Gert; Eles, Petru; Peng, Zebo; Ubar, Raimund-Johannes; Jenihhin, Maksim18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 3-5 November 2003, Boston, Massachusetts : proceedings2003 / p. 225-232 : ill https://ieeexplore.ieee.org/document/1250116

artikkel kogumikus

252

dissertatsioon

Hybrid built-in self-test : methods and tools for analysis and optimization of BIST = Sisseehitatud hübriidne isetestimine : meetodid ja vahendid analüüsiks ning optimeerimiseksOrasson, Elmet2007 https://www.ester.ee/record=b2305436*est

dissertatsioon

253

raamat

Hybrid built-in self-test and test generation techniques for digital systemsJervan, Gert2005 https://www.ester.ee/record=b2177537*est

raamat

254

artikkel kogumikus

Hybrid functional BIST for digital systemsMazurova, Natalja; Smahtina, Julia; Ubar, Raimund-JohannesBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 205-208 : ill

artikkel kogumikus

255

artikkel kogumikus

Hydraulic conductivity testing method for all-in aggregates and mining waste materialsŠommet, Julija; Pastarus, Jüri-Rivaldo; Sabanov, Sergei10th International Symposium "Topical Problems in the Field of Electrical and Power Engineering”. Doctoral School of Energy and Geotechnology II : Pärnu, Estonia, January 10-15, 20112011 / p. 122-126 : ill

artikkel kogumikus

256

artikkel ajakirjas

Hygrothermal calculations and laboratory tests on timber-framed wall structuresKalamees, Targo; Vinha, JuhaBuilding and environment2003 / 5, p. 689-697 : ill https://www.sciencedirect.com/science/article/pii/S036013230200207X

artikkel ajakirjas

257

artikkel kogumikus EST / artikkel kogumikus ENG

IEEE European Test Symposium (ETS)Eggersgluss, Stephan; Hamdioui, Said; Jutman, Artur; Michael, Maria K.; Raik, Jaan2019 IEEE International Test Conference (ITC)2019 / 4 p https://doi.org/10.1109/ITC44170.2019.9000148 Conference proceeding at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

258

artikkel kogumikus

Impact wear tester for the s[t]udy of abrasive erosion and milling processesTarbe, Riho; Kulu, PriitProceedings of the 6th International Conference of DAAAM Baltic "Industrial Engineering" : 24-26th April 2008, Tallinn, Estonia. [2]2008 / p. 561-566 : ill http://innomet.ttu.ee/daaam08/online/Materials%20Engineering/Tarbe-rev.pdf

artikkel kogumikus

259

artikkel kogumikus

Implementation-independent functional test for transition delay faults in microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia2020 / p. 646-650 https://doi.org/10.1109/DSD51259.2020.00105

artikkel kogumikus

260

artikkel kogumikus

Implementation-independent functional test generation for RISC microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]2019 / p. 82-87 : ill https://doi.org/10.1109/VLSI-SoC.2019.8920323

artikkel kogumikus

261

artikkel kogumikus

An improved estimation methodology for hybrid BIST cost calculationJervan, Gert; Peng, Zebo; Ubar, Raimund-Johannes; Korelina, OlgaProceedings [of] 22nd NORCHIP Conference : Oslo, Norway, 8-9 November 20042004 / p. 297-300 : ill https://ieeexplore.ieee.org/document/1423882

artikkel kogumikus

262

artikkel kogumikus

Improved modeling of audio signals by modifying transient locationsVafin, Renat; Heusdens, Richard; Par, Steven van de; Kleijn, W. BastiaanProceedings of the 2001 IEEE Workshop on Applications of Signal Processing to Audio and Acoustics : October 21-24,2001, Mohonk Mountain House, New Paltz, New York, USA2001 / p. 143-143 : ill https://ieeexplore.ieee.org/document/969563

artikkel kogumikus

263

artikkel kogumikus

Improving embedded software testingSavimaa, RaulSCI 2004 : the 8th World Multi-Conference on Systemics, Cybernetics and Informatics : July 18-21, 2004, Orlando, Florida, USA. Volume 1, Information Systems, Technologies and Applications : proceedings2004 / p. 270-274

artikkel kogumikus

264

artikkel kogumikus EST / artikkel kogumikus ENG

Inductive and coinductive predicate liftings for effectful programsVeltri, Niccolò; Voorneveld, Niels F.W.Proceedings 37th Conference on Mathematical Foundations of Programming SemanticsHybrid: Salzburg, Austria and Online, 30th August - 2nd September, 20212021 / p. 260-277 https://doi.org/10.4204/EPTCS.351.16 Conference proceeding at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

265

artikkel kogumikus

Instrument-free Lab-on-a-Chip DNA amplification test for pathogen detection [Online resource]Pardy, Tamas; Rang, Toomas; Kremer, Clemens; Tulp, IndrekBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p. : ill https://doi.org/10.1109/BEC.2018.8600991

artikkel kogumikus

266

artikkel kogumikus

Integrated design and test generation under Internet based environment MOSCITOSchneider, Andre; Ivask, Eero; Ubar, Raimund-JohannesEuromicro Symposium on Digital System Design : Architectures, Methods and Tools : September 4-6, 2002, Dortmund, Germany : proceedings2002 / p. 187-194 : ill http://dx.doi.org/10.1109/DSD.2002.1115368

artikkel kogumikus

267

artikkel ajakirjas EST / artikkel ajakirjas ENG

Integrated self-regulating resistive heating for isothermal nucleic acid amplification tests (NAAT) in Lab-on-a-Chip (LoC) devicesPardy, Tamas; Tulp, Indrek; Kremer, Clemens; Rang, Toomas; Stewart, RayPLoS ONE2017 / p. 1-11 : ill https://doi.org/10.1371/journal.pone.0189968 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

268

raamat

Intelligent support for expert system verification and testing in object-oriented programming environments : (preprint)Trausan-Matu, S.; Tepandi, Jaak; Barbuceanu, M.1990

raamat

269

artikkel kogumikus

Interaction coefficient for resistance to fragmentation by GOST and EN test resultsKoreneva, Julia; Šommet, JulijaRoad and Rail Infrastructure V : proceedings of the 5th International Conference on Road and Rail Infrastructures – CETRA 2018, 17-19 May 2018, Zadar, Croatia2018 / p. 207–214 https://doi.org/10.5592/CO/cetra.2018.896

artikkel kogumikus

270

artikkel kogumikus

Internet based test generation and fault simulationIvask, Eero; Ubar, Raimund-Johannes; Raik, Jaan; Schneider, AndreIEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 20012001 / p. 57-60 : ill

artikkel kogumikus

271

artikkel kogumikus

Internet-based collaborative test generation with MOSCITO [Electronic resource]Schneider, Andre; Ivask, Eero; Miklos, P.; Raik, Jaan; Diener, Karl-Heinz; Ubar, Raimund-Johannes; Cibakova, Tatiana; Gramatova, ElenaSIGDA publications on CD-ROM : DATE'02 : Design, Automation and Test in Europe, Paris, France, March 4-8, 20022002 / [6] p. [CD-ROM] https://www.cecs.uci.edu/~papers/date07/PAPERS/2002/DATE02/PDFFILES/02E_2.PDF

artikkel kogumikus

272

artikkel kogumikus

Internet-based software for teaching test of digital circuitsUbar, Raimund-Johannes; Orasson, Elmet; Wuttke, Heinz-Dietrich23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 22002 / p. 659-662 : ill https://ieeexplore.ieee.org/document/1003344

artikkel kogumikus

273

artikkel kogumikus

Internet-based software for teaching test of digital circuitsUbar, Raimund-Johannes; Jutman, Artur; Orasson, Elmet; Raik, Jaan; Evartson, Teet; Wuttke, Heinz-DietrichMicroelectronics education : proceedings of the 4th European Workshop on Microelectronics Education : EWME 2002, Spain, May 23-24, 20022002 / p. 317-320 : ill https://ieeexplore.ieee.org/document/1003344

artikkel kogumikus

274

artikkel kogumikus

Internet-based testability-driven test generation in the virtual environment MOSCITOSchneider, Andre; Diener, Karl-Heinz; Elst, G.; Ivask, Eero; Raik, Jaan; Ubar, Raimund-JohannesInternational Federation for Information Processing IFIP : International Workshop on IP-Based SoC Design 2002 : proceedings : Grenoble, October 30-31, 20022002 / p. 357-362 : ill http://publica.fraunhofer.de/dokumente/N-287433.html

artikkel kogumikus

275

artikkel ajakirjas

ISS seminar disaini verifitseerimisest ja testimise automatiseerimisestTammemäe, KalleArvutustehnika ja Andmetöötlus1997 / 7/8, lk. 47-52

artikkel ajakirjas

testimine (märksõna)

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