Otsing - TalTech teadusportaal

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201

artikkel ajakirjas

Evaluation of some mechanical and physical properties of ‘Oriented Strand Board (OSB/3)’ following cyclic accelerated aging testsLille, Harri; Kiviste, Mihkel; Telling, Renar; Leppik, Taimo; Virro, Indrek; Kask, ReginoEuropean journal of wood and wood products2022 / p. 731–740 https://doi.org/10.1007/s00107-022-01803-9

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202

artikkel ajakirjas

Evaluation of VRLA battery under overcharging : model for battery testingTenno, Ander; Tenno, Robert; Suntio, TeuvoJournal of power sources2002 / p. 65-82 https://www.sciencedirect.com/science/article/pii/S0378775302002768

artikkel ajakirjas

203

artikkel kogumikus

Evolutionary approach to the functional test generation for digital circuitsSkobtsov, Y.A.; Ivanov, D.E.; Skobtsov, V.Y.; Ubar, Raimund-JohannesBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 229-232 : ill

artikkel kogumikus

204

artikkel kogumikus

Exact static compaction of independent test sequencesRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 315-318 : ill

artikkel kogumikus

205

artikkel kogumikus

Executable black-box tester model synthesis from a non-deterministic EFSM of the systemKull, Andres; Raiend, Kullo; Vain, JüriInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 105-108

artikkel kogumikus

206

artikkel kogumikus

Experiences of lexicographers and computer scientists in validating Estonian Wordnet with test patternsLohk, Ahti; Orav, Heili; Vare, Kadri; Võhandu, LeoProceedings of the Eighth Global WordNet Conference : Bucharest, Romania, January 27-30, 20162016 / p. 184-191 : ill http://gwc2016.racai.ro/

artikkel kogumikus

207

artikkel kogumikus

Experiences with steady-state PMU compliance testing using standard relay testing equipmentAlmas, Muhammad Shoaib; Kilter, Jako; Vanfretti, LuigiPQ2014 : the 9th International 2014 Electric Power Quality and Supply Reliability Conference (PQ) : June 11-13, 2014, Rakvere, Estonia : proceedings2014 / p. 103-110 : ill

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208

artikkel kogumikus

Experimental comparison of different diagnosis algorithms in the BIST environmentUbar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan; Kruus, MargusProceedings of the 16th IASTED International Conference on Applied Simulation and Modelling : August 29-31, 2007, Palma de Mallorca, Spain2007 / p. 271-276 : ill https://www.researchgate.net/publication/262275431_Experimental_comparison_of_different_diagnosis_algorithms_in_the_BIST_environment

artikkel kogumikus

209

artikkel kogumikus

Experimental determination of equivalent circuit parameters for a synchronous generatorNaseer, Muhammad Usman; Asad, Bilal; Ghahfarokhi, Payam Shams; Kallaste, Ants; Vaimann, Toomas; Rassõlkin, Anton2021 IEEE Open Conference of Electrical, Electronic and Information Sciences (eStream): proceedings of the conference, April 22, 2021, Vilnius, Lithuania2021 / 7 p. : ill https://doi.org/10.1109/eStream53087.2021.9431442

artikkel kogumikus

210

artikkel ajakirjas

Experimental determination of sound transmission in turbo-compressors : SAE Tech. paper no.2009-01-2045Rämmal, Hans; Abom, MatsSAE Technical Papers2009 / [7] p https://www.diva-portal.org/smash/record.jsf?pid=diva2%3A750030&dswid=-9882

artikkel ajakirjas

211

artikkel kogumikus

Experimental study on the influence of process variable on the performance of a horizontal belt filterHäkkinen, Antti; Huhtanen, Mikko; Ekberg, Bjarne; Kallas, JuhaFILTECH 2009, Wiesbaden, October 13-15, 20092009 / ? p https://www.researchgate.net/publication/289851256_Experimental_study_of_the_influence_of_process_variables_on_the_performance_of_a_horizontal_belt_filter

artikkel kogumikus

212

artikkel kogumikus EST / artikkel kogumikus ENG

Experimental testing of exterior wall mounted mechanical ventilation exhaust air outlet devicesPalmiste, Ülar; Meier, Tauno; Kurnitski, Jarek; Voll, HendrikE3S Web Conference: Cold Climate HVAC and Energy 20212021 / art. 02001, 8 p. : ill https://doi.org/10.1051/e3sconf/202124602001 Conference Proceedings at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

213

artikkel kogumikus

Exploiting aspects in model-based testingSarna, Külli; Vain, JüriFOAL'12 : proceedings of the eleventh workshop on Foundations of Aspect-Oriented Languages : March 26, 2012, Potsdam, German2012 / p. 45-47 : ill https://www.researchgate.net/publication/254007794_Exploiting_aspects_in_model-based_testing

artikkel kogumikus

214

artikkel kogumikus

An external diagnosis method for network-on-a-chipRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesIEEE/ACM Design Automation and Test in Europe, Workshop on Diagnostic Services in Networks-on-Chips - Test, Debug and On-line Monitoring : April 16-20, 2007, Nice, France2007 / [2] p. : ill

artikkel kogumikus

215

artikkel kogumikus

Fast and efficient static compaction of test sequences based on greedy algorithmsRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesIEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 20012001 / p. 117-122 https://slideplayer.com/slide/9971880/#google_vignette

artikkel kogumikus

216

artikkel kogumikus

Fast and efficient static compaction of test sequences using bipartite graph representationsMarkus, Antti; Raik, Jaan; Ubar, Raimund-JohannesECS'99 : proceedings of the 2nd Electronic Circuits and Systems Conference : September 6-8, 1999, Bratislava, Slovakia1999 / p. 17-20

artikkel kogumikus

217

artikkel kogumikus

Fast extended test access via JTAG and FPGAsDevadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund-JohannesInternational Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings2009 / p. 1-7 : ill http://dx.doi.org/10.1109/TEST.2009.5355668

artikkel kogumikus

218

artikkel kogumikus

Fast fault emulation for synchronous sequential circuitsRaik, Jaan; Ellervee, Peeter; Tihhomirov, Valentin; Ubar, Raimund-JohannesProceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 20042004 / p. 35-40 https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=a6eb712498a5f23db3f95ad66bada257c21e96f0

artikkel kogumikus

219

artikkel ajakirjas EST / artikkel ajakirjas ENG

Fast identification of true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, Jaan; Jürimägi, LembitMicroelectronics reliability2018 / p. 252-261 : ill https://doi.org/10.1016/j.microrel.2017.11.027 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

220

artikkel kogumikus

Fast static compaction of test sequences using implications and greedy searchRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesETW 2001 : IEEE European Test Workshop : Stockholm, May 29 June 1, 2001 : informal digest2001 / p. 207-209 : ill https://www.semanticscholar.org/paper/Fast-Static-Compaction-of-Test-Sequences-using-and-Raik-Jutman/3a7a8ddda6e63d3e2fde0c8650d4518851746221

artikkel kogumikus

221

artikkel kogumikus

Fast static compaction of tests composed of independent sequences : basic properties and comparison of methodsRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesThe 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume II2002 / p. 445-448 : ill http://dx.doi.org/10.1109/ICECS.2002.1046190 https://ieeexplore.ieee.org/document/1046190

artikkel kogumikus

222

artikkel kogumikus

Fast test cost calculation for hybrid BIST in digital systemsOrasson, Elmet; Raidma, Rein; Ubar, Raimund-Johannes; Jervan, Gert; Peng, ZeboEuromicro Symposium on Digital Systems Design : [Architectures, Methods and Tools : DSD 2001] : September 4-6, 2001, Warsaw, Poland : proceedings2001 / p. 318-325 : ill https://www.semanticscholar.org/paper/Fast-test-cost-calculation-for-hybrid-BIST-in-Orasson-Raidma/5aafcda5a18c2aabf0ad20cac10af10727f3c58f

artikkel kogumikus

223

artikkel ajakirjas

Fast test pattern generation for sequential circuits using decision diagram representationsRaik, Jaan; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications (JETTA)2000 / 3, p. 213-226 : ill https://link.springer.com/article/10.1023/A:1008335130158

artikkel ajakirjas

224

artikkel kogumikus

Fault collapsing with linear complexity in digital circuitsUbar, Raimund-Johannes; Mironov, Dmitri; Raik, Jaan; Jutman, ArturProceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010, Paris, France2010 / p. 653-656 : ill https://ieeexplore.ieee.org/document/5537504

artikkel kogumikus

225

artikkel kogumikus

Fault diagnosis in the BIST environment based on bisection of detected faultsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanLATW2007 : 8th IEEE Latin-American Test Workshop : March 11-14, 2007, Cuzco, Peru2007 / [6] p. : ill

artikkel kogumikus

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