Otsing - TalTech teadusportaal

kuva

reasta

76

artikkel ajakirjas EST / artikkel ajakirjas ENG

Cognitive disorders in patients with chronic kidney disease : specificities of clinical assessmentPepin, Marion; Ferreira, Ana Carina; Arici, Mustafa; Bachmann, Maie; Barbieri, Michelangela; Bumblyte, Inga AruneNephrology Dialysis Transplantation2022 / p. ii23-ii32 https://doi.org/10.1093/ndt/gfab262 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

77

artikkel kogumikus

Combined pseudo-exhaustive and deterministic testing of array multipliersOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 21st edition, 24th-26th May, Cluj-Napoca, Romania : proceedings2018 / 6 p. : ill https://doi.org/10.1109/AQTR.2018.8402708

artikkel kogumikus

78

artikkel kogumikus

Combining dynamic slicing and mutation operators for ESL correctionRepinski, Urmas; Hantson, Hanno; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-JohannesProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th-June 1st, 2012, Annecy, France2012 / [6] p. : ill https://ieeexplore.ieee.org/document/6233020

artikkel kogumikus

79

artikkel ajakirjas

Combining functional and structural approaches in test generation for digital systemsUbar, Raimund-JohannesMicroelectronics reliability1998 / 3, p. 317-329 : ill

artikkel ajakirjas

80

artikkel kogumikus

Combining learning, training and research in laboratory course for design and testUbar, Raimund-Johannes; Orasson, Elmet; Raik, Jaan; Wuttke, Heinz-DietrichThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 221-224 : ill https://www.researchgate.net/publication/242397131_Combining_Learning_Training_and_Research_in_Laboratory_Course_for_Design_and_Test

artikkel kogumikus

81

artikkel kogumikus

Combining symbolic techniques with topological approach in test generationUbar, Raimund-JohannesProceedings of the 3rd Workshop on Mixed Design of Integrated Circuits and Systems, Lodz, May 19961996 / p. 377-382

artikkel kogumikus

82

artikkel kogumikus

Compaction of decision diagrams for describing multi-process VHDL descriptionsLeveugle, R.; Saucier, Gabriele; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 195-198: ill

artikkel kogumikus

83

artikkel kogumikus

Comparative analysis of sequential circuit test generation approachesRaik, Jaan; Krivenko, Anna; Ubar, Raimund-JohannesBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 225-228 : ill

artikkel kogumikus

84

artikkel kogumikus

Comparative mixed-signal test method and toolsetMellik, Andres; Raik, JaanIEEE International Workshop on Open Source Test Technology Tools (IOST3)2007 / ? p

artikkel kogumikus

85

artikkel kogumikus

Comparative mixed-signal test method and toolsetMellik, AndresInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 153-154 : ill

artikkel kogumikus

86

artikkel kogumikus

Comparison of different soil compaction test methods [Electronic resource]Aavik, Andrus26th International Baltic Road Conference : Kuressaare, 28-30 August, 20062006

artikkel kogumikus

87

artikkel kogumikus

Comparison of genetic and random techniques for test pattern generationIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 163-166: ill

artikkel kogumikus

88

artikkel kogumikus

Compliance testing concept of grid-connected inverter-based resources using simulated inputDvoracek, Jiri; Drapela, Jiri; Moravek, Jan; Vojtek, Martin; Toman, Petr; Rassõlkin, Anton; Vaimann, Toomas2023 23rd International Scientific Conference on Electric Power Engineering (EPE)2023 / p. 1-6 https://doi.org/10.1109/EPE58302.2023.10149232

artikkel kogumikus

89

artikkel kogumikus

A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoCAppello, D.; Bernardi, P.; Giacopelli, G.; Ruberg, PriitProceedings of the 2017 Design, Automation & Test in Europe (DATE) : 27-31 March 2017, Swisstech, Lausanne, Switzerland2017 / p. 646-649 : ill https://doi.org/10.23919/DATE.2017.7927068

artikkel kogumikus

90

artikkel ajakirjas EST / artikkel ajakirjas ENG

Concept drift and cross-device behavior : challenges and implications for effective android malware detectionGuerra Manzanares, Alejandro; Luckner, Marcin; Bahsi, HayretdinComputers & Security2022 / art. 102757, 20 p. : ill https://doi.org/10.1016/j.cose.2022.102757 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

Seotud publikatsioonid 1

Machine learning-based detection and characterization of evolving threats in mobile and IoT Systems = Masinõppepõhine arenevate ohtude tuvastamine ning kirjeldamine mobiilseadmete ja värkvõrkude jaoks

91

artikkel kogumikus

Conceptual test bench for small class unmanned autonomous vehicle performance estimationPütsep, Kristjan; Rassõlkin, Anton; Vaimann, Toomas2021 IEEE 19th International Power Electronics and Motion Control Conference, The Silesian University of Technology Gliwice, Poland, 25 - 29 April, 2021 (PEMC) : proceedings2021 / p. 695-698 : ill https://doi.org/10.1109/PEMC48073.2021.9432509

artikkel kogumikus

92

artikkel kogumikus

Condition assessment of power plant components operating under creep by testing of miniature specimensKlevtsov, Ivan; Dedov, AndreiCreep and Fracture in High Temperature Components : April 21-23, 2009, Zurich, Swizerland2009 / p. 1126-1137

artikkel kogumikus

93

artikkel kogumikus

Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]Jürimägi, Lembit; Ubar, Raimund-JohannesBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p. : ill https://doi.org/10.1109/BEC.2018.8600967

artikkel kogumikus

94

artikkel kogumikus

Constraint-based heuristic on-line test generation from non-deterministic I/O EFSMsAhman, Danel; Kääramees, MarkoEPTCS 80 : proceedings of the 7th Workshop on Model-Based Testing : Tallinn, Estonia, 25 March 20122012 / p. 115-129 : ill https://www.semanticscholar.org/paper/Constraint-Based-Heuristic-On-line-Test-Generation-Ahman-K%C3%A4%C3%A4ramees/c798ef6753277479b79652be2a5921a1db94c74c

artikkel kogumikus

95

artikkel kogumikus

Constraint-based hierarchical untestability identification for synchronous sequential circuitsRaik, Jaan; Rannaste, Anna; Jenihhin, Maksim; Viilukas, Taavi; Ubar, Raimund-Johannes; Fujiwara, HideoSixteenth IEEE European Test Symposium : 23-27 May 2011, Trondheim2011 / p. 147-152

artikkel kogumikus

96

artikkel kogumikus

Constraint-based hierarchical untestability identification for syncronous sequential circuitsViilukas, Taavi; Raik, Jaan; Ubar, Raimund-Johannes; Rannaste, Anna; Jenihhin, Maksim; Fujiwara, HideoInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve2011 / p. 139-142 : ill

artikkel kogumikus

97

artikkel kogumikus

Constraint-based test pattern generation at the register-transfer levelViilukas, Taavi; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-Johannes; Krivenko, AnnaProceedings of the 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 14-16, 2010, Vienna, Austria2010 / p. 352-357 : ill http://dx.doi.org/10.1109/DDECS.2010.5491752

artikkel kogumikus

98

artikkel kogumikus

Constraint-based test scenario description languageVain, Jüri; Halling, EvelinBEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia2012 / p. 89-92 : ill

artikkel kogumikus

99

artikkel kogumikus

A constraint-driven gate-level test generatorRaik, Jaan; Ubar, Raimund-Johannes; Jervan, Gert; Krupnova, HelenaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 237-240: ill

artikkel kogumikus

100

artikkel kogumikus

Constraints analysis in hierarchical test generation for digital systemsUbar, Raimund-Johannes; Krupnova, HelenaBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 313-318: ill

artikkel kogumikus

testimine (märksõna)

teaviku laadid

märksõna 1

võtmesõna 1