Otsing - TalTech teadusportaal

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101

dissertatsioon

Constraints solving based hierarchical test generation for synchronous sequential circuits = Kitsenduste lahendamisel baseeruv hierarhiline testigenereerimine sünkroonsetele järjestikskeemideleViilukas, Taavi2012 https://www.ester.ee/record=b2888278*est

dissertatsioon

102

artikkel kogumikus

Construction of aspect models for model-based testingSarna, Külli; Vain, JüriInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve2011 / p. 67-70 : ill

artikkel kogumikus

103

artikkel ajakirjas

Construction of the tests of combinational circuit failures by analyzing the orthogonal disjunctive normal forms represented by the alternative graphsMatrosova, A.Yu.; Pleshkov, A.G.; Ubar, Raimund-JohannesAutomation and remote control2005 / p. 313-327 : ill https://doi.org/10.1007/s10513-005-0054-9

artikkel ajakirjas

104

artikkel kogumikus EST / artikkel kogumikus ENG

Contributions to ventilation system demand response: a case study of an educational buildingMaask, Vahur; Mikola, Alo; Korõtko, Tarmo; Rosin, Argo; Thalfeldt, MartinE3S Web Conference: Cold Climate HVAC and Energy 20212021 / art. 11001, 6 p https://doi.org/10.1051/e3sconf/202124611001 Conference Proceedings at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

Seotud publikatsioonid 1

Research and development of explicit demand flexibility management methods for ventilation systems = Ventilatsioonisüsteemidele otsese energiapaindlikkuse juhtimismeetodite uurimine ja arendamine

105

artikkel ajakirjas

Correlation between COVID-19 cases and gold price fluctuationGautam, Roshan; Kim, Yoochan; Topal, Erkan; Hitch, Michael WilliamInternational journal of mining, reclamation and environment2022 / p. 574-586 https://doi.org/10.1080/17480930.2022.2077542

artikkel ajakirjas

106

artikkel kogumikus

Corrosion of cement and concrete - methods of testing and evaluationRaado, Lembi-Merike; Hain, TiinaManagement of Durability in the Building Process : International Workshop : Milan, 25-26 June 2003 : proceedings2003 / [7] p. : ill

artikkel kogumikus

107

artikkel kogumikus

Cybersecurity test range for autonomous vehicle shuttlesRoberts, Andrew James; Snetkov, Nikita; Maennel, Olaf Manuel2021 IEEE European Symposium on Security and Privacy Workshops EuroS&PW 2021 : Virtual Conference, 6-10 September 2021 : proceedings2021 / p. 239-248 : ill https://doi.org/10.1109/EuroSPW54576.2021.00031

artikkel kogumikus

Seotud publikatsioonid 1

Cybersecurity testing and attack propagation analysis of autonomous driving software = Autonoomse sõiduki juhtimistarkvara küberturvalisuse testimine ja rünnakute leviku analüüs

108

dissertatsioon

Cybersecurity testing and attack propagation analysis of autonomous driving software = Autonoomse sõiduki juhtimistarkvara küberturvalisuse testimine ja rünnakute leviku analüüsRoberts, Andrew James2025 https://www.ester.ee/record=b5750527*est https://digikogu.taltech.ee/et/Item/fbecd0b1-252c-4a7d-b06c-588683fd4640 https://doi.org/10.23658/taltech.41/2025

dissertatsioon

Seotud publikatsioonid 10

109

artikkel kogumikus

DACA : automated attack scenarios and dataset generationKorving, Frank; Vaarandi, RistoProceedings of the 18th International Conference on Cyber Warfare and Security, ICCWS 2023, a conference hosted by Towson University, Baltimore County, Maryland, USA, 9-10 March 20232023 / p. 550-559 : ill https://papers.academic-conferences.org/index.php/iccws/article/download/962/938 https://doi.org/10.34190/iccws.18.1.962

artikkel kogumikus

110

artikkel kogumikus

DECIDER : a decision diagram based hierarchical test generation systemJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 2nd International Workshop on Design and Diagnostics of Electronic Circuits and Systems, Szczyrk, Poland, September 2-4, 19981998 / p. 269-273 https://www.ida.liu.se/labs/eslab/publications/pap/db/DDECS98.pdf

artikkel kogumikus

111

artikkel ajakirjas

DECIDER : a system for hierarchical test pattern generationRaik, Jaan; Ubar, Raimund-JohannesRadioelectronics and informatics2003 / p. 40-45 : ill https://www.researchgate.net/publication/250395975_DECIDER_A_System_for_Hierarchical_Test_Pattern_Generation

artikkel ajakirjas

112

artikkel kogumikus

A decision diagram based hierarchical test pattern generatorJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 159-162: ill

artikkel kogumikus

113

artikkel ajakirjas

Decision diagrams - from a mathematical notion to engineering applicationsStankovic, Radomir S.; Ubar, Raimund-Johannes; Astola, JaakkoFacta Universitatis [Niš]. Series electronics and energetics2011 / p. 281-301 : ill http://dx.doi.org/10.2298/FUEE1103281S

artikkel ajakirjas

114

artikkel kogumikus

Decision diagrams and digital testUbar, Raimund-Johannes41th International Conference on Microelectronics, Devices and Materials : MIDEM 2005 : Ribno at Bled, Slovenia : invited plenary paper2005 / p. 15-26

artikkel kogumikus

115

artikkel kogumikus

Decision diagrams and digital testUbar, Raimund-JohannesECMS 2003 : 6th International Workshop on Electronics, Control, Measurment and Signals : Liberec, Czechia, June 2-4, 20032003 / p. 266-273 : ill http://www.midem-drustvo.si/Journal%20papers/MIDEM_35(2005)4p187.pdf

artikkel kogumikus

116

artikkel kogumikus

Decompositional design of testable Decompositional design of testable FSM networksKeevallik, Andres; Kruus, Margus; Lensen, HarriProceedings of the 4th International Workshop Mixed Design of Integrated Circuits and Systems : MIXDES'97 : Poznan, Poland, 12-14 June 19971997 / p. 431-436

artikkel kogumikus

117

artikkel kogumikus

Deep Learning Based Segmentation of Luria's Alternating Series Test to Support Diagnostics of Parkinson's DiseaseValla, Elli; Laur, Henry; Nõmm, Sven; Medijainen, Kadri; Taba, Pille; Toomela, Aaro2023 International Conference on Machine Learning and Applications (ICMLA)2023 / p. 1066-1071 : ill https://doi.org/10.1109/ICMLA58977.2023.00158

artikkel kogumikus

Seotud publikatsioonid 1

Leveraging artiﬁcial intelligence for microkinematic analysis of fine motor skills in Parkinson’s disease detection = Tehisintellekti rakendamine peenmotoorika mikrokinemaatilises analüüsis Parkinsoni tõve tuvastamiseks

118

artikkel kogumikus

DeepAxe : a framework for exploration of approximation and reliability trade-offs in DNN acceleratorsTaheri, Mahdi; Riazati, Mohamad; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan; Sjödin, Mikael; Lisper, Björn2023 24th International Symposium on Quality Electronic Design (ISQED)2023 / 8 p. : ill https://doi.org/10.1109/ISQED57927.2023.10129353

artikkel kogumikus

Seotud publikatsioonid 1

Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine

119

artikkel kogumikus

Defect-oriented BIST quality analysisKruus, Helena; Ubar, Raimund-Johannes; Raik, JaanBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 153-156 : ill

artikkel kogumikus

120

artikkel kogumikus

Defect-oriented fault simulation and test generation in digital circuitsKuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE ISQED 2001 : proceedings of the IEEE 2001 2nd International Symposium on Quality Electronic Design : March 26-28, 2001, San Jose, California2001 / p. 365-371 https://ieeexplore.ieee.org/document/915257

artikkel kogumikus

121

artikkel kogumikus

Defect-oriented library builder and hierarchical test generationCibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 20012001 / p. 163-168 : ill

artikkel kogumikus

122

artikkel kogumikus

Defect-oriented test- and layout-generation for standard-cell ASIC designsSudbrock, Joachim; Raik, Jaan; Ubar, Raimund-Johannes; Kuzmicz, Wieslaw; Pleskacz, Witold A.Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 79-82 : ill https://ieeexplore.ieee.org/document/1559781

artikkel kogumikus

123

artikkel kogumikus

Defect-oriented test generation and fault simulation in the environment of MOSCITOSchneider, Andre; Diener, Karl-Heinz; Gramatova, Elena; Fisherova, Maria; Ivask, Eero; Ubar, Raimund-Johannes; Pleskacz, Witold A.; Kuzmicz, W.BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 303-306 : ill

artikkel kogumikus

124

artikkel kogumikus

Defect-oriented test generation using probabilistic estimationCibakova, Tatiana; Fischerova, Maria; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 20002001 / p. 131-136 : ill

artikkel kogumikus

125

artikkel kogumikus

Defects, faults and fault modelsGramatova, Elena; Fisherova, Maria; Ubar, Raimund-Johannes; Pleskacz, Witold A.Handbook of testing electronic systems2005 / p. 26-96 : ill

artikkel kogumikus

testimine (märksõna)

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