Comparative analysis of sequential circuit test generation approaches

vastutusandmed
J.Raik, A.Krivenko, R.Ubar
ilmumiskoht
Tallinn
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 225-228 : ill
ISBN
9985-59-462-2
märkused
Bibliogr.: 12 ref
keel
inglise
Raik, J., Krivenko, A., Ubar, R.-J. Comparative analysis of sequential circuit test generation approaches // BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia. Tallinn : Tallinn University of Technology, 2004. p. 225-228 : ill.