EFIC-ME : a fast emulation based fault injection control and monitoring enhancement
statement of authorship
Zain Ul Abideen, Muhammad Haroon Rashid
source
publisher
journal volume number month
vol. 8
year of publication
pages
p. 207705-207716
ISSN
2169-3536
notes
Bibliogr.: 28 ref
Open Access
Open Access
scientific publication
teaduspublikatsioon
language
inglise
subject term
keyword
Opal Kelly field programmable gate array (FPGA)
classifier
kvartiil
TTÜ department
Reserch Group
Abideen, Z.U., Rashid, M. EFIC-ME : a fast emulation based fault injection control and monitoring enhancement // IEEE Access (2020) vol. 8, p. 207705-207716.