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EFIC-ME : a fast emulation based fault injection control and monitoring enhancement

author
Abideen, Zain Ul
Rashid, Muhammad Haroon
statement of authorship
Zain Ul Abideen, Muhammad Haroon Rashid
source
IEEE Access
publisher
IEEE
journal volume number month
vol. 8
year of publication
2020
pages
p. 207705-207716
url
https://doi.org/10.1109/ACCESS.2020.3038198
subject term
usaldusväärsus
emuleerimine
manussüsteemid
rikked
riistvara
turvalisus
paindlikkus
keyword
dependability
emulation
embedded systems
fault injection
hardware security
Opal Kelly field programmable gate array (FPGA)
flexibility
ISSN
2169-3536
notes
Bibliogr.: 28 ref
Open Access
Open Access
scientific publication
teaduspublikatsioon
classifier
1.1
Scopus
Journal metrics at Scopus
Article at Scopus
WOS
Journal metrics at WOS
Article at WOS
category (general)
Engineering
Computer science
Materials science
category (sub)
Engineering. General engineering
Computer science. General computer science
Materials science. General materials science
kvartiil
Q1
TTÜ department
Thomas Johann Seebecki elektroonikainstituut
language
inglise
Uurimisrühm
Centre for hardware security
Abideen, Z.U., Rashid, M. EFIC-ME : a fast emulation based fault injection control and monitoring enhancement // IEEE Access (2020) vol. 8, p. 207705-207716. https://doi.org/10.1109/ACCESS.2020.3038198