EFIC-ME : a fast emulation based fault injection control and monitoring enhancement
statement of authorship
Zain Ul Abideen, Muhammad Haroon Rashid
source
publisher
journal volume number month
vol. 8
year of publication
pages
p. 207705-207716
subject term
keyword
Opal Kelly field programmable gate array (FPGA)
ISSN
2169-3536
notes
Bibliogr.: 28 ref
Open Access
Open Access
scientific publication
teaduspublikatsioon
classifier
category (general)
category (sub)
kvartiil
TTÜ department
language
inglise
Uurimisrühm
Abideen, Z.U., Rashid, M. EFIC-ME : a fast emulation based fault injection control and monitoring enhancement // IEEE Access (2020) vol. 8, p. 207705-207716.