Ubar, R., Brik, M., Jutman, A., Raik, J., Bengtsson, T., Kumar, S.

prindi

Functional test generation for finite state machines

autor

Ubar, Raimund-Johannes

Brik, Marina

Jutman, Artur

Raik, Jaan

Bengtsson, Tomas

Kumar, Shashi

vastutusandmed

R.Ubar, M.Brik, A.Jutman, J.Raik, T.Bengtsson, S.Kumar

allikas

BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference

ilmumiskoht

[Tallinn]

kirjastus/väljaandja

Tallinn University of Technology

ilmumisaasta

2006

leheküljed

p. 205-208 : ill

märksõna

testimine

VLSI-ahelad

ISBN

1-4244-0414-2

märkused

Bibliogr.: 16 ref

keel

inglise

Ubar, R., Brik, M., Jutman, A., Raik, J., Bengtsson, T., Kumar, S. Functional test generation for finite state machines // BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference. [Tallinn] : Tallinn University of Technology, 2006. p. 205-208 : ill.