prindi

Test time minimization for hybrid BIST with test pattern broadcasting

autor
Ubar, Raimund-Johannes
Jenihhin, Maksim
Jervan, Gert
Peng, Zebo
vastutusandmed
Raimund Ubar, Maksim Jenihhin, Gert Jervan, Zebo Peng
allikas
IEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings
ilmumiskoht
[S. l.]
ilmumisaasta
2003
leheküljed
p. 112-116 : ill
leitav
https://www.ida.liu.se/labs/eslab/publications/pap/db/norchip03.pdf
märksõna
integraallülitused
testimine
ISBN
87-982637-5-7
märkused
Bibliogr.: 11 ref
keel
inglise
Ubar, R.-J., Jenihhin, M., Jervan, G., Peng, Z. Test time minimization for hybrid BIST with test pattern broadcasting // IEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings. [S. l.], 2003. p. 112-116 : ill. https://www.ida.liu.se/labs/eslab/publications/pap/db/norchip03.pdf