True path tracing in structurally synthesized BDDs for testability analysis of digital circuits
author
Ubar, Raimund-Johannes
Jürimägi, Lembit
Oyeniran, Adeboye Stephen
Jenihhin, Maksim
statement of authorship
Raimund Ubar, Lembit Jürimägi, Adeniyi Olanrewaju Adekoya, Maksim Jenihhin
source
Euromicro Conference on Digital System Design : DSD 2019 : 28 - 30 August 2019 Kallithea, Chalkidiki, Greece : proceedings
location of publication
Danvers
publisher
IEEE
year of publication
2019
pages
p. 492-499 : ill
conference name, date
22nd Euromicro Conference on Digital System Design, DSD 2019, 28 - 30 August 2019
conference location
Kallithea, Chalkidiki, Greece
url
https://doi.org/10.1109/DSD.2019.00077
subject term
digitaalintegraallülitused
digitaaltehnika
otsustusdiagrammid
keyword
combinational circuits
signal probabilities
controllability
testability
fault redundancy
structurally synthesized BDDs
ISBN
978-1-7281-2861-0
978-1-7281-2863-4
notes
Bibliogr.: 25 ref
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems