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fault redundancy (keyword)
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1
journal article EST
/
journal article ENG
Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Microprocessors and microsystems
2020
/
art. 103117, 12 p
https://doi.org/10.1016/j.micpro.2020.103117
Journal metrics at Scopus
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journal article EST
/
journal article ENG
2
book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
3
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
4
book article
Mixed-level identification of fault redundancy in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704591
book article
5
book article
True path tracing in structurally synthesized BDDs for testability analysis of digital circuits
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
Euromicro Conference on Digital System Design : DSD 2019 : 28 - 30 August 2019 Kallithea, Chalkidiki, Greece : proceedings
2019
/
p. 492-499 : ill
https://doi.org/10.1109/DSD.2019.00077
book article
Number of records 5, displaying
1 - 5
keyword
91
1.
fault redundancy
2.
low-level fault redundancy
3.
redundancy
4.
triple modular redundancy
5.
(N+1) redundancy
6.
asynchronous fault detection
7.
automatic fault diagnosis
8.
bearing fault diagnosis
9.
bi-directional fault monitoring devices
10.
conditional fault collapsing
11.
control fault models
12.
critical path fault tracing
13.
cross-layer fault tolerance
14.
cross-layered fault management
15.
extended fault class
16.
fault currents
17.
fault analysis
18.
fault analysis model
19.
fault classification
20.
fault classification
21.
fault collapsing
22.
fault compensation
23.
fault coverage
24.
fault current and voltage measurements
25.
Fault current limite
26.
fault current limiter
27.
fault detection
28.
fault detection and diagnoses
29.
fault detection and diagnosis
30.
fault diagnosis
31.
fault diagnostic
32.
fault diagnostic resolution
33.
fault diagnostics
34.
fault dignosis
35.
fault effects
36.
fault emulation
37.
fault equivalence and dominance
38.
fault handling
39.
fault handling strategy
40.
fault indicator
41.
fault injection
42.
Fault Injection Simulation
43.
fault Interruption
44.
fault localization
45.
fault management
46.
fault masking
47.
fault modeling
48.
fault models
49.
fault monitoring
50.
fault prediction
51.
fault protection
52.
fault resilience
53.
fault ride through
54.
Fault ride through enhancement
55.
fault signal
56.
fault simulastion
57.
fault simulation
58.
fault simulation with critical path tracing
59.
fault tolerance
60.
fault tolerant
61.
fault tolerant control
62.
fault tolerant operation
63.
fault tolerant router design
64.
fault tolerant systems
65.
Fault Tree Analysis
66.
fault-injection attack
67.
fault-plane solution
68.
fault-resilience
69.
fault-resistant
70.
fault-ride-through (FRT)
71.
fault-tolerance
72.
fault-tolerant
73.
Fault-tolerant (FT) converters
74.
fault-tolerant control
75.
fault-tolerant converter
76.
functional fault model
77.
high-level control fault model
78.
high-level fault coverage
79.
high-level fault model
80.
high-level fault simulation
81.
high-level functional fault model
82.
Katun fault
83.
no fault found
84.
No-Fault-Found
85.
open circuit fault
86.
parallel fault-simulation
87.
short circuit fault
88.
stuck-at fault model
89.
test generation and fault diagnosis
90.
transient fault mitigation
91.
transmission lines fault
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