Mixed-level identification of fault redundancy in microprocessors
author
Oyeniran, Adeboye Stephen
Ubar, Raimund-Johannes
Jenihhin, Maksim
Gürsoy, Cemil Cem
Raik, Jaan
statement of authorship
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gürsoy, Jaan Raik
source
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
location of publication
[S.l.]
publisher
IEEE
year of publication
2019
pages
6 p. : ill
conference name, date
20th IEEE Latin American Test Symposium, LATS 2019, March 11th - 13th 2019
conference location
Santiago,Chile
url
https://doi.org/10.1109/LATW.2019.8704591
subject term
mikroprotsessorid
tõrketaluvus
diagnostika (tehnika)
keyword
processor core testing
high-level control fault model
high-level fault simulation
fault coverage
fault redundancy
ISSN
2373-0862
ISBN
978-1-7281-1756-0
978-1-7281-1757-7
notes
Bibliogr.: 31 ref
TTÜ department
arvutisüsteemide instituut
language
inglise
Uurimisrühm
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems