Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
processor core testing (keyword)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publication
..
year
year of publication
Loading..
author
Loading..
TTÜ department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
2
Look more..
(1/98)
Export
export all inquiry results
(2)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
2
book article
Mixed-level identification of fault redundancy in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704591
book article
Number of records 2, displaying
1 - 2
keyword
98
1.
processor core testing
2.
processor testing
3.
RISC processor testing
4.
crypto processor
5.
digital signal processor (DSP)
6.
multicore processor
7.
multi-processor
8.
multi-processor system-on-chip
9.
multi-processor system-on-chips (MPSoCs)
10.
Muti-Processor System on Chip (MPSoC)
11.
processor designs
12.
processor-centric board
13.
processor-centric board test
14.
core collection
15.
core loss
16.
core losses
17.
core shell heterostructures
18.
core short-circuit
19.
core/shell
20.
core-less induction furnace
21.
core-shell nanoparticles
22.
cpu core
23.
crypto core
24.
ferromagnetic core
25.
firn core
26.
many-core
27.
Ohesaare core
28.
sediment core records
29.
toroidal magnetic core
30.
accelerated testing
31.
acoustomechanical testing
32.
anaerobic testing
33.
aspect-oriented testing
34.
at-speed testing
35.
benchmark testing
36.
Berridge testing
37.
cancer genomic testing
38.
compliance testing
39.
compositional testing
40.
computer aided testing
41.
conformance testing
42.
courses on electronic testing and design
43.
cybersecurity testing
44.
D. non-destructive testing
45.
design field testing
46.
eddy current testing
47.
erosion testing
48.
fatigue testing
49.
fire testing
50.
hierarchical testing
51.
hypotheses testing
52.
integration testing
53.
laboratory scale testing
54.
load testing
55.
macro mechanical testing and green surface tribology
56.
material testing
57.
measurement and testing
58.
mechanical testing
59.
memory testing
60.
metamorphic testing
61.
microprocessor testing
62.
model based testing
63.
model-based mutation testing
64.
model-based testing
65.
mutation testing
66.
network-testing
67.
non destructive testing
68.
nondestructive testing
69.
non-destructive testing
70.
on-site testing
71.
pin on disc wear testing
72.
PMU calibration testing
73.
PMU testing
74.
point-of-care testing
75.
real-time HiL testing
76.
regression testing
77.
robustness testing
78.
scenario testing
79.
scratch testing
80.
security testing
81.
small-scale fire testing
82.
software testing
83.
software-in-the-loop (SIL) testing
84.
stand-alone testing
85.
stress-testing
86.
substation testing methods
87.
system testing
88.
tensile testing
89.
testing
90.
testing methods
91.
testing of digital devices
92.
testing of generator
93.
testing of phasor measurement units
94.
two-dimensional array testing
95.
wafer testing
96.
wear testing
97.
vibration testing
98.
virtual testing
×
vaste
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TTÜ department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TTÜ department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT