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processor core testing (keyword)
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1
book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
2
book article
Mixed-level identification of fault redundancy in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704591
book article
Number of records 2, displaying
1 - 2
keyword
119
1.
processor core testing
2.
processor testing
3.
RISC processor testing
4.
ARM processor
5.
crypto processor
6.
digital signal processor (DSP)
7.
multicore processor
8.
multi-processor
9.
multi-processor system-on-chip
10.
multi-processor system-on-chips (MPSoCs)
11.
Muti-Processor System on Chip (MPSoC)
12.
processor architecture
13.
processor designs
14.
processor-centric board
15.
processor-centric board test
16.
air core
17.
air core coupled coils
18.
core collection
19.
core loss
20.
core losses
21.
core shell heterostructures
22.
core short-circuit
23.
core/shell
24.
core-less induction furnace
25.
core-shell nanoparticles
26.
core-shell particle
27.
cpu core
28.
crypto core
29.
DPP core ontology
30.
ferromagnetic core
31.
firn core
32.
many-core
33.
Ohesaare core
34.
Performance Indicators for Core Sustainability Objectives of Universities (PICSOU)
35.
sediment core
36.
sediment core records
37.
soft magnetic core
38.
toroidal magnetic core
39.
accelerated testing
40.
acoustomechanical testing
41.
anaerobic testing
42.
aspect-oriented testing
43.
assessment and testing
44.
at-speed testing
45.
benchmark testing
46.
Berridge testing
47.
burst testing
48.
cancer genomic testing
49.
compliance testing
50.
compositional testing
51.
computer aided testing
52.
cone heater testing
53.
conformance testing
54.
courses on electronic testing and design
55.
cybersecurity testing
56.
D. non-destructive testing
57.
deformation testing
58.
design field testing
59.
destructive testing
60.
eddy current testing
61.
eddy current testing (ECT)
62.
erosion testing
63.
fabric testing
64.
fatigue testing
65.
fire testing
66.
hierarchical testing
67.
hypotheses testing
68.
Implementation-Independent Testing of Microprocessors
69.
integration testing
70.
laboratory scale testing
71.
load testing
72.
macro mechanical testing and green surface tribology
73.
material testing
74.
materials testing
75.
measurement and testing
76.
mechanical testing
77.
memory testing
78.
metamorphic testing
79.
microprocessor testing
80.
model based testing
81.
model-based mutation testing
82.
model-based testing
83.
mutation testing
84.
network-testing
85.
non destructive testing
86.
nondestructive testing
87.
non-destructive testing
88.
on-site testing
89.
pin on disc wear testing
90.
PMU calibration testing
91.
PMU testing
92.
point-of-care testing
93.
real-time HiL testing
94.
regression testing
95.
robustness testing
96.
safety and security testing
97.
scenario testing
98.
scratch testing
99.
security testing
100.
shear testing
101.
small-scale fire testing
102.
software testing
103.
software-in-the-loop (SIL) testing
104.
stand-alone testing
105.
stress-testing
106.
substation testing methods
107.
system testing
108.
tensile testing
109.
testing
110.
testing methods
111.
testing of digital devices
112.
testing of generator
113.
testing of phasor measurement units
114.
two-dimensional array testing
115.
ultrasonic testing
116.
wafer testing
117.
wear testing
118.
vibration testing
119.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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