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processor core testing (keyword)
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book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
2
book article
Mixed-level identification of fault redundancy in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704591
book article
Number of records 2, displaying
1 - 2
keyword
102
1.
processor core testing
2.
processor testing
3.
RISC processor testing
4.
ARM processor
5.
crypto processor
6.
digital signal processor (DSP)
7.
multicore processor
8.
multi-processor
9.
multi-processor system-on-chip
10.
multi-processor system-on-chips (MPSoCs)
11.
Muti-Processor System on Chip (MPSoC)
12.
processor designs
13.
processor-centric board
14.
processor-centric board test
15.
air core coupled coils
16.
core collection
17.
core loss
18.
core losses
19.
core shell heterostructures
20.
core short-circuit
21.
core/shell
22.
core-less induction furnace
23.
core-shell nanoparticles
24.
cpu core
25.
crypto core
26.
ferromagnetic core
27.
firn core
28.
many-core
29.
Ohesaare core
30.
sediment core records
31.
toroidal magnetic core
32.
accelerated testing
33.
acoustomechanical testing
34.
anaerobic testing
35.
aspect-oriented testing
36.
at-speed testing
37.
benchmark testing
38.
Berridge testing
39.
cancer genomic testing
40.
compliance testing
41.
compositional testing
42.
computer aided testing
43.
conformance testing
44.
courses on electronic testing and design
45.
cybersecurity testing
46.
D. non-destructive testing
47.
design field testing
48.
destructive testing
49.
eddy current testing
50.
erosion testing
51.
fatigue testing
52.
fire testing
53.
hierarchical testing
54.
hypotheses testing
55.
integration testing
56.
laboratory scale testing
57.
load testing
58.
macro mechanical testing and green surface tribology
59.
material testing
60.
materials testing
61.
measurement and testing
62.
mechanical testing
63.
memory testing
64.
metamorphic testing
65.
microprocessor testing
66.
model based testing
67.
model-based mutation testing
68.
model-based testing
69.
mutation testing
70.
network-testing
71.
non destructive testing
72.
nondestructive testing
73.
non-destructive testing
74.
on-site testing
75.
pin on disc wear testing
76.
PMU calibration testing
77.
PMU testing
78.
point-of-care testing
79.
real-time HiL testing
80.
regression testing
81.
robustness testing
82.
scenario testing
83.
scratch testing
84.
security testing
85.
small-scale fire testing
86.
software testing
87.
software-in-the-loop (SIL) testing
88.
stand-alone testing
89.
stress-testing
90.
substation testing methods
91.
system testing
92.
tensile testing
93.
testing
94.
testing methods
95.
testing of digital devices
96.
testing of generator
97.
testing of phasor measurement units
98.
two-dimensional array testing
99.
wafer testing
100.
wear testing
101.
vibration testing
102.
virtual testing
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