High-level decision diagrams based coverage metrics for verification and test
author
Jenihhin, Maksim
Raik, Jaan
Tšepurov, Anton
Reinsalu, Uljana
Ubar, Raimund-Johannes
statement of authorship
Maksim Jenihhin, Jaan Raik, Anton Chepurov, Uljana Reinsalu, Raimund Ubar
source
LATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 2009
location of publication
[S.l.]
publisher
IEEE
year of publication
2009
pages
[6] p. : ill
conference name, date
10th IEEE Latin American Test Workshop, 2-5 March, 2009
conference location
Rio de Janero, Brazil
url
http://dx.doi.org/10.1109/LATW.2009.4813792
subject term
integraallülitused
digitaalintegraallülitused
testimine
otsustusdiagrammid
ISBN
978-1-4244-4206-5
notes
Bibliogr.: 10 ref
TalTech department
arvutitehnika instituut
language
inglise