High-level modeling and testing of multiple control faults in digital systems
author
statement of authorship
Artjom Jasnetski, Stephen Adeboye Oyeniran, Anton Tsertov, Mario Schölzel, Raimund Ubar
source
Formal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia
location of publication
[S.l.]
publisher
year of publication
pages
[6] p. : ill
conference name, date
19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, April 20-22, 2016
conference location
Košice, Slovakia
subject term
ISBN
978-1-5090-2467-4
notes
Bibliogr.: 20 ref
TTÜ department
language
inglise
Jasnetski, A., Oyeniran, S.A., Tšertov, A., Schölzel, M., Ubar, R. High-level modeling and testing of multiple control faults in digital systems // Formal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia. [S.l.] : IEEE, 2016. [6] p. : ill.