High-level modeling and testing of multiple control faults in digital systems
autor
vastutusandmed
Artjom Jasnetski, Stephen Adeboye Oyeniran, Anton Tsertov, Mario Schölzel, Raimund Ubar
allikas
Formal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia
ilmumiskoht
[S.l.]
kirjastus/väljaandja
ilmumisaasta
leheküljed
[6] p. : ill
konverentsi nimetus, aeg
19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, April 20-22, 2016
konverentsi toimumispaik
Košice, Slovakia
ISBN
978-1-5090-2467-4
märkused
Bibliogr.: 20 ref
TTÜ struktuuriüksus
keel
inglise
Jasnetski, A., Oyeniran, S.A., Tšertov, A., Schölzel, M., Ubar, R. High-level modeling and testing of multiple control faults in digital systems // Formal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia. [S.l.] : IEEE, 2016. [6] p. : ill.