High-level functional test generation for microprocessor modules
author
Oyeniran, Adeboye Stephen
Ubar, Raimund-Johannes
statement of authorship
Adeboye Stephen Oyeniran, Raimund Ubar
source
Proceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 2019
location of publication
Lodz
publisher
Lodz University of Technology
year of publication
2019
pages
p. 356-361 : ill
url
https://doi.org/10.23919/MIXDES.2019.8787131
subject term
mikroprotsessorid
tarkvara
testimine
rikked
keyword
RISC processor testing
high-level control faults
high-level test data generation
ISBN
978-83-63578-15-2
978-83-63578-16-9
978-1-7281-1740-9
notes
Bibliogr.: 29 ref
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems