Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
high-level control faults (keyword)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publications
..
year
year of publication
Loading..
author
Loading..
TalTech department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
2
Look more..
(1/53)
Export
export all inquiry results
(2)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
High-level functional test generation for microprocessor modules
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
Proceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 2019
2019
/
p. 356-361 : ill
https://doi.org/10.23919/MIXDES.2019.8787131
book article
2
book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
Number of records 2, displaying
1 - 2
keyword
53
1.
high-level control faults
2.
high-level control fault model
3.
logic level and high level BDDs
4.
Cross-level Modeling of Faults in Digital Systems
5.
high impedance faults
6.
control faults
7.
high level DD (HLDD)
8.
high level synthesis
9.
high-level decision diagram
10.
high-level decision diagrams
11.
high-level decision diagrams (HLDD) synthesis
12.
High-level Decision Diagrams for Modeling Digital Systems
13.
high-level expert group on AI
14.
high-level fault coverage
15.
high-level fault model
16.
high-level fault simulation
17.
high-level functional fault model
18.
high-level synthesis
19.
High-Level Synthesis (HLS)
20.
high-level synthesis for test
21.
high-level test data generation
22.
level control
23.
low-level control system transportation
24.
High-Pressure High-Temperature Spark Plasma Sintering
25.
finite control set-model predictive control (FCS-MPC)
26.
modulated finite control set-model predictive control
27.
Avoiding Mutual Masking of Multiple Faults
28.
broken rotor bar faults
29.
circuit faults
30.
classification of faults
31.
faults
32.
faults classification
33.
faults in power system
34.
hard-to-detect faults
35.
indefinite faults
36.
inter-disk and inter-turn faults
37.
localization of faults
38.
motor faults
39.
multiple faults
40.
non-robust and functional sensitization of delay faults
41.
power distribution faults
42.
power system faults
43.
rotor faults
44.
Safe Faults
45.
Single Stuck-at Faults
46.
stuck-at-faults
47.
tectonic faults
48.
terms-transient faults
49.
Test Group Generation for Detecting Multiple Faults
50.
transient faults
51.
transition delay faults
52.
unknown faults
53.
untestable faults
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TalTech department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TalTech department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT