High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test
author
Oyeniran, Adeboye Stephen
Jenihhin, Maksim
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
Adeboye Stephen Oyeniran, Maksim Jenihhin, Jaan Raik, Raimund Ubar
source
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022
publisher
IEEE
year of publication
2022
pages
p. 32-37
conference name, date
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 04-06 July 2022
conference location
Nicosia, Cyprus
url
https://doi.org/10.1109/ISVLSI54635.2022.00019
subject term
mikroprotsessorid
riistvara
testimine
rikked
diagnostika (tehnika)
keyword
microprocessor testing
fault diagnosis
high-level functional fault model
fault diagnostic resolution
ISSN
2159-3477
2159-3469
ISBN
978-1-6654-6605-9
978-1-6654-6606-6
notes
Bibliogr.: 33 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems