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microprocessor testing (keyword)
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1
book article
High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022
2022
/
p. 32-37
https://doi.org/10.1109/ISVLSI54635.2022.00019
book article
2
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
3
book article
Minimization of the high-level fault model for microprocessor control parts [Online resource]
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
;
Medaiyese, Olusiji
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p.: ill
https://doi.org/10.1109/BEC.2018.8600980
book article
4
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
Number of records 4, displaying
1 - 4
keyword
90
1.
microprocessor testing
2.
Implementation-Independent Testing of Microprocessors
3.
microprocessor
4.
microprocessor architecture
5.
microprocessor chips
6.
microprocessor systems
7.
microprocessor test
8.
shakti microprocessor
9.
accelerated testing
10.
acoustomechanical testing
11.
anaerobic testing
12.
aspect-oriented testing
13.
assessment and testing
14.
at-speed testing
15.
benchmark testing
16.
Berridge testing
17.
burst testing
18.
cancer genomic testing
19.
compliance testing
20.
compositional testing
21.
computer aided testing
22.
cone heater testing
23.
conformance testing
24.
courses on electronic testing and design
25.
cybersecurity testing
26.
D. non-destructive testing
27.
deformation testing
28.
design field testing
29.
destructive testing
30.
eddy current testing
31.
eddy current testing (ECT)
32.
erosion testing
33.
fabric testing
34.
fatigue testing
35.
fire testing
36.
hierarchical testing
37.
hypotheses testing
38.
integration testing
39.
laboratory scale testing
40.
load testing
41.
macro mechanical testing and green surface tribology
42.
material testing
43.
materials testing
44.
measurement and testing
45.
mechanical testing
46.
memory testing
47.
metamorphic testing
48.
model based testing
49.
model-based mutation testing
50.
model-based testing
51.
mutation testing
52.
network-testing
53.
non destructive testing
54.
nondestructive testing
55.
non-destructive testing
56.
on-site testing
57.
pin on disc wear testing
58.
PMU calibration testing
59.
PMU testing
60.
point-of-care testing
61.
processor core testing
62.
processor testing
63.
real-time HiL testing
64.
regression testing
65.
RISC processor testing
66.
robustness testing
67.
safety and security testing
68.
scenario testing
69.
scratch testing
70.
security testing
71.
shear testing
72.
small-scale fire testing
73.
software testing
74.
software-in-the-loop (SIL) testing
75.
stand-alone testing
76.
stress-testing
77.
substation testing methods
78.
system testing
79.
tensile testing
80.
testing
81.
testing methods
82.
testing of digital devices
83.
testing of generator
84.
testing of phasor measurement units
85.
two-dimensional array testing
86.
ultrasonic testing
87.
wafer testing
88.
wear testing
89.
vibration testing
90.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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