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microprocessor testing (keyword)
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1
book article
High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022
2022
/
p. 32-37
https://doi.org/10.1109/ISVLSI54635.2022.00019
book article
2
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
3
book article
Minimization of the high-level fault model for microprocessor control parts [Online resource]
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
;
Medaiyese, Olusiji
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p.: ill
https://doi.org/10.1109/BEC.2018.8600980
book article
4
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
Number of records 4, displaying
1 - 4
keyword
96
1.
microprocessor testing
2.
Implementation-Independent Testing of Microprocessors
3.
microprocessor
4.
microprocessor architecture
5.
microprocessor chips
6.
microprocessor systems
7.
microprocessor test
8.
shakti microprocessor
9.
accelerated testing
10.
acoustomechanical testing
11.
anaerobic testing
12.
aspect-oriented testing
13.
assessment and testing
14.
at-speed testing
15.
benchmark testing
16.
Berridge testing
17.
burst testing
18.
cancer genomic testing
19.
circuit testing
20.
compliance testing
21.
compositional testing
22.
computer aided testing
23.
cone heater testing
24.
conformance testing
25.
courses on electronic testing and design
26.
cybersecurity testing
27.
D. non-destructive testing
28.
deformation testing
29.
design field testing
30.
destructive testing
31.
eddy current testing
32.
eddy current testing (ECT)
33.
erosion testing
34.
fabric testing
35.
fatigue testing
36.
fire testing
37.
hierarchical testing
38.
hypotheses testing
39.
integration testing
40.
laboratory scale testing
41.
load testing
42.
macro mechanical testing and green surface tribology
43.
material testing
44.
materials testing
45.
measurement and testing
46.
mechanical testing
47.
memory testing
48.
metamorphic testing
49.
model based testing
50.
model-based mutation testing
51.
model-based testing
52.
multi-scenario testing
53.
mutation testing
54.
network-testing
55.
non destructive testing
56.
nondestructive testing
57.
non-destructive testing
58.
non-destructive testing (NDT)
59.
On-site drug testing
60.
on-site testing
61.
pin on disc wear testing
62.
PMU calibration testing
63.
PMU testing
64.
point-of-care testing
65.
processor core testing
66.
processor testing
67.
real-time HiL testing
68.
regression testing
69.
RISC processor testing
70.
robustness testing
71.
safety and security testing
72.
scenario testing
73.
Scenario-Based Testing
74.
scratch testing
75.
security testing
76.
shear testing
77.
small-scale fire testing
78.
software testing
79.
software-in-the-loop (SIL) testing
80.
stand-alone testing
81.
stress-testing
82.
substation testing methods
83.
system testing
84.
tensile testing
85.
testing
86.
testing methods
87.
testing of digital devices
88.
testing of generator
89.
testing of phasor measurement units
90.
two-dimensional array testing
91.
ultrasonic testing
92.
wafer testing
93.
wear testing
94.
well testing
95.
vibration testing
96.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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