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microprocessor testing (keyword)
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1
book article
High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022
2022
/
p. 32-37
https://doi.org/10.1109/ISVLSI54635.2022.00019
book article
2
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
3
book article
Minimization of the high-level fault model for microprocessor control parts [Online resource]
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
;
Medaiyese, Olusiji
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p.: ill
https://doi.org/10.1109/BEC.2018.8600980
book article
4
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
Number of records 4, displaying
1 - 4
keyword
84
1.
microprocessor testing
2.
Implementation-Independent Testing of Microprocessors
3.
microprocessor
4.
microprocessor chips
5.
microprocessor systems
6.
microprocessor test
7.
shakti microprocessor
8.
accelerated testing
9.
acoustomechanical testing
10.
anaerobic testing
11.
aspect-oriented testing
12.
at-speed testing
13.
benchmark testing
14.
Berridge testing
15.
burst testing
16.
cancer genomic testing
17.
compliance testing
18.
compositional testing
19.
computer aided testing
20.
conformance testing
21.
courses on electronic testing and design
22.
cybersecurity testing
23.
D. non-destructive testing
24.
deformation testing
25.
design field testing
26.
destructive testing
27.
eddy current testing
28.
eddy current testing (ECT)
29.
erosion testing
30.
fatigue testing
31.
fire testing
32.
hierarchical testing
33.
hypotheses testing
34.
integration testing
35.
laboratory scale testing
36.
load testing
37.
macro mechanical testing and green surface tribology
38.
material testing
39.
materials testing
40.
measurement and testing
41.
mechanical testing
42.
memory testing
43.
metamorphic testing
44.
model based testing
45.
model-based mutation testing
46.
model-based testing
47.
mutation testing
48.
network-testing
49.
non destructive testing
50.
nondestructive testing
51.
non-destructive testing
52.
on-site testing
53.
pin on disc wear testing
54.
PMU calibration testing
55.
PMU testing
56.
point-of-care testing
57.
processor core testing
58.
processor testing
59.
real-time HiL testing
60.
regression testing
61.
RISC processor testing
62.
robustness testing
63.
safety and security testing
64.
scenario testing
65.
scratch testing
66.
security testing
67.
small-scale fire testing
68.
software testing
69.
software-in-the-loop (SIL) testing
70.
stand-alone testing
71.
stress-testing
72.
substation testing methods
73.
system testing
74.
tensile testing
75.
testing
76.
testing methods
77.
testing of digital devices
78.
testing of generator
79.
testing of phasor measurement units
80.
two-dimensional array testing
81.
wafer testing
82.
wear testing
83.
vibration testing
84.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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