Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement

vastutusandmed
M.Blyzniuk, I.Kazymyra, W.Kuzmicz, W.A.Pleskacz, J.Raik, R.Ubar
ajakirja aastakäik number kuu
Vol. 41
ilmumisaasta
leheküljed
p. 2023-2040 : ill
ISSN
0026-2714
märkused
Bibliogr.: 31 ref
keel
inglise
Blyzniuk, M., Kazymyra, I., Kuzmicz, W., Pleskacz, W.A., Raik, J., Ubar, R.-J. Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement // Microelectronics reliability (2001) Vol. 41, p. 2023-2040 : ill. https://www.sciencedirect.com/science/article/pii/S0026271401000920