Teaching digital system test
statement of authorship
Adeboye Stephen Oyeniran, Raimund Ubar, Margus Kruus
source
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
location of publication
[S.l.]
publisher
year of publication
pages
[6] p
conference name, date
The 27th EAEEIE Annual Conference, June 7-9, 2017
conference location
Grenoble, France
keyword
high-level decision diagram
notes
EAEEIE = European Association for Education in Electrical and Information Engineering
TTÜ department
language
inglise
Oyeniran, A.S., Ubar, R., Kruus, M. Teaching digital system test // The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble. [S.l.] : IEEE Computer Society, 2017. [6] p.