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Automated identification of application-dependent safe faults in automotive systems-on-a-chipsBagbaba, Ahmet Cagri; Augusto da Silva, Felipe; Sonza Reorda, Matteo; Hamdioui, Said; Jenihhin, Maksim; Sauer, ChristianElectronics2022 / art. 319 https://doi.org/10.3390/electronics11030319 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

Seotud publikatsioonid 1

Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

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book article

BASTION : board and SoC test instrumentation for ageing and no failure foundJutman, Artur; Lotz, Christophe; Larsson, Erik; Sonza Reorda, Matteo; Jenihhin, Maksim; Raik, JaanProceedings of the 2017 Design, Automation & Test in Europe (DATE) : 27-31 March 2017, Swisstech, Lausanne, Switzerland2017 / p. 115-120 : ill https://doi.org/10.23919/DATE.2017.7926968

book article

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book article

Challenges of reliability assessment and enhancement in autonomous systemsJenihhin, Maksim; Sonza Reorda, Matteo; Balakrishnan, Aneesh; Alexandrescu, Dan2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2019)2019 / 6 p https://doi.org/10.1109/DFT.2019.8875379

book article

Seotud publikatsioonid 1

A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks

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book article

Determined-safe faults identification : a step towards ISO26262 hardware compliant designsAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Sonza Reorda, Matteo; Hamdioui, Said; Sauer, Christian2020 25th IEEE European Test Symposium (ETS)2020 / 6 p. : ill https://doi.org/10.1109/ETS48528.2020.9131568

book article

Seotud publikatsioonid 1

Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

5

book article

Exploiting high-level descriptions for circuits fault tolerance assessmentsBenso, A.; Prinetto, Paolo; Rebaudengo, M.; Sonza Reorda, Matteo; Raik, Jaan; Ubar, Raimund-Johannes1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Paris, October 20-22, 19971997 / p. 212-216

book article

6

book article

New categories of Safe Faults in a processor-based Embedded SystemGürsoy, Cemil Cem; Jenihhin, Maksim; Oyeniran, Adeboye Stephen; Piumatti, Davide; Raik, Jaan; Sonza Reorda, Matteo; Ubar, Raimund-Johannes2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings2019 / 4 p. : ill https://doi.org/10.1109/DDECS.2019.8724642

book article

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book article EST / book article ENG

Rejuvenation of NBTI-impacted processors using evolutionary generation of assembler programsPellerey, Francesco; Jenihhin, Maksim; Squillero, Giovanni; Raik, Jaan; Sonza Reorda, Matteo; Tihhomirov, Valentin; Ubar, Raimund-Johannes2016 IEEE 25th Asian Test Symposium : 21-24 November 2016, Hiroshima, Japan2016 / p. 304-309 : ill https://doi.org/10.1109/ATS.2016.57 Conference Proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG

8

book article

RESCUE : cross-sectoral PhD training concept for interdependent reliability, security and qualityVierhaus, Heinrich Theodor; Jenihhin, Maksim; Sonza Reorda, Matteo2018 12th European Workshop on Microelectronics Education (EWME) : September 24–26, 20182018 / p. 45-50 : ill https://doi.org/10.1109/EWME.2018.8629465

book article

Sonza Reorda, Matteo (author)

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author 9

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