A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMs

statement of authorship
Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui
source
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings
publisher
year of publication
pages
p. 792-797
conference name, date
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE 2020), 9 to 13 March, 2020
conference location
Grenoble, France
keyword
FinFET
hard-to-detect faults
DFT
memory testing
ISBN
978-3-9819263-4-7
notes
Bibliogr.: 24 ref
TTÜ department
language
inglise
Cardoso Medeiros, G., Gürsoy, C.C., Fieback, M., Jenihhin, M. et al. A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMs // 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings. : EDAA, 2020. p. 792-797. https://doi.org/10.23919/DATE48585.2020.9116278