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Safe Faults (keyword)
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journal article EST
/
journal article ENG
Automated identification of application-dependent safe faults in automotive systems-on-a-chips
Bagbaba, Ahmet Cagri
;
Augusto da Silva, Felipe
;
Sonza Reorda, Matteo
;
Hamdioui, Said
;
Jenihhin, Maksim
;
Sauer, Christian
Electronics
2022
/
art. 319
https://doi.org/10.3390/electronics11030319
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journal article EST
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journal article ENG
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
2
book article
Determined-safe faults identification : a step towards ISO26262 hardware compliant designs
Augusto da Silva, Felipe
;
Bagbaba, Ahmet Cagri
;
Sartoni, Sandro
;
Cantoro, Riccardo
;
Sonza Reorda, Matteo
;
Hamdioui, Said
;
Sauer, Christian
2020 25th IEEE European Test Symposium (ETS)
2020
/
6 p. : ill
https://doi.org/10.1109/ETS48528.2020.9131568
book article
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
Number of records 2, displaying
1 - 2
keyword
34
1.
Safe Faults
2.
safe driving in the dark
3.
safe navigation
4.
safe operation
5.
safe-by-design
6.
Avoiding Mutual Masking of Multiple Faults
7.
broken rotor bar faults
8.
circuit faults
9.
classification of faults
10.
control faults
11.
Cross-level Modeling of Faults in Digital Systems
12.
faults
13.
faults in power system
14.
hard-to-detect faults
15.
high impedance faults
16.
high-level control faults
17.
indefinite faults
18.
inter-disk and inter-turn faults
19.
localization of faults
20.
motor faults
21.
multiple faults
22.
non-robust and functional sensitization of delay faults
23.
power distribution faults
24.
power system faults
25.
rotor faults
26.
Single Stuck-at Faults
27.
stuck-at-faults
28.
tectonic faults
29.
terms-transient faults
30.
Test Group Generation for Detecting Multiple Faults
31.
transient faults
32.
transition delay faults
33.
unknown faults
34.
untestable faults
subject term
1
1.
Estonian Center for Safe and Trustworthy Artificial Intelligence (ECSTAI)
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