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1
book article
High-level modeling and testing of multiple control faults in digital systems
Jasnetski, Artjom
;
Oyeniran, Adeboye Stephen
;
Tšertov, Anton
;
Schölzel, Mario
;
Ubar, Raimund-Johannes
Formal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/DDECS.2016.7482445
book article
2
book article
How to prove that a circuit is fault-free?
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings : 15th Euromicro Conference on Digital System Design DSD 2012 : 5-8 September 2012, Cesme, Izmir, Turkey
2012
/
p. 427-430 : ill
https://www.researchgate.net/publication/262271409_How_to_Prove_that_a_Circuit_is_Fault-Free
book article
3
book article
Multiple fault testing in systems-on-chip with high-level decision diagrams
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
;
Schölzel, Mario
;
Vierhaus, Heinrich Theodor
Proceedings of 2015 10th International Design & Test Symposium (IDT) : Dead Sea, Jordan, 14-16 December 2015
2015
/
p. 66-71 : ill
http://dx.doi.org/10.1109/IDT.2015.7396738
book article
4
book article
Multiple stuck-at-fault detection theorem
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia
2012
/
p. 236-241 : ill
book article
5
book article
Representing gate-level SET faults by multiple SEU faults on RT-level
Bagbaba, Ahmet Cagri
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Sauer, Christian
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings
2020
/
art. 19889351, 6 p. : ill
https://doi.org/10.1109/IOLTS50870.2020.9159715
book article
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
6
book article
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
book article
Number of records 6, displaying
1 - 6
keyword
65
1.
Avoiding Mutual Masking of Multiple Faults
2.
multiple faults
3.
Test Group Generation for Detecting Multiple Faults
4.
multiple-input multiple output system
5.
broken rotor bar faults
6.
circuit faults
7.
classification of faults
8.
control faults
9.
Cross-level Modeling of Faults in Digital Systems
10.
faults
11.
faults in power system
12.
hard-to-detect faults
13.
high impedance faults
14.
high-level control faults
15.
indefinite faults
16.
inter-disk and inter-turn faults
17.
localization of faults
18.
motor faults
19.
non-robust and functional sensitization of delay faults
20.
power distribution faults
21.
power system faults
22.
rotor faults
23.
Safe Faults
24.
Single Stuck-at Faults
25.
stuck-at-faults
26.
tectonic faults
27.
terms-transient faults
28.
transient faults
29.
transition delay faults
30.
unknown faults
31.
untestable faults
32.
carrier sense multiple access/collision avoidance (CSMA/CA)
33.
consistency in multiple microplastic datasets
34.
multiple
35.
multiple active bridge
36.
multiple case study
37.
Multiple cases study
38.
Multiple criteria analysis
39.
multiple criteria approach
40.
multiple criteria assessment
41.
multiple criteria decision making
42.
multiple criteria modeling
43.
multiple factorial analysis
44.
multiple headspace extraction
45.
multiple inheritance
46.
Multiple Linear Regression
47.
multiple melting events
48.
multiple regression models
49.
multiple scales
50.
multiple scattering
51.
multiple sclerosis
52.
multiple source localization
53.
multiple streams framework
54.
multiple stressor effect sizes
55.
multiple stressor effect types
56.
multiple stressors
57.
multiple UAVs
58.
Non Orthogonal Multiple Access (NOMA)
59.
nonorthogonal multiple access (NOMA)
60.
Non-Orthogonal Multiple Access (NOMA)
61.
Orthogonal Multiple Access (OMA)
62.
progressive-onset multiple sclerosis
63.
secondary progressive multiple sclerosis
64.
SSBDDs with multiple inputs
65.
time division multiple access (TDMA)
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