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1
book article
High-level modeling and testing of multiple control faults in digital systems
Jasnetski, Artjom
;
Oyeniran, Adeboye Stephen
;
Tšertov, Anton
;
Schölzel, Mario
;
Ubar, Raimund-Johannes
Formal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/DDECS.2016.7482445
book article
2
book article
How to prove that a circuit is fault-free?
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings : 15th Euromicro Conference on Digital System Design DSD 2012 : 5-8 September 2012, Cesme, Izmir, Turkey
2012
/
p. 427-430 : ill
https://www.researchgate.net/publication/262271409_How_to_Prove_that_a_Circuit_is_Fault-Free
book article
3
book article
Multiple fault testing in systems-on-chip with high-level decision diagrams
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
;
Schölzel, Mario
;
Vierhaus, Heinrich Theodor
Proceedings of 2015 10th International Design & Test Symposium (IDT) : Dead Sea, Jordan, 14-16 December 2015
2015
/
p. 66-71 : ill
http://dx.doi.org/10.1109/IDT.2015.7396738
book article
4
book article
Multiple stuck-at-fault detection theorem
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia
2012
/
p. 236-241 : ill
book article
5
book article
Representing gate-level SET faults by multiple SEU faults on RT-level
Bagbaba, Ahmet Cagri
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Sauer, Christian
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings
2020
/
art. 19889351, 6 p. : ill
https://doi.org/10.1109/IOLTS50870.2020.9159715
book article
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
6
book article
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
book article
Number of records 6, displaying
1 - 6
keyword
59
1.
multiple faults
2.
multiple-input multiple output system
3.
broken rotor bar faults
4.
circuit faults
5.
classification of faults
6.
control faults
7.
faults
8.
faults in power system
9.
hard-to-detect faults
10.
high impedance faults
11.
high-level control faults
12.
indefinite faults
13.
inter-disk and inter-turn faults
14.
localization of faults
15.
motor faults
16.
non-robust and functional sensitization of delay faults
17.
power distribution faults
18.
power system faults
19.
rotor faults
20.
Safe Faults
21.
Single Stuck-at Faults
22.
stuck-at-faults
23.
tectonic faults
24.
terms-transient faults
25.
transient faults
26.
transition delay faults
27.
unknown faults
28.
untestable faults
29.
carrier sense multiple access/collision avoidance (CSMA/CA)
30.
consistency in multiple microplastic datasets
31.
multiple
32.
multiple active bridge
33.
multiple case study
34.
Multiple cases study
35.
Multiple criteria analysis
36.
multiple criteria approach
37.
multiple criteria assessment
38.
multiple criteria decision making
39.
multiple criteria modeling
40.
multiple headspace extraction
41.
multiple inheritance
42.
Multiple Linear Regression
43.
multiple melting events
44.
multiple regression models
45.
multiple scales
46.
multiple scattering
47.
multiple sclerosis
48.
multiple source localization
49.
multiple streams framework
50.
multiple stressor effect sizes
51.
multiple stressor effect types
52.
multiple stressors
53.
Non Orthogonal Multiple Access (NOMA)
54.
nonorthogonal multiple access (NOMA)
55.
Non-Orthogonal Multiple Access (NOMA)
56.
Orthogonal Multiple Access (OMA)
57.
secondary progressive multiple sclerosis
58.
SSBDDs with multiple inputs
59.
time division multiple access (TDMA)
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