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book article

Accelerating transient fault injection campaigns by using Dynamic HDL SlicingBagbaba, Ahmet Cagri; Jenihhin, Maksim; Raik, Jaan; Sauer, Christian2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore2019 / 7 p. : ill https://doi.org/10.1109/NORCHIP.2019.8906932

book article
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
2

book article

Efficient fault injection based on dynamic HDL slicing techniqueBagbaba, Ahmet Cagri; Jenihhin, Maksim; Raik, Jaan; Sauer, Christian2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece2019 / p. 52-53 : ill https://doi.org/10.1109/IOLTS.2019.8854419

book article
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
3

book article

Enabling cross-layer reliability and functional safety assessment through ML-based compact modelsAlexandrescu, Dan; Balakrishnan, Aneesh; Lange, Thomas; Glorieux, MaximilienProceedings : 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design : IOLTS 2020, Napoli, Italy, July 13-16, 2020 : virtual edition2020 / 6 p. : ill https://doi.org/10.1109/IOLTS50870.2020.9159750

book article
Seotud publikatsioonid 1
- A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
4

book article

Machine learning to tackle the challenges of transient and soft errors in complex circuitsLange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Greece2019 / p. 7-14 : ill https://doi.org/10.1109/IOLTS.2019.8854423

book article
5

book article

On the estimation of complex circuits functional failure rate by machine learning techniquesLange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - DSN 2019 : Supplemental Volume : proceedings2019 / p. 35-41 : ill https://doi.org/10.1109/DSN-S.2019.00021

book article
Seotud publikatsioonid 1
- A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks

Number of records 5, displaying 1 - 5

1. terms-transient faults
2. transient faults
3. Alternative Transient Program-Electromagnetic Transient Program (ATP-EMTP)
4. boiler transient operation
5. broken rotor bar faults
6. circuit faults
7. classification of faults
8. combined relay protection and transient stability simulations
9. control faults
10. faults
11. faults in power system
12. hard-to-detect faults
13. high impedance faults
14. high-level control faults
15. indefinite faults
16. inter-disk and inter-turn faults
17. localization of faults
18. motor faults
19. multiple faults
20. non-robust and functional sensitization of delay faults
21. power distribution faults
22. power system faults
23. power system transient stability
24. probabilistic transient stability
25. rotor faults
26. Safe Faults
27. Single Event Transient (SET) and Soft Errors
28. Single Stuck-at Faults
29. stuck-at-faults
30. tectonic faults
31. transient analysis
32. transient computing
33. transient condition
34. transient fault mitigation
35. transient flow
36. transient heat conduction
37. transient microgrid stability
38. transient modes
39. transient overvoltage
40. transient pipe flow
41. transient processes
42. transient spectroscop
43. Transient stability
44. transient state
45. transient urbanity
46. transition delay faults
47. unknown faults
48. untestable faults
49. voltage transient

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