Raik, J., Repinski, U., Tšepurov, A., Hantson, H., Ubar, R., Jenihhin, M.

Automated design error debug using high-level decision diagrams and mutation operators

author

Raik, Jaan

Repinski, Urmas

Tšepurov, Anton

Hantson, Hanno

Ubar, Raimund-Johannes

Jenihhin, Maksim

statement of authorship

Jaan Raik, Urmas Repinski, Anton Chepurov, Hanno Hantson, Raimund Ubar, Maksim Jenihhin

source

Microprocessors and microsystems

journal volume number month

Vol. 37, 4-5

year of publication

2013

pages

p. 505-513 : ill

conference name, date

28th NORCHIP Conference, November 15-16, 2010

conference location

Tampere, Finland

subject term

integraallülitused

arvuti arhitektuur

vead

otsustusdiagrammid

algoritmid

programmeerimiskeeled

keyword

design errors

debug

mutation operators

high-level decision diagrams

ISSN

0141-9331

notes

Bibliogr.: 29 ref

Special issue on NORCHIP 2012

TTÜ department

arvutitehnika instituut

language

inglise

Raik, J., Repinski, U., Tšepurov, A., Hantson, H., Ubar, R., Jenihhin, M. Automated design error debug using high-level decision diagrams and mutation operators // Microprocessors and microsystems (2013) Vol. 37, 4-5, p. 505-513 : ill.