Automated design error debug using high-level decision diagrams and mutation operators
author
statement of authorship
Jaan Raik, Urmas Repinski, Anton Chepurov, Hanno Hantson, Raimund Ubar, Maksim Jenihhin
journal volume number month
Vol. 37, 4-5
year of publication
pages
p. 505-513 : ill
conference name, date
28th NORCHIP Conference, November 15-16, 2010
conference location
Tampere, Finland
ISSN
0141-9331
notes
Bibliogr.: 29 ref
Special issue on NORCHIP 2012
language
inglise
subject term
keyword
TTÜ department
Raik, J., Repinski, U., Tšepurov, A., Hantson, H., Ubar, R., Jenihhin, M. Automated design error debug using high-level decision diagrams and mutation operators // Microprocessors and microsystems (2013) Vol. 37, 4-5, p. 505-513 : ill.