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Rang, Toomas (TTÜ author)

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251

book article

Study of surface defects in 4H-SiC Schottky diodes using a scanning Kelvin probeMizsei, Janos; Korolkov, Oleg; Toompuu, Jana; Mikli, Valdek; Rang, ToomasSilicon Carbide and Related Materials 2012 : selected peer reviewed papers from the 9th European Conference on Silicon Carbide and Related Materials (ECSCRM 2012), September 2-6, 2012, St. Petersburg, Russian Federation2013 / p. 677-680 : ill

book article
252

book article

Subcontact layers in LPE structures for forming the ohmic contacts on GaAs semiconductor substratesKorolkov, Oleg; Voitovitš, Viktor; Rang, ToomasAbstract book of 13th American Conference on Crystal Growth and Epitaxy : August 12-16, 2001, Burlington, Vermont, USA2001 / p. 133

book article
253

newspaper article

Sulle, abiturient! : Üliõpilaste vastuvõtt 1991. aRang, ToomasTehnikaülikool1991 / 25. apr., lk. 1-2

newspaper article
254

book article

Tallinna Tehnikaülikool ja Elcoteq Tallinn AS elektroonikainseneride ettevalmistuse ühisrindelRang, ToomasElektroonika 2000 : VII rahvusvahelise telekommunikatsioonipäeva konverentsi ettekannete materjalid2000 / lk. 19-20 https://www.ester.ee/record=b1399956*est

book article
255

newspaper article

Tartu diooditegija trügib ainulaadse tehnoloogiaga maailmaturule : [firma Clifton nõukogu liikme Toomas Rangi kommentaariga]Paris, Krister; Aru, Erik; Rang, ToomasPõhjarannik2005 / 23. märts, Ärileht, lk. 3

newspaper article
256

book article

Tehnikateadused. ElektrotehnikaRang, ToomasEesti entsüklopeedia. 11, Eesti üld2002 / lk. 500

book article
257

newspaper article

Tehnikaülikool võitis EL hanke eurode tuvastamiseks : [intervjuu TTÜ elektroonikainstituudi direktori Toomas Rangiga ja professor Mart Min'iga]Rang, Toomas; Ummelas, Mart; Min, MartMente et Manu2008 / 30. jaan., lk. 3 https://artiklid.elnet.ee/record=b1118469*est

newspaper article
258

newspaper article

Tehnikaülikooli rektori järjekordsed valimised, ehk, Kuidas paistavad järgmise rektori ülesanded "altpoolt" vaadatunaRang, ToomasTehnikaülikool1999 / 22. nov., lk. 4-7: portr

newspaper article
259

book article

Temperature effects in alloy metal and 6H-SiC substrate Schottky contacts caused by the current suppressing effectRang, Toomas; Blum, AlfonsProceedings of the International Conference and Exhibition Micro Materials : MicroMat '97, April 16-18, 1997, Berlin, Germany1997 / p. 591-596

book article
260

book article

Temperature influence on current suppressing effect in SiC Schottky diodeKurel, Raido; Rang, ToomasProceedings of the 3rd International Conference and Exhibition Micro Materials : MicroMat2000 : April 17-19, 2000, Berlin, Germany2000 / p. 1208-1209

book article
261

book article

Temperature influence on current suppressing effect in SiC Schottky diodeKurel, Raido; Rang, ToomasAbstracts of the 3rd International Conference and Exhibition Micro Materials : MicroMat2000 : April 17-19, 2000, Berlin, Germany2000 / p. 217-218

book article
262

book

The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedingsRang, Toomas2000 https://www.ester.ee/record=b2150914*est

book
263

book article

The basic parameters of diffusion welded Al Schottky contacts to p- and n-SiCKorolkov, Oleg; Ruut, Jana; Kuznetsova, Natalja; Rang, ToomasSilicon Carbide and Related Materials 20032004 / p. 857-860 https://doi.org/10.4028/www.scientific.net/MSF.457-460.857

book article
264

book article

The basic Schottky parameters for combined diffusion welded and sputter metal contactsKuznetsova, Natalja; Korolkov, Oleg; Rang, Toomas; Pikkov, MihhailBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 47-50 : ill

book article
265

journal article

The d.c. modeling of I²L with the non-linear circuit analysis program TRANZ-TRANRang, ToomasPeriodica polytechnica. Electrical engineering = Электротехника1981 / p. 103-114 : joon https://www.ester.ee/record=b1198855*est https://pp.bme.hu/ee/article/view/4771/3876

journal article
266

book article

The dependence of reverse recovery time on barrier capacitance and series on-resistance in Schottky diodesVeher, Oleksandr; Sleptšuk, Natalja; Toompuu, Jana; Korolkov, Oleg; Rang, ToomasMaterials and contact characterisation VIII2017 / p. 15-22 : ill http://dx.doi.org/10.2495/MC170021

book article
267

book article

The electrotechnical and electronics industryRang, ToomasTechnology policy for improving competitiveness of Estonian industries1996 / p. 60-65

book article
268

book article

The measurement and tuning of SiC diode voltage doubler represented as diffusion-welded stack [Online resource]Toompuu, Jana; Sleptšuk, Natalja; Land, Raul; Korolkov, Oleg; Rang, ToomasBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p.: ill https://doi.org/10.1109/BEC.2018.8600963

book article
269

book article

The permeable base transistorKoel, Ants; Nilsson, H.H.; Masszi, F.; Rang, ToomasBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 287-290: ill

book article
270

book article

The Schottky parameter test for combined diffusion welded and sputter large area contactsKorolkov, Oleg; Kuznetsova, Natalja; Rang, Toomas; Syrkin, A.; Dmitriev, V.Silicon carbide and related materials2007 / p. 737-740 https://www.scientific.net/MSF.556-557.737

book article
271

journal article

The specificity of solid-phase interaction of aluminium with silicon carbide in the manufacture of diffusion-welded contacts to semiconductor devicesSleptšuk, Natalja; Korolkov, Oleg; Toompuu, Jana; Rang, Toomas; Mikli, ValdekElektronika ir elektrotechnika = Electronics and electrical engineering2012 / p. 45-48 : ill https://eejournal.ktu.lt/index.php/elt/article/view/2610

journal article
272

journal article EST / journal article ENG

Thermal analysis of a disposable, instrument-free DNA amplification lab-on-a-chip platformPardy, Tamas; Rang, Toomas; Tulp, IndrekSensors2018 / art. 1812, 13 p. : ill https://doi.org/10.3390/s18061812 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Artice at WOS

journal article EST / journal article ENG
273

book

Toode ja tootmine elektroonikas : abimaterjal ainele "Elektroonikaskeemide tehnoloogiad"2003 http://www.ester.ee/record=b1766950*est

book
274

book

TRANZ-TRAN : mittelineaarsete skeemide analüüsi programm : kasutusjuhend1983 https://www.ester.ee/record=b1255945*est

book
275

book

TRANZ-TRAN mittelineaarsete skeemide analüüsi programm : kasutusjuhend1986 https://www.ester.ee/record=b1205915*est

book

Number of records 327, displaying 251 - 275

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