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226
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
227
book article
Implementation-independent test generation for a large class of faults in RISC processor modules
Jenihhin, Maksim
;
Oyeniran, Adeboye Stephen
;
Raik, Jaan
;
Ubar, Raimund-Johannes
24th Euromicro Conference on Digital System Design (DSD)
2021
https://doi.org/10.1109/DSD53832.2021.00090
book article
228
book article
An improved estimation methodology for hybrid BIST cost calculation
Jervan, Gert
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Korelina, Olga
Proceedings [of] 22nd NORCHIP Conference : Oslo, Norway, 8-9 November 2004
2004
/
p. 297-300 : ill
https://ieeexplore.ieee.org/document/1423882
book article
229
journal article EST
/
journal article ENG
Improved fault classification and localization in power transmission networks using vae-generated synthetic data and machine learning algorithms
Khan, Muhammad Amir
;
Asad, Bilal
;
Vaimann, Toomas
;
Kallaste, Ants
;
Pomarnacki, Raimondas
;
Hyunh, Van Khang
Machines
2023
/
art. 963
https://doi.org/10.3390/machines11100963
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
230
book article
Improved fault emulation for synchronous sequential circuits
Raik, Jaan
;
Ellervee, Peeter
;
Tihhomirov, Valentin
;
Ubar, Raimund-Johannes
Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 2005
2005
/
p. 72-78 : ill
book article
231
book article
Improving the confidence level in functional safety simulation tools for ISO 26262
Bagbaba, Ahmet Cagri
;
Augusto da Silva, Felipe
;
Sauer, Christian
2018 Design and Verification Conference (DVCON) Europe : [proceedings]
2018
/
6 p. : ill
https://dvcon-proceedings.org/document/improving-the-confidence-level-in-functional-safety-simulation-tools-for-iso-26262/
https://zenodo.org/record/3361607#.Y0PHFnZByHs
book article
Related publications
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
232
dissertation
Insulation durability and measurement of partial discharge = Isolatsiooni vastupidavus ja osalahenduste mõõtmine
Kiitam, Ivar
2021
https://www.ester.ee/record=b5473274*est
https://digikogu.taltech.ee/et/Item/401e6d0b-f51d-488f-b0d6-2e2bdb8f9496
https://doi.org/10.23658/taltech.62/2021
dissertation
233
book article
Integrated modelling, fault management, verification and reliable design environment for cyber-physical systems
Raik, Jaan
;
Rauwerda, Gerard
;
Zhao, Yong
;
Shibin, Konstantin
MEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia
2015
/
p. 74
book article
234
book article
Intelligent diagnostic centers: a new way to distributed fault-tolerance
Varkonyi-Koczy, Annamaria R.
;
Tilly, K.
;
Dobrowiecki, Tadeusz
;
Vadasz, B.
;
Kiss, I.
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 365-368: ill
book article
235
book article
Internet based test generation and fault simulation
Ivask, Eero
;
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Schneider, Andre
IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001
2001
/
p. 57-60 : ill
book article
236
book article
Internet-based collaborative test generation with MOSCITO [Electronic resource]
Schneider, Andre
;
Ivask, Eero
;
Miklos, P.
;
Raik, Jaan
;
Diener, Karl-Heinz
;
Ubar, Raimund-Johannes
;
Cibakova, Tatiana
;
Gramatova, Elena
SIGDA publications on CD-ROM : DATE'02 : Design, Automation and Test in Europe, Paris, France, March 4-8, 2002
2002
/
[6] p. [CD-ROM]
https://www.cecs.uci.edu/~papers/date07/PAPERS/2002/DATE02/PDFFILES/02E_2.PDF
book article
237
journal article EST
/
journal article ENG
Investigating the progression of insulation degradation in power cable based on partial discharge measurements
Hassan, Waqar
;
Shafiq, Muhammad
;
Hussain, Ghulam Amjad
;
Choudhary, Maninder
;
Palu, Ivo
Electric power systems research
2023
/
art. 109452
https://doi.org/10.1016/j.epsr.2023.109452
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
238
book article
Invited paper: System-Wide Fault Management based on IEEE P1687 IJTAG
Jutman, Artur
;
Devadze, Sergei
;
Aleksejev, Jevgeni
6th International Workshop on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC) : 20-22 June 2011, Montpeillier, France
2011
/
[4] p.: ill
https://ieeexplore.ieee.org/document/5981520
book article
239
dissertation
IoT based tools and methods for electrical machine diagnostics = Asjade interneti põhised tööriistad ja meetodid elektrimasinate diagnostikaks
Raja, Hadi Ashraf
2023
https://doi.org/10.23658/taltech.20/2023
https://digikogu.taltech.ee/et/Item/3015334f-c32b-43ae-ba2d-bfcda536aba5
https://www.ester.ee/record=b5558656*est
dissertation
Related publications
7
IoT based tools for data acquisition in electrical machines and robotics
Fault detection and predictive maintenance of electrical machines : perspective chapter
Condition monitoring and fault detection for electrical machines using IOT
Cost-efficient real-time condition monitoring and fault diagnostics system for BLDC motor using IoT and Machine learning
Custom simplified machine learning algorithms for fault diagnosis in electrical machines
Signal spectrum-based machine learning approach for fault prediction and maintenance of electrical machines
A current spectrum-based algorithm for fault detection of electrical machines using low-power data acquisition devices
240
book article
Kordsete rikete diagnostika järjestiklülitustes
Puulinn, S.
;
Ubar, Raimund-Johannes
XXIX vabariiklik üliõpilaste teaduslik- tehniline konverents 30. märtsist - 1. aprillini 1977 : ettekannete teesid
1977
/
lk. 43
https://www.ester.ee/record=b2449987*est
book article
241
book article
Kui pikk peab olema elektrikatkestus
Valdna, Vello
Tallinna Tehnikaülikooli aastaraamat 2003
2004
/
lk. 169-170
book article
242
newspaper article
Kui pikk peab olema elektrikatkestus : [poliitikud peavad väärtustama reaalharidust, insenerikoolitust ja tehnikateadusi]
Valdna, Vello
Postimees
2003
/
23. sept., lk. 13
https://arvamus.postimees.ee/2049577/kui-pikk-peab-olema-elektrikatkestus
newspaper article
243
newspaper article
Kuidas teha peedist pesumasinale trumlit? Auvere elektrijaam neelab veel miljoneid ega hakka niipea normaalselt tööle!
Niitra, Nils
ohtuleht.ee
2023
/
lk. 4-5
Kuidas teha peedist pesumasinale trumlit? Auvere elektrijaam neelab veel miljoneid ega hakka niipea normaalselt tööle!
newspaper article
244
journal article
Kuumvahetusmoodulid
Toomsalu, Arvo
A & A
1999
/
4, lk. 13-15
https://artiklid.elnet.ee/record=b1002041*est
journal article
245
book article
Localization of single-gate design errors in combinational circuits by diagnostic information about stuck-at faults
Ubar, Raimund-Johannes
;
Borrione, Dominique
Proceedings of the 2nd International Workshop on Design and Diagnostics of Electronic Circuits and Systems, Szczyrk, Poland, September 2-4, 1998
1998
/
p. 73-79
https://www.researchgate.net/publication/238687832_Localization_of_Single_Gate_Design_Errors_in_Combinational_Circuits_by_Diagnostic_Information_about_Stuck-at_Faults
book article
246
book article
Logic simulation and fault collapsing with shared structurally synthesized BDDs
Mironov, Dmitri
;
Ubar, Raimund-Johannes
;
Raik, Jaan
2014 19th IEEE European Test Symposium (ETS) : May 26th-30th, 2014, Paderborn, Germany : proceedings
2014
/
[2] p. : ill
book article
247
book article
Logic-based implementation of fault-tolerant routing in 3D Network-on-Chips
Niazmand, Behrad
;
Azad, Siavoosh Payandeh
;
Flich, Jose
;
Raik, Jaan
;
Jervan, Gert
;
Hollstein, Thomas
2016 Tenth IEEE/ACM International Symposium on Networks-on-Chip (NOCS) : Nara, Japan, 31 August - 2 September 2016
2016
/
[8] p. : ill
https://doi.org/10.1109/NOCS.2016.7579317
book article
248
journal article
Londoni kiirabi automaatse edastussüsteemi läbikukkumine 1992. aastal
Nestor, Triin
A & A
2007
/
5, lk. 18-27
https://artiklid.elnet.ee/record=b1021106*est
journal article
249
book article
Machine learning clustering techniques for selective mitigation of critical design features
Lange, Thomas
;
Balakrishnan, Aneesh
;
Glorieux, Maximilien
;
Alexandrescu, Dan
;
Sterpone, Luca
Proceedings : 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design : IOLTS 2020, Napoli, Italy, July 13-16, 2020 : virtual edition
2020
/
7 p. : ill
https://doi.org/10.1109/IOLTS50870.2020.9159751
book article
250
book article
Machine learning to tackle the challenges of transient and soft errors in complex circuits
Lange, Thomas
;
Balakrishnan, Aneesh
;
Glorieux, Maximilien
;
Alexandrescu, Dan
;
Sterpone, Luca
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Greece
2019
/
p. 7-14 : ill
https://doi.org/10.1109/IOLTS.2019.8854423
book article
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