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High level fault modeling in digital systemsUbar, Raimund-Johannes; Aarna, Margit; Brik, Marina; Raik, JaanSynergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 22004 / p. 486-491

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177

book article

High-frequency current sensor for power network on-line mea[s]urementsKütt, Lauri; Järvik, Jaan; Vaimann, Toomas; Shafiq, Muhammad; Lehtonen, Matti; Kilter, JakoProceedings of the 13th International Scientific Conference Electric Power Engineering 2012 : EPE 2012 : Brno. Vol. 12012 / p. 367-371 : ill https://www.researchgate.net/publication/262674502_High-Frequency_Current_Sensor_for_Power_Network_On-line_Measurements

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178

book article

High-level decision diagram based fault models for targeting FSMsRaik, Jaan; Ubar, Raimund-Johannes; Viilukas, Taavi9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings2006 / p. 353-358 : ill http://dx.doi.org/10.1109/DSD.2006.60

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179

book article

High-level design error diagnosis using backtrace on decision diagramsRaik, Jaan; Repinski, Urmas; Ubar, Raimund-Johannes; Jenihhin, Maksim; Tšepurov, Anton28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers2010 / [4] p. : ill http://dx.doi.org/10.1109/NORCHIP.2010.5669486

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180

book article

High-level fault diagnosis in RISC processors with Implementation-Independent Functional TestOyeniran, Adeboye Stephen; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 20222022 / p. 32-37 https://doi.org/10.1109/ISVLSI54635.2022.00019

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181

book article

High-level functional test generation for microprocessor modulesOyeniran, Adeboye Stephen; Ubar, Raimund-JohannesProceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 20192019 / p. 356-361 : ill https://doi.org/10.23919/MIXDES.2019.8787131

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182

book article

High-level modeling and testing of multiple control faults in digital systemsJasnetski, Artjom; Oyeniran, Adeboye Stephen; Tšertov, Anton; Schölzel, Mario; Ubar, Raimund-JohannesFormal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia2016 / [6] p. : ill http://dx.doi.org/10.1109/DDECS.2016.7482445

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183

book article

High-level test generation for processing elements in many-core systemsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Azad, Siavoosh Payandeh; Raik, Jaan12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings2017 / 8 p. : ill http://dx.doi.org/10.1109/ReCoSoC.2017.8016156

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184

journal article

Holistic approach for Fault-Tolerant Network-on-Chip based many-core systems [Online resource]Azad, Siavoosh Payandeh; Niazmand, Behrad; Raik, Jaan; Jervan, Gert; Hollstein, ThomasarXiv.org2016 / [8] p. : ill

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185

dissertation

Hybrid built-in self-test : methods and tools for analysis and optimization of BIST = Sisseehitatud hübriidne isetestimine : meetodid ja vahendid analüüsiks ning optimeerimiseksOrasson, Elmet2007 https://www.ester.ee/record=b2305436*est

dissertation

186

book article

Hybrid FEA-Simulink modelling of permanent magnet assisted synchronous reluctance motor with unbalanced magnet fluxPando-Acedo, Jaime; Rassõlkin, Anton; Lehikoinen, Antti; Vaimann, Toomas; Kallaste, Ants; Romero-Cadaval, Enrique; Belahcen, Anouar2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED), 27-30 Aug. 2019, Toulouse, France : proceedings2019 / p. : 174-180 : ill https://doi.org/10.1109/DEMPED.2019.8864925

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187

journal article EST / journal article ENG

Identification and location of PD defects in medium voltage underground power cables using high frequency current transformerShafiq, Muhammad; Kiitam, Ivar; Taklaja, Paul; Kütt, Lauri; Kauhaniemi, Kimmo; Palu, IvoIEEE Access2019 / art. 8771171, p. 103608 - 103618 : ill https://doi.org/10.1109/ACCESS.2019.2930704 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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188

book article

Impact of faults and different operating conditions on current parameters in case of broken rotor barsKudelina, Karolina21st International Symposium "Topical problems in the field of electrical and power engineering. Doctoral school of energy and geotechnology. III" : Pärnu, Estonia, June 15-18, 20222022 / p. 41-42 : ill https://www.ester.ee/record=b5504019*est

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189

book article

Implementation-independent functional test generation for RISC microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]2019 / p. 82-87 : ill https://doi.org/10.1109/VLSI-SoC.2019.8920323

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190

book article

Implementation-independent test generation for a large class of faults in RISC processor modulesJenihhin, Maksim; Oyeniran, Adeboye Stephen; Raik, Jaan; Ubar, Raimund-Johannes24th Euromicro Conference on Digital System Design (DSD)2021 https://doi.org/10.1109/DSD53832.2021.00090

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191

book article

An improved estimation methodology for hybrid BIST cost calculationJervan, Gert; Peng, Zebo; Ubar, Raimund-Johannes; Korelina, OlgaProceedings [of] 22nd NORCHIP Conference : Oslo, Norway, 8-9 November 20042004 / p. 297-300 : ill https://ieeexplore.ieee.org/document/1423882

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192

journal article EST / journal article ENG

Improved fault classification and localization in power transmission networks using vae-generated synthetic data and machine learning algorithmsKhan, Muhammad Amir; Asad, Bilal; Vaimann, Toomas; Kallaste, Ants; Pomarnacki, Raimondas; Hyunh, Van KhangMachines2023 / art. 963 https://doi.org/10.3390/machines11100963 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

193

book article

Improved fault emulation for synchronous sequential circuitsRaik, Jaan; Ellervee, Peeter; Tihhomirov, Valentin; Ubar, Raimund-JohannesProceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 72-78 : ill

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194

book article

Improving the confidence level in functional safety simulation tools for ISO 26262Bagbaba, Ahmet Cagri; Augusto da Silva, Felipe; Sauer, Christian2018 Design and Verification Conference (DVCON) Europe : [proceedings]2018 / 6 p. : ill https://dvcon-proceedings.org/document/improving-the-confidence-level-in-functional-safety-simulation-tools-for-iso-26262/ https://zenodo.org/record/3361607#.Y0PHFnZByHs

book article

Seotud publikatsioonid 1

Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

195

dissertation

Insulation durability and measurement of partial discharge = Isolatsiooni vastupidavus ja osalahenduste mõõtmineKiitam, Ivar2021 https://www.ester.ee/record=b5473274*est https://digikogu.taltech.ee/et/Item/401e6d0b-f51d-488f-b0d6-2e2bdb8f9496 https://doi.org/10.23658/taltech.62/2021

dissertation

196

book article

Integrated modelling, fault management, verification and reliable design environment for cyber-physical systemsRaik, Jaan; Rauwerda, Gerard; Zhao, Yong; Shibin, KonstantinMEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia2015 / p. 74

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197

book article

Intelligent diagnostic centers: a new way to distributed fault-toleranceVarkonyi-Koczy, Annamaria R.; Tilly, K.; Dobrowiecki, Tadeusz; Vadasz, B.; Kiss, I.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 365-368: ill

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198

book article

Internet based test generation and fault simulationIvask, Eero; Ubar, Raimund-Johannes; Raik, Jaan; Schneider, AndreIEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 20012001 / p. 57-60 : ill

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199

book article

Internet-based collaborative test generation with MOSCITO [Electronic resource]Schneider, Andre; Ivask, Eero; Miklos, P.; Raik, Jaan; Diener, Karl-Heinz; Ubar, Raimund-Johannes; Cibakova, Tatiana; Gramatova, ElenaSIGDA publications on CD-ROM : DATE'02 : Design, Automation and Test in Europe, Paris, France, March 4-8, 20022002 / [6] p. [CD-ROM] https://www.cecs.uci.edu/~papers/date07/PAPERS/2002/DATE02/PDFFILES/02E_2.PDF

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200

journal article EST / journal article ENG

Investigating the progression of insulation degradation in power cable based on partial discharge measurementsHassan, Waqar; Shafiq, Muhammad; Hussain, Ghulam Amjad; Choudhary, Maninder; Palu, IvoElectric power systems research2023 / art. 109452 https://doi.org/10.1016/j.epsr.2023.109452 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

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