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151

book article

Fast fault emulation for synchronous sequential circuitsRaik, Jaan; Ellervee, Peeter; Tihhomirov, Valentin; Ubar, Raimund-JohannesProceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 20042004 / p. 35-40 https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=a6eb712498a5f23db3f95ad66bada257c21e96f0

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152

journal article EST / journal article ENG

Fast identification of true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, Jaan; Jürimägi, LembitMicroelectronics reliability2018 / p. 252-261 : ill https://doi.org/10.1016/j.microrel.2017.11.027 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

153

book article

Fast static compaction of tests composed of independent sequences : basic properties and comparison of methodsRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesThe 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume II2002 / p. 445-448 : ill http://dx.doi.org/10.1109/ICECS.2002.1046190 https://ieeexplore.ieee.org/document/1046190

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154

book article

Fast test cost calculation for hybrid BIST in digital systemsOrasson, Elmet; Raidma, Rein; Ubar, Raimund-Johannes; Jervan, Gert; Peng, ZeboEuromicro Symposium on Digital Systems Design : [Architectures, Methods and Tools : DSD 2001] : September 4-6, 2001, Warsaw, Poland : proceedings2001 / p. 318-325 : ill https://www.semanticscholar.org/paper/Fast-test-cost-calculation-for-hybrid-BIST-in-Orasson-Raidma/5aafcda5a18c2aabf0ad20cac10af10727f3c58f

book article

155

journal article

Fast test pattern generation for sequential circuits using decision diagram representationsRaik, Jaan; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications (JETTA)2000 / 3, p. 213-226 : ill https://link.springer.com/article/10.1023/A:1008335130158

journal article

156

book article

Fault collapsing with linear complexity in digital circuitsUbar, Raimund-Johannes; Mironov, Dmitri; Raik, Jaan; Jutman, ArturProceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010, Paris, France2010 / p. 653-656 : ill https://ieeexplore.ieee.org/document/5537504

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157

journal article

Fault effect reasoning in digital systems by topological view on low- and high-level decision diagramsUbar, Raimund-JohannesВестник Томского государственного университета. Управление, вычислительная техника и информатика2014 / p. 99-113 : ill http://journals.tsu.ru/informatics/&journal_page=archive&id=923&article_id=12107

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158

book article

Fault oriented test pattern generation for sequential circuits using genetic algorithmsIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop2000 / p. 319-320

book article

159

dissertation

Fault simulation and code coverage analysis of RTL designs using high-level decision diagrams = Rikete simuleerimine ja koodikatte analüüs register-siirde tasemel kasutades kõrgtaseme otsustusdiagrammeReinsalu, Uljana2013 https://www.ester.ee/record=b2963595*est

dissertation

160

dissertation

Fault simulation of digital systems = Digitaalsüsteemide rikete simuleerimineDevadze, Sergei2009 https://digi.lib.ttu.ee/i/?445 https://www.ester.ee/record=b2508727*est

dissertation

161

book article

Fenoolide ning klorofenoolide osoonimise produktide toksilisuse uurimine Daphnia magna testigaTrapido, Marina; Veressinina, JelenaXXIII Eesti keemiapäevad : teaduskonverentsi ettekannete referaadid1997 / lk. 140

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162

book article

Field work in the role of teaching and research of rock propertiesKaru, Veiko; Kolats, Margit; Väizene, Vivika; Anepaio, Ain; Valgma, Ingo5th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology : Kuressaare, January 14-19, 20082008 / p. 66-70 : ill

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163

journal article EST / journal article ENG

Fire tests on glued-laminated timber beams with specific local material propertiesFahrni, Reto; Klippel, Michael; Just, Alar; Ollinoc, A.; Frangi, AndreaFire safety journal2019 / p. 161-169 : ill https://doi.org/10.1016/j.firesaf.2017.11.003 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

164

book article

Fire-separating assembliesWerther, Norman; Dagenais, Christian; Just, Alar; Wade, ColleenFire safe use of wood in buildings : global design guide2022 / p. 193-226 : ill https://doi.org/10.1201/9781003190318-6

book article

165

book article

First results from a benchmarking of quality control frameworksKedar, A.; Sein, SanderLife cycle analysis and assessment in civil engineering: towards an integrated vision : proceedings of the Sixth International Symposium on Life-Cycle Civil Engineering (IALCCE 2018), 28-31 October 2018, Ghent, Belgium2019 / p. 1799−1804 : ill https://www.taylorfrancis.com/books/9781351857574

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166

journal article EST / journal article ENG

FOPID controllers and their industrial applications: a survey of recent resultsTepljakov, Aleksei; Alagoz, Baris Baykant; Petlenkov, EduardIFAC-PapersOnLine2018 / p. 25-30 https://doi.org/10.1016/j.ifacol.2018.06.014 Conference proceedings at Scopus Article at Scopus Article at WOS

journal article EST / journal article ENG

167

book

Formal Techniques for Networked and Distributed Systems - FORTE 2007 : 27th IFIP WG 6.1 International Conference : Tallinn, Estonia, June 27-29, 2007 : proceedingsDerrick, John; Vain, Jüri2007 https://www.ester.ee/record=b2286028*est

book

168

dissertation

FPGA-based embedded virtual instrumentation = FPGA-sisesed virtuaalsed test- ja mõõtevahendidAleksejev, Igor2013 http://www.ester.ee/record=b2927687*est

dissertation

169

journal article

FPGA-based fault emulation of synchronous sequential circuitsEllervee, Peeter; Raik, Jaan; Tammemäe, Kalle; Ubar, Raimund-JohannesIET computers and digital techniques2007 / 2, p. 70-76 : ill https://ieeexplore.ieee.org/abstract/document/1423822

journal article

170

journal article

Fracture micromechanism of Cu-Cr-Zr system by "in-situ tensile test in SEM"Besterci, Michal; Ivan, Jozef; Kulu, Priit; Arensburger, Daniil; Velgosova, OksanaActa metallurgica Slovaca2000 / p. 20-24

journal article

171

book article

A framework for improving web application user interfaces through immediate evaluationMarenkov, Jevgeni; Robal, Tarmo; Kalja, AhtoDatabases and information systems IX : selected papers from the twelfth International Baltic Conference, DB&IS 20162016 / p. 283-296 : ill https://doi.org/10.3233/978-1-61499-714-6-283

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172

book article

Fully synchronized acoustomechanical testing of skin : biomechanical measurements of nonclassical nonlinear parametersLints, Martin; Dos Santos, Serge; Kozena, Colette; Kus, Vaclav; Salupere, Andrus24th International Congress on Sound and Vibration 2017 (ICSV 24) : London, United Kingdom, 23-27 July 2017. Vol. 32017 / p. 1970-1977 : ill https://www.iiav.org/archives_icsv_last/2017_icsv24/content/papers/papers/full_paper_867_20170403135841549.pdf

book article

173

journal article

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill http://dx.doi.org/10.1016/j.micpro.2014.11.002

journal article

174

book article

Functional test generation for finite state machinesUbar, Raimund-Johannes; Brik, Marina; Jutman, Artur; Raik, Jaan; Bengtsson, Tomas; Kumar, ShashiBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 205-208 : ill

book article

175

book article

Generating optimal test cases for real-time systems using DIVINE model checkerPal, Deepak; Vain, JüriBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 99-102 : ill http://www.ester.ee/record=b2150914*est

book article

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