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Experimental testing of exterior wall mounted mechanical ventilation exhaust air outlet devicesPalmiste, Ülar; Meier, Tauno; Kurnitski, Jarek; Voll, HendrikE3S Web Conference: Cold Climate HVAC and Energy 20212021 / art. 02001, 8 p. : ill https://doi.org/10.1051/e3sconf/202124602001 Conference Proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG

202

book article

Exploiting aspects in model-based testingSarna, Külli; Vain, JüriFOAL'12 : proceedings of the eleventh workshop on Foundations of Aspect-Oriented Languages : March 26, 2012, Potsdam, German2012 / p. 45-47 : ill https://www.researchgate.net/publication/254007794_Exploiting_aspects_in_model-based_testing

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203

book article

An external diagnosis method for network-on-a-chipRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesIEEE/ACM Design Automation and Test in Europe, Workshop on Diagnostic Services in Networks-on-Chips - Test, Debug and On-line Monitoring : April 16-20, 2007, Nice, France2007 / [2] p. : ill

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204

book article

Fast and efficient static compaction of test sequences based on greedy algorithmsRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesIEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 20012001 / p. 117-122 https://slideplayer.com/slide/9971880/#google_vignette

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205

book article

Fast extended test access via JTAG and FPGAsDevadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund-JohannesInternational Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings2009 / p. 1-7 : ill http://dx.doi.org/10.1109/TEST.2009.5355668

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206

book article

Fast fault emulation for synchronous sequential circuitsRaik, Jaan; Ellervee, Peeter; Tihhomirov, Valentin; Ubar, Raimund-JohannesProceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 20042004 / p. 35-40 https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=a6eb712498a5f23db3f95ad66bada257c21e96f0

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207

journal article EST / journal article ENG

Fast identification of true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, Jaan; Jürimägi, LembitMicroelectronics reliability2018 / p. 252-261 : ill https://doi.org/10.1016/j.microrel.2017.11.027 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

208

book article

Fast static compaction of test sequences using implications and greedy searchRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesETW 2001 : IEEE European Test Workshop : Stockholm, May 29 June 1, 2001 : informal digest2001 / p. 207-209 : ill https://www.semanticscholar.org/paper/Fast-Static-Compaction-of-Test-Sequences-using-and-Raik-Jutman/3a7a8ddda6e63d3e2fde0c8650d4518851746221

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209

book article

Fast static compaction of tests composed of independent sequences : basic properties and comparison of methodsRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesThe 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume II2002 / p. 445-448 : ill http://dx.doi.org/10.1109/ICECS.2002.1046190 https://ieeexplore.ieee.org/document/1046190

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210

book article

Fast test cost calculation for hybrid BIST in digital systemsOrasson, Elmet; Raidma, Rein; Ubar, Raimund-Johannes; Jervan, Gert; Peng, ZeboEuromicro Symposium on Digital Systems Design : [Architectures, Methods and Tools : DSD 2001] : September 4-6, 2001, Warsaw, Poland : proceedings2001 / p. 318-325 : ill https://www.semanticscholar.org/paper/Fast-test-cost-calculation-for-hybrid-BIST-in-Orasson-Raidma/5aafcda5a18c2aabf0ad20cac10af10727f3c58f

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211

journal article

Fast test pattern generation for sequential circuits using decision diagram representationsRaik, Jaan; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications (JETTA)2000 / 3, p. 213-226 : ill https://link.springer.com/article/10.1023/A:1008335130158

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212

book article

Fault collapsing with linear complexity in digital circuitsUbar, Raimund-Johannes; Mironov, Dmitri; Raik, Jaan; Jutman, ArturProceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010, Paris, France2010 / p. 653-656 : ill https://ieeexplore.ieee.org/document/5537504

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213

journal article

Fault effect reasoning in digital systems by topological view on low- and high-level decision diagramsUbar, Raimund-JohannesВестник Томского государственного университета. Управление, вычислительная техника и информатика2014 / p. 99-113 : ill http://journals.tsu.ru/informatics/&journal_page=archive&id=923&article_id=12107

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214

book article

Fault model and test synthesis for RISC-processorsUbar, Raimund-Johannes; Markus, Antti; Jervan, Gert; Raik, JaanBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 229-232: ill

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215

book article

Fault modeling and test generation with low- and high-level decision diagramsUbar, Raimund-Johannes24. GI/GMM/ITG-Workshop : Testmethoden und Zuverlässigkeit von Schaltungen und Systemen2012 / p. 1-12

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216

book article

Fault oriented test pattern generation for sequential circuits using genetic algorithmsIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop2000 / p. 319-320

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217

dissertation

Fault simulation and code coverage analysis of RTL designs using high-level decision diagrams = Rikete simuleerimine ja koodikatte analüüs register-siirde tasemel kasutades kõrgtaseme otsustusdiagrammeReinsalu, Uljana2013 https://www.ester.ee/record=b2963595*est

dissertation

218

dissertation

Fault simulation of digital systems = Digitaalsüsteemide rikete simuleerimineDevadze, Sergei2009 https://digi.lib.ttu.ee/i/?445 https://www.ester.ee/record=b2508727*est

dissertation

219

book article

Feasibility of structurally synthesized BDD models for test generationRaik, Jaan; Ubar, Raimund-JohannesProceedings of the IEEE European Test Workshop, Barcelona, Spain, May 27-29, 19981998 / p. 145-146

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220

book article

Fenoolide ning klorofenoolide osoonimise produktide toksilisuse uurimine Daphnia magna testigaTrapido, Marina; Veressinina, JelenaXXIII Eesti keemiapäevad : teaduskonverentsi ettekannete referaadid1997 / lk. 140

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221

book article

Field work in the role of teaching and research of rock propertiesKaru, Veiko; Kolats, Margit; Väizene, Vivika; Anepaio, Ain; Valgma, Ingo5th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology : Kuressaare, January 14-19, 20082008 / p. 66-70 : ill

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222

journal article EST / journal article ENG

Fire tests on glued-laminated timber beams with specific local material propertiesFahrni, Reto; Klippel, Michael; Just, Alar; Ollinoc, A.; Frangi, AndreaFire safety journal2019 / p. 161-169 : ill https://doi.org/10.1016/j.firesaf.2017.11.003 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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223

book article

Fire-separating assembliesWerther, Norman; Dagenais, Christian; Just, Alar; Wade, ColleenFire safe use of wood in buildings : global design guide2022 / p. 193-226 : ill https://doi.org/10.1201/9781003190318-6

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224

book article

First results from a benchmarking of quality control frameworksKedar, A.; Sein, SanderLife cycle analysis and assessment in civil engineering: towards an integrated vision : proceedings of the Sixth International Symposium on Life-Cycle Civil Engineering (IALCCE 2018), 28-31 October 2018, Ghent, Belgium2019 / p. 1799−1804 : ill https://www.taylorfrancis.com/books/9781351857574 https://doi.org/10.1201/9781315228914

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225

journal article EST / journal article ENG

FOPID controllers and their industrial applications: a survey of recent resultsTepljakov, Aleksei; Alagoz, Baris Baykant; Petlenkov, EduardIFAC-PapersOnLine2018 / p. 25-30 https://doi.org/10.1016/j.ifacol.2018.06.014 Conference proceedings at Scopus Article at Scopus Article at WOS

journal article EST / journal article ENG

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