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51
book article
Automatic SoC level test path synthesis based on partial functional models
Tšertov, Anton
;
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Devadze, Sergei
2011 Asian Test Symposium (ATS) : New Delhi, India
2011
/
p. 532-538
https://ieeexplore.ieee.org/document/6114730
book article
52
book article
Automatic synthesis of asynchronous circuits from synchronous RTL descriptions
Öberg, Johnny
;
Plosila, Juha
;
Ellervee, Peeter
Proceedings 23rd NORCHIP Conference : Oulu, Finland, 21-22 November 2005
2005
/
p. 200-205 : ill
https://ieeexplore.ieee.org/document/1597024/keywords#keywords
book article
53
book article
Automatic system for testing of dynamic quality of PC plug-in A/D boards
Pokorny, Martin
;
Roztocil, Jaroslav
;
Haasz, Vladimir
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 61-62: ill
book article
54
book article
Automatic test generation system for VLSI
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 1997
1997
/
p. 255-258
book article
55
book article
Automation of testing beyond the SoCs
Tšertov, Anton
;
Jutman, Artur
;
Devadze, Sergei
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis
2010
/
lk. 29-32 : ill
book article
56
journal article
Automation of the 3-phase induction motor type test place for industrial use
Kuusk, Leho
;
Laugis, Juhan
Baltic electrical engineering review
1998
/
1, p. 10-12
journal article
57
book article EST
/
book article ENG
Bbuzz : a Bit-aware fuzzing framework for network protocol systematic reverse engineering and analysis
Blumbergs, Bernhards
;
Vaarandi, Risto
MILCOM 2017 - 2017 IEEE Military Communications Conference : Baltimore, Maryland, USA, 23-25 October 2017
2017
/
p. 707-712
https://doi.org/10.1109/MILCOM.2017.8170785
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
58
book article
A benchmark suite for evaluating the efficiency of test tools
Kruus, Helena
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Gorev, Maksim
;
Pesonen, Vadim
;
Devadze, Sergei
;
Orasson, Elmet
;
Brik, Marina
;
Min, Mart
;
Annus, Paul
;
Kruus, Margus
;
Meigas, Kalju
BEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia
2012
/
p. 85-88 : ill
book article
59
book article
BIST analyzer : a training platform for SoC testing [Electronic resource]
Jutman, Artur
;
Tšertov, Anton
;
Tšepurov, Anton
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
37th Annual Frontiers in Education Conference : Global Engineering : Knowledge Without Borders, Opportunities Without Passports : Milwaukee, Wisconsin, October 10-13, 2007
2007
/
p. S3H-8-S3H-13 : ill. [CD-ROM]
http://dx.doi.org/10.1109/FIE.2007.4418125
book article
60
book article
A BIST scheme for testing mixed analogue and digital circuits
Robson, Malcolm
;
Russel, Gordon
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 183-186: ill
book article
61
book article
Built-in self diagnosis with multiple signature analyzers in digital systems
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico
2008
/
p. 29-34 : ill
book article
62
book article
A CAD system for teaching digital test
Ubar, Raimund-Johannes
;
Ivask, Eero
;
Paomets, Priidu
;
Raik, Jaan
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 369-372: ill
book article
63
journal article EST
/
journal article ENG
Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Microprocessors and microsystems
2020
/
art. 103117, 12 p
https://doi.org/10.1016/j.micpro.2020.103117
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
64
journal article
Case study in testing digital systems
Ubar, Raimund-Johannes
Baltic electronics
1995
/
1, p. 24-27
journal article
65
book article
Case study-based performance evaluation of reactive planning tester
Kull, Andres
;
Raiend, Kullo
;
Vain, Jüri
;
Kääramees, Marko
Model-based Testing in Practice : 2nd Workshop on Model-based Testing in Practice(MoTiP 2009) : Enschede, The Netherlands, June 23, 2009 : proceedings
2009
/
p. 87-96 : ill
https://www.etis.ee/Portal/Publications/Display/c507fc75-771f-419a-bf67-571af65fdb66
book article
66
journal article EST
/
journal article ENG
Circular production, designing, and mechanical testing of polypropylene-based reinforced composite materials : statistical analysis for potential automotive and nuclear applications
Hussain, Abrar
;
Podgurski, Vitali
;
Goljandin, Dmitri
;
Antonov, Maksim
;
Sergejev, Fjodor
;
Krasnou, Illia
Polymers
2023
/
art. 3410, 30 p. : ill
https://doi.org/10.3390/polym15163410
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Seotud publikatsioonid
1
Development of sustainable polypropylene based composites = Polüpropeeni baasil jätkusuutlike komposiitide arendus
67
book article
Code coverage analysis for concurrent programming languages using high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Reinsalu, Uljana
;
Ubar, Raimund-Johannes
Proceedings of the 12th European Workshop on Dependable Computing : EWDC 2009 : Toulouse, France, May 14-15, 2009
2009
/
[4] p. : ill
https://hal.archives-ouvertes.fr/hal-00381559
book article
68
journal article EST
/
journal article ENG
Cognitive disorders in patients with chronic kidney disease : specificities of clinical assessment
Pepin, Marion
;
Ferreira, Ana Carina
;
Arici, Mustafa
;
Bachmann, Maie
;
Barbieri, Michelangela
;
Bumblyte, Inga Arune
Nephrology Dialysis Transplantation
2022
/
p. ii23-ii32
https://doi.org/10.1093/ndt/gfab262
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
69
book article
Combined pseudo-exhaustive and deterministic testing of array multipliers
Oyeniran, Adeboye Stephen
;
Azad, Siavoosh Payandeh
;
Ubar, Raimund-Johannes
2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 21st edition, 24th-26th May, Cluj-Napoca, Romania : proceedings
2018
/
6 p. : ill
https://doi.org/10.1109/AQTR.2018.8402708
book article
70
book article
Combining dynamic slicing and mutation operators for ESL correction
Repinski, Urmas
;
Hantson, Hanno
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th-June 1st, 2012, Annecy, France
2012
/
[6] p. : ill
https://ieeexplore.ieee.org/document/6233020
book article
71
journal article
Combining functional and structural approaches in test generation for digital systems
Ubar, Raimund-Johannes
Microelectronics reliability
1998
/
3, p. 317-329 : ill
journal article
72
book article
Combining learning, training and research in laboratory course for design and test
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
2000
/
p. 221-224 : ill
https://www.researchgate.net/publication/242397131_Combining_Learning_Training_and_Research_in_Laboratory_Course_for_Design_and_Test
book article
73
book article
Comparative analysis of sequential circuit test generation approaches
Raik, Jaan
;
Krivenko, Anna
;
Ubar, Raimund-Johannes
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
/
p. 225-228 : ill
book article
74
book article
Comparative mixed-signal test method and toolset
Mellik, Andres
;
Raik, Jaan
IEEE International Workshop on Open Source Test Technology Tools (IOST3)
2007
/
? p
book article
75
book article
Comparative mixed-signal test method and toolset
Mellik, Andres
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum
2007
/
lk. 153-154 : ill
book article
Number of records 619, displaying
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