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Jutman, Artur (TTÜ author)
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51
book article
Exact static compaction of sequential circuit tests using branch-and-bound and search state registration
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
ETW'02 : 7th IEEE European Test Workshop, Gorfu Greece, May 26-29, 2002 : informal digest
2002
/
p. 19-20
https://www.researchgate.net/publication/250423148_Exact_Static_Compaction_of_Sequential_Circuit_Tests_Using_Branch_and-Bound_and_Search_State_Registration
book article
52
book article
Fast and efficient static compaction of test sequences based on greedy algorithms
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001
2001
/
p. 117-122
book article
53
book article
Fast extended test access via JTAG and FPGAs
Devadze, Sergei
;
Jutman, Artur
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
International Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings
2009
/
p. 1-7 : ill
http://dx.doi.org/10.1109/TEST.2009.5355668
book article
54
book article
Fast fault simulation for extended class of faults in scan-path circuits
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Raik, Jaan
;
Jutman, Artur
Proceedings : Fifth IEEE International Symposium on Electronic Design, Test and Applications : DELTA 2010 : 13-15 January 2010, Ho Chi Minh City, Vietnam
2010
/
p. 14-19
https://ieeexplore.ieee.org/document/5438717
book article
55
book article
Fast static compaction of test sequences using implications and greedy search
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
ETW 2001 : IEEE European Test Workshop : Stockholm, May 29 June 1, 2001 : informal digest
2001
/
p. 207-209 : ill
book article
56
book article
Fast static compaction of tests composed of independent sequences : basic properties and comparison of methods
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
The 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume II
2002
/
p. 445-448 : ill
http://dx.doi.org/10.1109/ICECS.2002.1046190
https://ieeexplore.ieee.org/document/1046190
book article
57
book article
Fault collapsing with linear complexity in digital circuits
Ubar, Raimund-Johannes
;
Mironov, Dmitri
;
Raik, Jaan
;
Jutman, Artur
Proceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010, Paris, France
2010
/
p. 653-656 : ill
https://ieeexplore.ieee.org/document/5537504
book article
58
book article
Fault management instrumentation network based on IEEE P1687 IJTAG
Shibin, Konstantin
;
Jutman, Artur
;
Devadze, Sergei
European Test Symposium (ETS), 2013, Avignon, France
2013
book article
59
book article
Fault simulation with parallel critical path tracing for combinational circuits using structurally synthesized BDDs
Devadze, Sergei
;
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings
2006
/
p. 97-102 : ill
book article
60
dissertation
FPGA-based embedded virtual instrumentation = FPGA-sisesed virtuaalsed test- ja mõõtevahendid
Aleksejev, Igor
2013
http://www.ester.ee/record=b2927687*est
dissertation
61
book article
FPGA-based synthetic instrumentation for board test
Aleksejev, Igor
;
Jutman, Artur
;
Devadze, Sergei
;
Odintsov, Sergei
;
Wenzel, Thomas
Proceedings : International Test Conference 2012
2012
/
p. 1-10 : ill
book article
62
book article
Functional test generation for finite state machines
Ubar, Raimund-Johannes
;
Brik, Marina
;
Jutman, Artur
;
Raik, Jaan
;
Bengtsson, Tomas
;
Kumar, Shashi
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 205-208 : ill
book article
63
book article
Generic interconnect BIST for Network-on-Chip
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Raik, Jaan
DDECS : 8th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 13-16, 2005, Sopron, Hungary : proceedings
2005
/
p. 224-227 : ill
book article
64
book
Handbook of testing electronic systems
Novak, Ondrej
;
Gramatova, Elena
;
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Raik, Jaan
2005
https://www.ester.ee/record=b2102523*est
book
65
book article
Hardware/Software co-design in practice : MEMOCODE'08 contest experience
Reinsalu, Uljana
;
Devadze, Sergei
;
Jutman, Artur
;
Tšertov, Anton
;
Ellervee, Peeter
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
p. 55-58 : ill
book article
66
book article
Hierarchical design error diagnosis in combinational circuits by stuck-at fault test patterns
Ubar, Raimund-Johannes
;
Jutman, Artur
Proceedings of the 6th International Conference on Mixed Design of Integrated Circuits and Systems : MIXDES'99 : Krakow, Poland, 17-19 June 1999
1999
/
p. 437-442 : ill
book article
67
book article
HLS-based optimization of tau triggering algorithm for LHC: a case study
Cherezova, Natalia
;
Mihhailov, Dmitri
;
Devadze, Sergei
;
Jutman, Artur
2022 18th Biennial Baltic Electronics Conference (BEC)
2022
/
6 p. : ill
https://doi.org/10.1109/BEC56180.2022.9935599
book article
68
book article EST
/
book article ENG
IEEE European Test Symposium (ETS)
Eggersgluss, Stephan
;
Hamdioui, Said
;
Jutman, Artur
;
Michael, Maria K.
;
Raik, Jaan
2019 IEEE International Test Conference (ITC)
2019
/
4 p
https://doi.org/10.1109/ITC44170.2019.9000148
Conference proceeding at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
69
book article
IEEE P1687 IJTAG demonstrator on FPGA
Shibin, Konstantin
;
Aleksejev, Igor
;
Jutman, Artur
;
Devadze, Sergei
DATE 2012 University Booth : Design Automation and Test in Europe : Dresden, Germany, March 12-16, 2012
2012
/
1 p. : ill
book article
70
book article
Improving the efficiency of timing simulation in digital circuits by using structurally synthesized BDDs
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Peng, Z.
IEEE Norchip Conference
2000
/
p. 254-261
book article
71
book article
Increasing the speed of delay simulation in digital circuits
Ubar, Raimund-Johannes
;
Jutman, Artur
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
2000
/
p. 31-34 : ill
book article
72
journal article
In-system programming of non-volatile memories on microprocessor-centric boards
Tšertov, Anton
;
Devadze, Sergei
;
Jutman, Artur
;
Jasnetski, Artjom
International journal of microelectronics and computer science
2014
/
p. 25-34 : ill
journal article
73
book article
Internet-based software for teaching test of digital circuits
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Orasson, Elmet
;
Raik, Jaan
;
Evartson, Teet
;
Wuttke, Heinz-Dietrich
Microelectronics education : proceedings of the 4th European Workshop on Microelectronics Education : EWME 2002, Spain, May 23-24, 2002
2002
/
p. 317-320 : ill
https://ieeexplore.ieee.org/document/1003344
book article
74
book article
Invited paper: System-Wide Fault Management based on IEEE P1687 IJTAG
Jutman, Artur
;
Devadze, Sergei
;
Aleksejev, Jevgeni
6th International Workshop on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC) : 20-22 June 2011, Montpeillier, France
2011
/
[4] p.: ill
https://ieeexplore.ieee.org/document/5981520
book article
75
book article
Java applets support for an asynchronous-mode learning of digital design and test
Jutman, Artur
;
Sudnitsõn, Aleksander
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
ITHET 2003 proceedings : 4th International Conference on Information Technology Based Higher Education and Training : July 7-9, 2003, Marrakech, Morocco
2003
/
p. 397-401 : ill
book article
Number of records 157, displaying
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33
1.
Jutman, Artur
2.
Jutman, Valentin
3.
Abdullin, Artur
4.
Abels, Artur
5.
Adson, Artur
6.
Alliksaar, Artur
7.
Binczewski, Artur
8.
Dahlberg, Artur
9.
Hain, Artur
10.
Izumrudov, Artur
11.
Jugaste, Artur
12.
Jõgi, Artur
13.
Jürvetson, Artur
14.
Keller, Artur
15.
Kivikas, Artur
16.
Klauson, Artur
17.
Lavrov, Artur
18.
Leetberg, Artur
19.
Liefländer, Artur
20.
Linari-Linholm, Artur
21.
Lobov, Artur
22.
Luha, Artur Heinrich
23.
Medvid, Artur
24.
Mägi, Artur
25.
Nilson, Artur
26.
Noole, Artur
27.
Puksov, Artur
28.
Rieger, Artur
29.
Ruszczak, Artur
30.
Rätsep, Artur
31.
Talvik, Artur
32.
Toikka, Artur
33.
Tooman, Artur
CV
25
1.
Jutman, Artur 1976
2.
Jutman, Valentin 1938
3.
Georgin, Artur 1891-1954
4.
Hain, Artur 1925-2011
5.
Jõgi, Artur 1978
6.
Klauson, Artur 1995
7.
Laksberg, Artur 1975
8.
Lavrov, Artur 1999
9.
Leetberg, Artur 1886-1969
10.
Leetna, Karl Artur
11.
Liefländer, Artur
12.
Linari, Artur-Aleksander
13.
Linari-Linholm, Artur A. 1903-1983
14.
Luha, Artur Heinrich 1892-1953
15.
Luhha, Artur Heinrich
16.
Mitsulis, Artur 1981
17.
Mitšulis, Artur
18.
Noole, Artur 1985
19.
Perna, Artur (-1939)
20.
Perna, Artur 1881-1940
21.
Pihlak, Artur Aleksander 1885-1941
22.
Pärna, Artur 1915-1943
23.
Sagarov, Artur
24.
Toikka, Artur 1998
25.
Šagarov, Artur
name of the person
21
1.
Jutman, Artur
2.
Andersalu, Artur
3.
Georgin, Artur Mihkel, 1891-1954
4.
Hain, Artur
5.
Lavrov, Artur
6.
Lessner, Artur
7.
Linari-Linholm, Artur, 1903-1983
8.
Lind, Artur
9.
Lind, Artur, 1927-1989
10.
Luha, Artur Heinrich, 1892-1953
11.
Mihhailov, Artur
12.
Noole, Artur
13.
Ojasalu, Artur
14.
Perna, Artur, 1881-1940
15.
Pihlak, Artur-Aleksander, 1885-1941
16.
Prees, Artur
17.
Pärna, Artur
18.
Saaliste, Artur
19.
Sagarov, Artur
20.
Talvik, Artur, 1964-
21.
Vassar, Artur, 1911-1977
subject term
1
1.
Artur Uin ja Ko, veinitööstus
TTÜ subject term
1
1.
Perna, Artur, 1881-1940
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