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Implementation-independent functional test for transition delay faults in microprocessors (title)
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Implementation-independent functional test for transition delay faults in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia
2020
/
p. 646-650
https://doi.org/10.1109/DSD51259.2020.00105
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7
1.
Implementation-Independent Testing of Microprocessors
2.
non-robust and functional sensitization of delay faults
3.
transition delay faults
4.
implementation-independent test generation
5.
Test Group Generation for Detecting Multiple Faults
6.
functional self-test
7.
functional test generation
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