Oyeniran, A.S., Ubar, R., Jenihhin, M., Raik, J.

full record print

High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors

author

Oyeniran, Adeboye Stephen

Ubar, Raimund-Johannes

Jenihhin, Maksim

Raik, Jaan

statement of authorship

Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Jaan Raik

source

Journal of electronic testing : theory and applications

journal volume number month

vol. 36

year of publication

2020

pages

p. 87-103

url

https://doi.org/10.1007/s10836-020-05856-7

ISSN

0923-8174

notes

Bibliogr.: 43 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

testimine

mudelprojekteerimine

kompuutermodelleerimine

vead

simulatsioon

keyword

processor testing

high-level control fault model

functional test generation

fault simulation

high-level fault coverage

low-level fault redundancy

TalTechi üksused

TTÜ department

arvutisüsteemide instituut

Reserch Group

Centre for trustworthy and efficient computing hardware (TECH)

Centre of dependable computing systems

Oyeniran, A.S., Ubar, R., Jenihhin, M., Raik, J. High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors // Journal of electronic testing : theory and applications (2020) vol. 36, p. 87-103. https://doi.org/10.1007/s10836-020-05856-7